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Volume 91; Issue 1-4

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Ultramicroscopy
Volume 91; Issue 1-4

Ultramicroscopy

Volume 91; Issue 1-4

1

Micromechanical measurement of active sites on silicon nitride using surface free energy variation

A.C. Stephan, E.L. Finot, H.-F. Ji, L.A. Pinnaduwage, T. Thundat

Journal:

Ultramicroscopy

Year:

2002

Language:

english

File:

PDF, 210 KB

english, 2002

2

A complementary-metal-oxide-semiconductor-field-effect-transistor-compatible atomic force microscopy tip fabrication process and integrated atomic force microscopy cantilevers fabricated with this process

Mizuki Ono, Dirk Lange, Oliver Brand, Christoph Hagleitner, Henry Baltes

Journal:

Ultramicroscopy

Year:

2002

Language:

english

File:

PDF, 572 KB

english, 2002

3

Nanochemical surface analyzer in CMOS technology

W Franks, D Lange, S Lee, A Hierlemann, N Spencer, H Baltes

Journal:

Ultramicroscopy

Year:

2002

Language:

english

File:

PDF, 192 KB

english, 2002

4

Adsorption kinetics and mechanical properties of thiol-modified DNA-oligos on gold investigated by microcantilever sensors

Rodolphe Marie, Henriette Jensenius, Jacob Thaysen, Claus B Christensen, Anja Boisen

Journal:

Ultramicroscopy

Year:

2002

Language:

english

File:

PDF, 265 KB

english, 2002

5

Mapping of lateral vibration of the tip in atomic force microscopy at the torsional resonance of the cantilever

Takayoshi Kawagishi, Atsushi Kato, Yasuo Hoshi, Hideki Kawakatsu

Journal:

Ultramicroscopy

Year:

2002

Language:

english

File:

PDF, 557 KB

english, 2002

6

Performance of the carbon nano-tube assembled tip for surface shape characterization

M Yasutake, Y Shirakawabe, T Okawa, S Mizooka, Y Nakayama

Journal:

Ultramicroscopy

Year:

2002

Language:

english

File:

PDF, 356 KB

english, 2002

7

Self-sensing piezoresistive cantilever and its magnetic force microscopy applications

Hiroshi Takahashi, Kazunori Ando, Yoshiharu Shirakawabe

Journal:

Ultramicroscopy

Year:

2002

Language:

english

File:

PDF, 554 KB

english, 2002

8

Developments for inverted atomic force microscopy

James C Mabry, Tim Yau, Hui-Wen Yap, John-Bruce D Green

Journal:

Ultramicroscopy

Year:

2002

Language:

english

File:

PDF, 395 KB

english, 2002

9

Near-field optical microscopy with video signal processor to apply a CCD imaging device as a variable area photo-sensor for improving operability and spectrum mode imaging

H Muramatsu, J.M Kim

Journal:

Ultramicroscopy

Year:

2002

Language:

english

File:

PDF, 230 KB

english, 2002

10

Mapping and control of atomic force on Si(1 1 1)√3×√3–Ag surface using noncontact atomic force microscope

S Morita, Y Sugawara

Journal:

Ultramicroscopy

Year:

2002

Language:

english

File:

PDF, 1015 KB

english, 2002

11

Room temperature scanning Hall probe microscopy using GaAs/AlGaAs and Bi micro-hall probes

A Sandhu, H Masuda, A Oral, S.J Bending, A Yamada, M Konagai

Journal:

Ultramicroscopy

Year:

2002

Language:

english

File:

PDF, 421 KB

english, 2002

12

Read/write mechanisms and data storage system using atomic force microscopy and MEMS technology

Hyunjung Shin, Seungbum Hong, Jooho Moon, Jong Up Jeon

Journal:

Ultramicroscopy

Year:

2002

Language:

english

File:

PDF, 395 KB

english, 2002

13

Mechanical property measurements of nanoscale structures using an atomic force microscope

Sriram Sundararajan, Bharat Bhushan, Takahiro Namazu, Yoshitada Isono

Journal:

Ultramicroscopy

Year:

2002

Language:

english

File:

PDF, 297 KB

english, 2002

14

Observation of recording pits on phase-change film using a scanning probe microscope

Toshiya Nishimura, Masato Iyoki, Shoji Sadayama

Journal:

Ultramicroscopy

Year:

2002

Language:

english

File:

PDF, 432 KB

english, 2002

15

Current and potential characterization on InAs nanowires by contact-mode atomic force microscopy and Kelvin probe force microscopy

Shiano Ono, Misaichi Takeuchi, Takuji Takahashi

Journal:

Ultramicroscopy

Year:

2002

Language:

english

File:

PDF, 266 KB

english, 2002

16

An atomic force microscope-based investigation of vertical transport through GaAs/GaAlAs/InAlAs/GaAs step-barrier heterostructures

G Muralidharan, D.M Nicholson, S Rajic, T.M Daniels-Race, H Li, T Thundat, P.G Datskos

Journal:

Ultramicroscopy

Year:

2002

Language:

english

File:

PDF, 104 KB

english, 2002

17

DC electric-field-induced DNA stretching for AFM and SNOM studies

J.M Kim, T Ohtani, J.Y Park, S.M Chang, H Muramatsu

Journal:

Ultramicroscopy

Year:

2002

Language:

english

File:

PDF, 526 KB

english, 2002

18

Surface potential contrasts between silicon surfaces covered and uncovered with an organosilane self-assembled monolayer

Kazuyuki Hayashi, Nagahiro Saito, Hiroyuki Sugimura, Osamu Takai, Nobuyuki Nakagiri

Journal:

