Volume 45; Issue 3-4

Main
Ultramicroscopy
Volume 45; Issue 3-4

Ultramicroscopy

Volume 45; Issue 3-4

1

Sideband holographic imaging of a tilt grain boundary to the 1.22 Å resolution level

Journal:

Ultramicroscopy

Year:

1992

Language:

english

File:

PDF, 1.81 MB

english, 1992

2

Simulation and interpretation of STEM side-band holograms

John Konnert, Peter D'Antonio

Journal:

Ultramicroscopy

Year:

1992

Language:

english

File:

PDF, 1.07 MB

english, 1992

3

Method of directly imaging the reconstruction on Au(111) and Au(100) by reflection electron microscopy

N Wang, Y Uchida, G Lehmpfuhl

Journal:

Ultramicroscopy

Year:

1992

Language:

english

File:

PDF, 1.18 MB

english, 1992

4

Phason-strain identification for quasicrystals by high-resolution electron microscopy

F.H Li, G.Z Pan, D.X Huang, H Hashimoto, Y Yokota

Journal:

Ultramicroscopy

Year:

1992

Language:

english

File:

PDF, 1.04 MB

english, 1992

5

Radial mass density functions of vitrified helical specimens determined by scanning transmission electron microscopy: their potential use as substitutes for equatorial data

S Trachtenberg, K.R Leonard, W Tichelaar

Journal:

Ultramicroscopy

Year:

1992

Language:

english

File:

PDF, 1.10 MB

english, 1992

6

SIMCON: a versatile software package for the simulation of electron diffraction contrast images of arbitrary displacement fields

Koenraad G.F Janssens, Jan Vanhellemont, Marc De Graef, Omer Van der Biest

Journal:

Ultramicroscopy

Year:

1992

Language:

english

File:

PDF, 2.17 MB

english, 1992

7

STM study of single-crystal graphite

Zhouhang Wang, Martin Moskovits, Paul Rowntree

Journal:

Ultramicroscopy

Year:

1992

Language:

english

File:

PDF, 801 KB

english, 1992

8

Note on the energy lost by a charged particle specularly reflecting at a surface

R.O Barrachina, A Gras-Marti

Journal:

Ultramicroscopy

Year:

1992

Language:

english

File:

PDF, 328 KB

english, 1992

9

Method for detection of thermally activated element migration inside multilayer metallizations by means of electron microscopy

M Mändl, J Zweck, H Hoffmann

Journal:

Ultramicroscopy

Year:

1992

Language:

english

File:

PDF, 501 KB

english, 1992

10

Automated phase determination in electron crystallography: thermotropic phases of thiourea

Douglas L Dorset

Journal:

Ultramicroscopy

Year:

1992

Language:

english

File:

PDF, 532 KB

english, 1992

11

Simple method for determining the absolute sense of image rotation in a transmission electron microscope

S. Nakahara, A.G. Cullis

Journal:

Ultramicroscopy

Year:

1992

Language:

english

File:

PDF, 561 KB

english, 1992

12

Two-dimensional demonstration of Wigner phase-retrieval microscopy in the STEM configuration

B.C McCallum, J.M Rodenburg

Journal:

Ultramicroscopy

Year:

1992

Language:

english

File:

PDF, 863 KB

english, 1992

13

Theory of the point source electron microscope

H.J Kreuzer, K Nakamura, A Wierzbicki, H.-W Fink, H Schmid

Journal:

Ultramicroscopy

Year:

1992

Language:

english

File:

PDF, 2.63 MB

english, 1992

14

Matrix description of dynamical HOLZ diffraction tested on the strained layer superlattice Si/GeSi

S.Q. Wang, L.-M. Peng, X.F. Duan, Y.M. Chu

Journal:

Ultramicroscopy

Year:

1992

Language:

english

File:

PDF, 621 KB

english, 1992

15

Preparation of TEM samples from compound semiconductors by chemomechanical polishing

I.V Sabinina, A.K Gutakovsky

Journal:

Ultramicroscopy

Year:

1992

Language:

english

File:

PDF, 658 KB

english, 1992

16

The influence of X-ray absorption on the spatial resolution of X-ray microanalysis of thin foils

Albrecht Schmitz, Eric Van Cappellen

Journal:

Ultramicroscopy

Year:

1992

Language:

english

File:

PDF, 222 KB

english, 1992

17

Novelties for the bookshelves

Journal:

Ultramicroscopy

Year:

1992

Language:

english

File:

PDF, 821 KB

english, 1992

18

Author index to volume 45

Journal:

Ultramicroscopy

Year:

1992

Language:

english

File:

PDF, 160 KB

english, 1992

19

Subject index to volume 45

Journal:

Ultramicroscopy

Year:

1992

Language:

english

File:

PDF, 200 KB

english, 1992

20

Instructions to authors

Journal:

Ultramicroscopy

Year:

1992

Language:

english

File:

PDF, 102 KB

english, 1992