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Volume 35; Issue 1
Main
Ultramicroscopy
Volume 35; Issue 1
Ultramicroscopy
Volume 35; Issue 1
1
Editorial Board
Journal:
Ultramicroscopy
Year:
1991
Language:
english
File:
PDF, 57 KB
Your tags:
english, 1991
2
Editorial
Journal:
Ultramicroscopy
Year:
1991
Language:
english
File:
PDF, 25 KB
Your tags:
english, 1991
3
Energy-loss profiles of transmitted electrons incident on dielectric spheroids
B.L. Illman
,
V.E. Anderson
,
R.J. Warmack
,
T.L. Ferrell
Journal:
Ultramicroscopy
Year:
1991
Language:
english
File:
PDF, 576 KB
Your tags:
english, 1991
4
HREM of epitaxial layers in the InAs/GaAs system
V.Yu. Karasev
,
N.A. Kiselev
,
E.V. Orlova
,
M.A. Gribelyuk
,
A.K. Gutakovsky
,
Yu.O. Kanter
,
S.M. Pintus
,
S.V. Rubanov
,
S.I. Stenin
,
A.A. Fedorov
Journal:
Ultramicroscopy
Year:
1991
Language:
english
File:
PDF, 1.43 MB
Your tags:
english, 1991
5
A comparative study of microstructure (in ITO films) and techniques (CTEM and STM)
I.A. Rauf
,
M.G. Walls
Journal:
Ultramicroscopy
Year:
1991
Language:
english
File:
PDF, 1.12 MB
Your tags:
english, 1991
6
A new form of the extrapolation method for absorption correction in quantitative X-ray microanalysis with the analytical electron microscope
Zenji Horita
,
Takeshi Sano
,
Minoru Nemoto
Journal:
Ultramicroscopy
Year:
1991
Language:
english
File:
PDF, 564 KB
Your tags:
english, 1991
7
Alignment of tomographic projections using an incomplete set of fiducial markers
Zhongqi Jing
,
Frederick Sachs
Journal:
Ultramicroscopy
Year:
1991
Language:
english
File:
PDF, 455 KB
Your tags:
english, 1991
8
A side-entry cold holder for cryo-electron microscopy
R. Henderson
,
C. Raeburn
,
G. Vigers
Journal:
Ultramicroscopy
Year:
1991
Language:
english
File:
PDF, 1.10 MB
Your tags:
english, 1991
9
An electronic image drift compensator for electron microscopy
David Cattermole
,
Richard Henderson
Journal:
Ultramicroscopy
Year:
1991
Language:
english
File:
PDF, 176 KB
Your tags:
english, 1991
10
Electropolishing of polycrystalline and single-crystal YBa2Cu3O7 − δ for TEM studies
R. Wheeler
Journal:
Ultramicroscopy
Year:
1991
Language:
english
File:
PDF, 737 KB
Your tags:
english, 1991
11
Measurement of energy deposition in transmission electron microscopy
Peter Rez
,
R.W. Glaisher
Journal:
Ultramicroscopy
Year:
1991
Language:
english
File:
PDF, 287 KB
Your tags:
english, 1991
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