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Volume 72; Issue 1-2
Main
Ultramicroscopy
Volume 72; Issue 1-2
Ultramicroscopy
Volume 72; Issue 1-2
1
Transmission resonance diffraction and low impact parameter inelastic scattering of high-energy electrons
C.J. Rossouw
,
S.L. Dudarev
,
T.W. Josefsson
,
L.J. Allen
Journal:
Ultramicroscopy
Year:
1998
Language:
english
File:
PDF, 685 KB
Your tags:
english, 1998
2
Determination of interfacial residual stress field in an Al–Al2O3 composite using convergent-beam electron diffraction technique
Huamin Zou
,
Jun Liu
,
Di-hua Ding
,
Renhui Wang
,
L. Froyen
,
L. Delaey
Journal:
Ultramicroscopy
Year:
1998
Language:
english
File:
PDF, 1.01 MB
Your tags:
english, 1998
3
Centenary and other books, proceedings, journals, CD-ROMs
P.W Hawkes
Journal:
Ultramicroscopy
Year:
1998
Language:
english
File:
PDF, 164 KB
Your tags:
english, 1998
4
Reflection shadow imaging of crystal surface by low-voltage point-reflection electron microscopy
Xu Zhang
,
Uwe Weierstall
,
John C.H. Spence
Journal:
Ultramicroscopy
Year:
1998
Language:
english
File:
PDF, 764 KB
Your tags:
english, 1998
5
Design of an objective lens pole piece for a transmission electron microscope with a resolution less than 0.1 nm at 200 kV
K Tsuno
,
D.A Jefferson
Journal:
Ultramicroscopy
Year:
1998
Language:
english
File:
PDF, 180 KB
Your tags:
english, 1998
6
Evaluation of charging on macromolecules in electron cryomicroscopy
Jacob Brink
,
Michael B Sherman
,
John Berriman
,
Wah Chiu
Journal:
Ultramicroscopy
Year:
1998
Language:
english
File:
PDF, 1.25 MB
Your tags:
english, 1998
7
3D reconstruction in electron microscopy using ART with smooth spherically symmetric volume elements (blobs)
Roberto Marabini
,
Gabor T Herman
,
José M Carazo
Journal:
Ultramicroscopy
Year:
1998
Language:
english
File:
PDF, 398 KB
Your tags:
english, 1998
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