Volume 21; Issue 4

Ultramicroscopy

Volume 21; Issue 4
2

Electron-irradiation-induced flattening of negatively stained 2D protein crystals

Jean-Claude Jésior, R.H. Wade
Journal:
Ultramicroscopy
Year:
1987
Language:
english
File:
PDF, 1.39 MB
english, 1987
4

Tem specimen heating during ion beam thinning: Microstructural instability

M.J. Kim, R.W. Carpenter
Journal:
Ultramicroscopy
Year:
1987
Language:
english
File:
PDF, 1.41 MB
english, 1987
5

Excitation of the supported metal particle surface plasmon with external electron beam

Z.L. Wang, J.M. Cowley
Journal:
Ultramicroscopy
Year:
1987
Language:
english
File:
PDF, 742 KB
english, 1987
6

Generation of surface plasmon excitation of supported metal particles by an external electron beam

Z.L. Wang, J.M. Cowley
Journal:
Ultramicroscopy
Year:
1987
Language:
english
File:
PDF, 2.29 MB
english, 1987
7

Nanosecond-exposure electron microscopy of laser-induced phase transformations

O. Bostanjoglo, R.P. Tornow, W. Tornow
Journal:
Ultramicroscopy
Year:
1987
Language:
english
File:
PDF, 867 KB
english, 1987
8

Actual comparison of experimental and simulated lattice images of the GaAs/AlAs interface

A.F. de Jong, H. Bender, W. Coene
Journal:
Ultramicroscopy
Year:
1987
Language:
english
File:
PDF, 924 KB
english, 1987
9

New examples for near-edge fine structures in electron energy loss spectroscopy

Ferdinand Hofer, Peter Golob
Journal:
Ultramicroscopy
Year:
1987
Language:
english
File:
PDF, 308 KB
english, 1987
10

Top-bottom effect in energy-selecting transmission electron microscopy

L. Reimer, M. Ross-Messemer
Journal:
Ultramicroscopy
Year:
1987
Language:
english
File:
PDF, 327 KB
english, 1987
11

Convergent-beam electron diffraction from GaAs/AlAs superlattices

R. Gat, F.W. Schapink
Journal:
Ultramicroscopy
Year:
1987
Language:
english
File:
PDF, 432 KB
english, 1987
12

Zero-loss electron microscopy with the Zeiss EM902

John Trinick, John Berriman
Journal:
Ultramicroscopy
Year:
1987
Language:
english
File:
PDF, 1005 KB
english, 1987
13

Comment to the images of silicon in 〈110〉 orientation

Kazuhiko Izui, Shigemi Furuno
Journal:
Ultramicroscopy
Year:
1987
Language:
english
File:
PDF, 182 KB
english, 1987
14

Author index to volume 21

Journal:
Ultramicroscopy
Year:
1987
Language:
english
File:
PDF, 140 KB
english, 1987
15

Subject index to volume 21

Journal:
Ultramicroscopy
Year:
1987
Language:
english
File:
PDF, 190 KB
english, 1987