Ultramicroscopy

Year:

2002

Language:

english

File:

PDF, 169 KB

english, 2002

19

Direct observation of polyhydroxyalkanoate chains by atomic force microscopy

Kumar Sudesh, Zhihua Gan, Ken’ichiro Matsumoto, Yoshiharu Doi

Journal:

Ultramicroscopy

Year:

2002

Language:

english

File:

PDF, 402 KB

english, 2002

20

A study of positive charge effect on AFM anodization lithography using metal phosphate monolayers

Sang Min Kim, Sang Jung Ahn, Haeseong Lee, Eung Ryul Kim, Haiwon Lee

Journal:

Ultramicroscopy

Year:

2002

Language:

english

File:

PDF, 189 KB

english, 2002

21

AFM nanolithography on a mixed LB film of hexadecylamine and palmitic acid

Sang Jung Ahn, Yun Kyeong Jang, Seung Ae Kim, Haeseong Lee, Haiwon Lee

Journal:

Ultramicroscopy

Year:

2002

Language:

english

File:

PDF, 186 KB

english, 2002

22

Orientation and relocation of biphenyl thiol self-assembled monolayers under sliding

Huiwen Liu, Bharat Bhushan

Journal:

Ultramicroscopy

Year:

2002

Language:

english

File:

PDF, 367 KB

english, 2002

23

Investigation of nanotribological properties of self-assembled monolayers with alkyl and biphenyl spacer chains (Invited)

Huiwen Liu, Bharat Bhushan

Journal:

Ultramicroscopy

Year:

2002

Language:

english

File:

PDF, 734 KB

english, 2002

24

Effect of aggregation state on nanotribological behaviors of organosilane monolayers

Atsushi Takahara, Ken Kojio, Tisato Kajiyama

Journal:

Ultramicroscopy

Year:

2002

Language:

english

File:

PDF, 619 KB

english, 2002

25

Scanning surface potential microscopic studies of photo-voltaic Langmuir–Blodgett assemblies containing an A–S–D triad molecule

M Sakomura, T Oono, R Sakon, M Fujihira

Journal:

Ultramicroscopy

Year:

2002

Language:

english

File:

PDF, 152 KB

english, 2002

26

Surface modification of an organosilane self-assembled monolayer on silicon substrates using atomic force microscopy: scanning probe electrochemistry toward nanolithography

Hiroyuki Sugimura, Takayuki Hanji, Kazuyuki Hayashi, Osamu Takai

Journal:

Ultramicroscopy

Year:

2002

Language:

english

File:

PDF, 272 KB

english, 2002

27

Effect of temperature on friction observed between a Si3N4 tip and a dodecanethiol self-assembled monolayer on Au(1 1 1)

Mitsuhiro Fujita, Masamichi Fujihira

Journal:

Ultramicroscopy

Year:

2002

Language:

english

File:

PDF, 73 KB

english, 2002

28

Imaging the proteins pseudoazurin and apo-pseudoazurin on gold by STM in air: effect of the bias voltage

Sonia Antoranz Contera, Hiroshi Iwasaki

Journal:

Ultramicroscopy

Year:

2002

Language:

english

File:

PDF, 642 KB

english, 2002

29

A near-field microscopy study of submicron domain structure in a model lung surfactant monolayer

Bret N Flanders, Robert C Dunn

Journal:

Ultramicroscopy

Year:

2002

Language:

english

File:

PDF, 328 KB

english, 2002

30

Reversible stretching of a monomeric unit in a dimeric bovine carbonic anhydrase B with the atomic force microscope

Tong Wang, Hideo Arakawa, Atsushi Ikai

Journal:

Ultramicroscopy

Year:

2002

Language:

english

File:

PDF, 238 KB

english, 2002

31

Use of AFM for imaging and measurement of the mechanical properties of light-convertible organelles in plants

Takafumi Yamada, Hideo Arakawa, Takaharu Okajima, Takayoshi Shimada, Atsushi Ikai

Journal:

Ultramicroscopy

Year:

2002

Language:

english

File:

PDF, 303 KB

english, 2002

32

Combination of AFM with an objective-type total internal reflection fluorescence microscope (TIRFM) for nanomanipulation of single cells

Shuhei Nishida, Yutaka Funabashi, Atsushi Ikai

Journal:

Ultramicroscopy

Year:

2002

Language:

english

File:

PDF, 179 KB

english, 2002

33

Immobilisation of Semliki forest virus for atomic force microscopy

M Moloney, L McDonnell, H O’Shea

Journal:

Ultramicroscopy

Year:

2002

Language:

english

File:

PDF, 143 KB

english, 2002

34

Patterning DNA on μm scale on mica

M. Fujita, W. Mizutani, M. Gad, H. Shigekawa, H. Tokumoto

Journal:

Ultramicroscopy

Year:

2002

Language:

english

File:

PDF, 225 KB

english, 2002

35

Author index

Journal:

Ultramicroscopy

Year:

2002

Language:

english

File:

PDF, 50 KB

english, 2002

36

Subject guide

Journal:

Ultramicroscopy

Year:

2002

Language:

english

File:

PDF, 38 KB

english, 2002

37

Subject index

Journal:

Ultramicroscopy

Year:

2002

Language:

english

File:

PDF, 67 KB

english, 2002

38

Contents

Journal:

Ultramicroscopy

Year:

2002

Language:

english

File:

PDF, 56 KB

english, 2002

39

Scanning probe microscopy installed with nanotube probes and nanotube tweezers

Yoshikazu Nakayama

Journal:

Ultramicroscopy

Year:

2002

Language:

english

File:

PDF, 299 KB

english, 2002