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Volume 65; Issue 3-4
Main
Ultramicroscopy
Volume 65; Issue 3-4
Ultramicroscopy
Volume 65; Issue 3-4
1
Asymmetries in electron Compton profiles of silicon — a coherence effect
Alfred Exner
,
Peter Schattschneider
Journal:
Ultramicroscopy
Year:
1996
Language:
english
File:
PDF, 734 KB
Your tags:
english, 1996
2
Method for controlled formation of vitrified films for cryo-electron microscopy
Nikolai D. Denkov
,
Hideyuki Yoshimura
,
Kuniaki Nagayama
Journal:
Ultramicroscopy
Year:
1996
Language:
english
File:
PDF, 1005 KB
Your tags:
english, 1996
3
Experimental verification of a new quantification procedure for elemental mapping by analytical X-ray microscopy
S. Rondot
,
J. Cazaux
Journal:
Ultramicroscopy
Year:
1996
Language:
english
File:
PDF, 1.15 MB
Your tags:
english, 1996
4
Differential phase contrast in TEM
M.R. McCartney
,
P. Kruit
,
A.H. Buist
,
M.R. Scheinfein
Journal:
Ultramicroscopy
Year:
1996
Language:
english
File:
PDF, 572 KB
Your tags:
english, 1996
5
Something to read
P.W. Hawkes
Journal:
Ultramicroscopy
Year:
1996
Language:
english
File:
PDF, 2.01 MB
Your tags:
english, 1996
6
Absorption correction and thickness determination using the ζ factor in quantitative X-ray microanalysis
Masashi Watanabe
,
Zenji Horita
,
Minoru Nemoto
Journal:
Ultramicroscopy
Year:
1996
Language:
english
File:
PDF, 844 KB
Your tags:
english, 1996
7
Chemical bond mapping of carbon by image-spectrum EELS in the second derivative mode
Jean Michel Martin
,
Béatrice Vacher
,
Laurence Ponsonnet
,
Vincent Dupuis
Journal:
Ultramicroscopy
Year:
1996
Language:
english
File:
PDF, 548 KB
Your tags:
english, 1996
8
Incomplete readout of the Gatan 666 PEELS spectrometer
M. Nelhiebel
,
M. Schenner
,
P. Schattschneider
Journal:
Ultramicroscopy
Year:
1996
Language:
english
File:
PDF, 382 KB
Your tags:
english, 1996
9
Retrieval of crystal defect structures from HREM images by simulated evolution I. Basic technique
G. Möbus
Journal:
Ultramicroscopy
Year:
1996
Language:
english
File:
PDF, 919 KB
Your tags:
english, 1996
10
Retrieval of crystal defect structures from HREM images by simulated evolution II. Experimental image evaluation
G. Möbus
,
G. Dehm
Journal:
Ultramicroscopy
Year:
1996
Language:
english
File:
PDF, 871 KB
Your tags:
english, 1996
11
Author index to volume 65
Journal:
Ultramicroscopy
Year:
1996
Language:
english
File:
PDF, 94 KB
Your tags:
english, 1996
12
Subject guide
Journal:
Ultramicroscopy
Year:
1996
Language:
english
File:
PDF, 45 KB
Your tags:
english, 1996
13
Subject index to volume 65
Journal:
Ultramicroscopy
Year:
1996
Language:
english
File:
PDF, 120 KB
Your tags:
english, 1996
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