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Volume 68; Issue 1
Main
Ultramicroscopy
Volume 68; Issue 1
Ultramicroscopy
Volume 68; Issue 1
1
Deceptive “lattice spacings” in high-resolution micrographs of metal nanoparticles
J.-O Malm
,
M.A O'Keefe
Journal:
Ultramicroscopy
Year:
1997
Language:
english
File:
PDF, 3.82 MB
Your tags:
english, 1997
2
The use of maximum entropy statistics combined with simulation methods to determine the structure of 4-dimethylamino-3-cyanobiphenyl
I.G Voigt-Martin
,
Z.X Zhang
,
U Kolb
,
C Gilmore
Journal:
Ultramicroscopy
Year:
1997
Language:
english
File:
PDF, 913 KB
Your tags:
english, 1997
3
Relativistic ionisation cross sections for use in microanalysis
Rainer Knippelmeyer
,
Petra Wahlbring
,
Helmut Kohl
Journal:
Ultramicroscopy
Year:
1997
Language:
english
File:
PDF, 591 KB
Your tags:
english, 1997
4
Nanodiffraction and dark-field STEM characterization of single-walled carbon nanotube ropes
J.M Cowley
,
F.A Sundell
Journal:
Ultramicroscopy
Year:
1997
Language:
english
File:
PDF, 809 KB
Your tags:
english, 1997
5
The effect of secondary electrons generated in a commercial FEG-TEM on electron energy-loss spectra
D.W McComb
,
G.C Weatherly
Journal:
Ultramicroscopy
Year:
1997
Language:
english
File:
PDF, 323 KB
Your tags:
english, 1997
6
Thickness determination by measuring electron transmission in the TEM at 200 kV
I. Pozsgai
Journal:
Ultramicroscopy
Year:
1997
Language:
english
File:
PDF, 425 KB
Your tags:
english, 1997
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