Volume 79; Issue 1-4

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Ultramicroscopy
Volume 79; Issue 1-4

Ultramicroscopy

Volume 79; Issue 1-4

1

Tunneling in a double-barrier system and its practical implications for field ionization and field emission

Journal:

Ultramicroscopy

Year:

1999

Language:

english

File:

PDF, 750 KB

english, 1999

2

A comparison between quantitative EELS and APFIM microanalysis of carbonitride grains in cermets

J. Zackrisson, W. Grogger, F. Hofer, H.-O. Andrén

Journal:

Ultramicroscopy

Year:

1999

Language:

english

File:

PDF, 320 KB

english, 1999

3

Field-ion specimen preparation using focused ion-beam milling

D.J Larson, D.T Foord, A.K Petford-Long, H Liew, M.G Blamire, A Cerezo, G.D.W Smith

Journal:

Ultramicroscopy

Year:

1999

Language:

english

File:

PDF, 362 KB

english, 1999

4

Field emission characteristics research of some types of carbon fibres

E.P Sheshin, A.V Anashchenko, S.G Kuzmenko

Journal:

Ultramicroscopy

Year:

1999

Language:

english

File:

PDF, 199 KB

english, 1999

5

Field emission from diamond and related films

Journal:

Ultramicroscopy

Year:

1999

Language:

english

File:

PDF, 389 KB

english, 1999

6

An experimental study of the field emission characteristics of thin films of a new organic compound Ca–Cu–B

J.C She, J Chen, S.Z Deng, X.G Zheng, N.S Xu

Journal:

Ultramicroscopy

Year:

1999

Language:

english

File:

PDF, 258 KB

english, 1999

7

Thermal instability of molybdenum and silicon tips

Z.X Yu, S.Z Deng, S.S Wu, X.G Zheng, J Chen, N.S Xu

Journal:

Ultramicroscopy

Year:

1999

Language:

english

File:

PDF, 126 KB

english, 1999

8

Effects of the surface treatment of silicon substrate on the field emission characteristic of a silicon and amorphous diamond cold cathode emitter

Jian Chen, Jun Chen, Shaozhi Deng, Juncong She, Ningsheng Xu

Journal:

Ultramicroscopy

Year:

1999

Language:

english

File:

PDF, 320 KB

english, 1999

9

Methods for atom probe study of near surface zones in cemented carbides

R Frykholm, H.-O Andrén

Journal:

Ultramicroscopy

Year:

1999

Language:

english

File:

PDF, 340 KB

english, 1999

10

Droplet emission from liquid metal ion sources and their disintegration

Tochko Tzvetkov, Novak Drandarov

Journal:

Ultramicroscopy

Year:

1999

Language:

english

File:

PDF, 183 KB

english, 1999

11

A novel approach to gaseous field ion sources for focused ion beam applications

M.K Miller, S.J Sijbrandij

Journal:

Ultramicroscopy

Year:

1999

Language:

english

File:

PDF, 490 KB

english, 1999

12

Remote atom probe field ion microscopy

M.K Miller, D.J Larson

Journal:

Ultramicroscopy

Year:

1999

Language:

english

File:

PDF, 654 KB

english, 1999

13

Performance of a microsphere plate electron multiplier in APFIM applications

S.J Sijbrandij, M.K Miller

Journal:

Ultramicroscopy

Year:

1999

Language:

english

File:

PDF, 361 KB

english, 1999

14

Electron motion and confinement in the orbitip vacuum gauge: II. Modelling results

D. Nicolaescu, V. Filip, F. Okuyama, J. Itoh

Journal:

Ultramicroscopy

Year:

1999

Language:

english

File:

PDF, 341 KB

english, 1999

15

Electron motion and confinement in the orbitip vacuum gauge: I. Theory

V. Filip, D. Nicolaescu, F. Okuyama, J. Itoh

Journal:

Ultramicroscopy

Year:

1999

Language:

english

File:

PDF, 366 KB

english, 1999

16

Studies of field emission current from amorphous silicon deposited on a tungsten tip

R.B Sharma, N Pradeep, D.S Joag, Surendra Pal, G.C Dubey

Journal:

Ultramicroscopy

Year:

1999

Language:

english

File:

PDF, 175 KB

english, 1999

17

Adsorbate-determined field emission resonances in STM current/voltage characteristics

M Grishin, F Dalidchik, S Kovalevskii, N Kolchenko

Journal:

Ultramicroscopy

Year:

1999

Language:

english

File:

PDF, 116 KB

english, 1999

18

Some aspects of image projection in the field-ion microscope

A Cerezo, P.J Warren, G.D.W Smith

Journal:

Ultramicroscopy

Year:

1999

Language:

english

File:

PDF, 256 KB

english, 1999

19

Field emission of carbon fibers

Journal:

Ultramicroscopy

Year:

1999

Language:

english

File:

PDF, 383 KB

english, 1999

20

Transfer-matrix and Green-function quantum-mechanical theory of electronic field emission applied to the simulation of diffraction by a carbon fiber in the Fresnel projection microscope

A. Mayer, J.-P. Vigneron

Journal:

Ultramicroscopy

Year:

1999

Language:

english

File:

PDF, 254 KB

english, 1999

21

Field emission studies of tungsten-coated silicon-based field emitters

L Chen, M.M El-Gomati

Journal:

