Volume 94; Issue 2

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Ultramicroscopy
Volume 94; Issue 2

Ultramicroscopy

Volume 94; Issue 2

1

Interpretation of secondary electron images obtained using a low vacuum SEM

M. Toth, B.L. Thiel, A.M. Donald

Journal:

Ultramicroscopy

Year:

2003

Language:

english

File:

PDF, 1.00 MB

english, 2003

2

Backscattered electron imaging and scanning transmission electron microscopy imaging of multi-layers

P.G Merli, V Morandi, F Corticelli

Journal:

Ultramicroscopy

Year:

2003

Language:

english

File:

PDF, 197 KB

english, 2003

3

Reconstruction of composite in-line electron holograms using a small emission cone

Roman Holenstein, Timothy A. Rothwell, Mark R.A. Shegelski

Journal:

Ultramicroscopy

Year:

2003

Language:

english

File:

PDF, 906 KB

english, 2003

4

Apertureless near-field optical microscopy of metallic nanoparticles

A. Pack, W. Grill, R. Wannemacher

Journal:

Ultramicroscopy

Year:

2003

Language:

english

File:

PDF, 934 KB

english, 2003

5

Quantitative characterisation of chemical inhomogeneities in Al–Ag using high-resolution Z-contrast STEM

R. Erni, H. Heinrich, G. Kostorz

Journal:

Ultramicroscopy

Year:

2003

Language:

english

File:

PDF, 651 KB

english, 2003

6

Measuring the PSF from aperture images of arbitrary shape—an algorithm

P.N.H. Nakashima, A.W.S. Johnson

Journal:

Ultramicroscopy

Year:

2003

Language:

english

File:

PDF, 1.10 MB

english, 2003

7

Semiconductor dopant profiling by off-axis electron holography

Jing Li, M.R McCartney, David J Smith

Journal:

Ultramicroscopy

Year:

2003

Language:

english

File:

PDF, 1.43 MB

english, 2003

8

IFC (Editorial Board)

Journal:

Ultramicroscopy

Year:

2003

Language:

english

File:

PDF, 74 KB

english, 2003