Ultramicroscopy

Year:

1999

Language:

english

File:

PDF, 355 KB

english, 1999

22

Application of scanning tunneling-field emission microscopy for investigations of field electron emission from nanoscale diamond films

V.D. Frolov, A.V. Karabutov, S.M. Pimenov, E.D. Obraztsova, V.I. Konov

Journal:

Ultramicroscopy

Year:

1999

Language:

english

File:

PDF, 293 KB

english, 1999

23

Explosive phenomenon during the interaction of NO with Ag

T Bär, T Visart de Bocarmé, N Kruse

Journal:

Ultramicroscopy

Year:

1999

Language:

english

File:

PDF, 545 KB

english, 1999

24

FIM studies of clean and graphitized rhodium using lithium and oxygen as imaging species

V.K Medvedev, Yu Suchorski, T Visart de Bocarmé, T Bär, N Kruse

Journal:

Ultramicroscopy

Year:

1999

Language:

english

File:

PDF, 474 KB

english, 1999

25

Enhanced field emission from carbide-coated field emitters, and device applications

F.M. Charbonnier, W.A. Mackie, T. Xie, P.R. Davis

Journal:

Ultramicroscopy

Year:

1999

Language:

english

File:

PDF, 490 KB

english, 1999

26

Stability consideration of metal–diamond–vacuum micro-emission regimes

S.Z. Deng, Z.X. Yu, N.S. Xu, M.S. Mousa, R.V. Latham

Journal:

Ultramicroscopy

Year:

1999

Language:

english

File:

PDF, 278 KB

english, 1999

27

Simulations of photon-assisted field emission: their significance in basic science and device applications

Journal:

Ultramicroscopy

Year:

1999

Language:

english

File:

PDF, 289 KB

english, 1999

28

Use of Goubau line to couple microwave signals generated by resonant laser-assisted field emission

Kevin Alonso, Mark J Hagmann

Journal:

Ultramicroscopy

Year:

1999

Language:

english

File:

PDF, 80 KB

english, 1999

29

Measurements of modulation of the total emitted current in laser-assisted field emission

Manuel Brugat, Mark J Hagmann

Journal:

Ultramicroscopy

Year:

1999

Language:

english

File:

PDF, 387 KB

english, 1999

30

The numerical simulation of thermal effects in silicon field emitters

Lujiang Huangfu, Chang-Chun Zhu

Journal:

Ultramicroscopy

Year:

1999

Language:

english

File:

PDF, 143 KB

english, 1999

31

Field ion microscopy of platinum adatoms deposited on a thin Al2O3 film on NiAl(1 1 0)

N Ernst, B Duncombe, G Bozdech, M Naschitzki, H.-J Freund

Journal:

Ultramicroscopy

Year:

1999

Language:

english

File:

PDF, 1.55 MB

english, 1999

32

Electron emission characteristics of C-BN films deposited by electrophoresis

Yu Lijuan, Li Junfeng, Deng Ning, Chang-Chun Zhu

Journal:

Ultramicroscopy

Year:

1999

Language:

english

File:

PDF, 149 KB

english, 1999

33

The resonant field electron emission from DLC film>>>atlfn>This work is supported by the National Natural Science Foundation of China.

De-Chang Li, Guang-Jun Liu, Yin-Tang Yang, Chang-Chun Zhu

Journal:

Ultramicroscopy

Year:

1999

Language:

english

File:

PDF, 228 KB

english, 1999

34

Field emission energy spectra from superconducting and normal states of a niobium tip

K Nagaoka, T Yamashita, M Yamada, H Fujii, R Seo, K Matsuda, S Uchiyama, C Oshima

Journal:

Ultramicroscopy

Year:

1999

Language:

english

File:

PDF, 222 KB

english, 1999

35

Monte Carlo simulations of nanometric structures: analysis of micromachined field emitters

Ahmad M.D Assa'd, Mohamed M El-Gomati, J Dell

Journal:

Ultramicroscopy

Year:

1999

Language:

english

File:

PDF, 185 KB

english, 1999

36

Study of the MgO-coated W emitters by field emission microscopy

M.S Mousa, M Al Share'

Journal:

Ultramicroscopy

Year:

1999

Language:

english

File:

PDF, 1.25 MB

english, 1999

37

The electrical surface as centroid of the surface-induced charge

Richard G. Forbes

Journal:

Ultramicroscopy

Year:

1999

Language:

english

File:

PDF, 209 KB

english, 1999

38

In situ observation of the transition process from cold to hot electron emission during field emission assisted vacuum deposition of polymer on W tips

M.S Mousa, Karl Lorenz, N.S Xu

Journal:

Ultramicroscopy

Year:

1999

Language:

english

File:

PDF, 834 KB

english, 1999

39

Index

Journal:

Ultramicroscopy

Year:

1999

Language:

english

File:

PDF, 41 KB

english, 1999

40

Index

Journal:

Ultramicroscopy

Year:

1999

Language:

english

File:

PDF, 51 KB

english, 1999

41

Refining the application of Fowler–Nordheim theory

Richard G Forbes

Journal:

Ultramicroscopy

Year:

1999

Language:

english

File:

PDF, 215 KB

english, 1999

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