Volume 94; Issue 3-4

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Ultramicroscopy
Volume 94; Issue 3-4

Ultramicroscopy

Volume 94; Issue 3-4

1

Imaging of fullerene-like structures in CNx thin films by electron microscopy; sample preparation artefacts due to ion-beam milling

Zs. Czigány, J. Neidhardt, I.F. Brunell, L. Hultman

Journal:

Ultramicroscopy

Year:

2003

Language:

english

File:

PDF, 1.49 MB

english, 2003

2

Atomically resolved field emission patterns of single-walled carbon nanotubes

Weimin Liu, Shimin Hou, Zhaoxiang Zhang, Gengmin Zhang, Zhennan Gu, Ji Luo, Xingyu Zhao, Zengquan Xue

Journal:

Ultramicroscopy

Year:

2003

Language:

english

File:

PDF, 465 KB

english, 2003

3

Preparation of flat carbon support films

Roman I. Koning, Gert T. Oostergetel, Alain Brisson

Journal:

Ultramicroscopy

Year:

2003

Language:

english

File:

PDF, 1009 KB

english, 2003

4

Development of a specimen holder for in situ generation of pure in-plane magnetic fields in a transmission electron microscope

T. Uhlig, M. Heumann, J. Zweck

Journal:

Ultramicroscopy

Year:

2003

Language:

english

File:

PDF, 331 KB

english, 2003

5

Improving the analysis of small precipitates in HSLA steels using a plasma cleaner and ELNES

J.A Wilson, A.J Craven

Journal:

Ultramicroscopy

Year:

2003

Language:

english

File:

PDF, 764 KB

english, 2003

6

A novel STM-assisted microwave microscope with capacitance and loss imaging capability

Atif Imtiaz, Steven M. Anlage

Journal:

Ultramicroscopy

Year:

2003

Language:

english

File:

PDF, 1.45 MB

english, 2003

7

Atomic force microscopy study of chromosome surface structure changed by protein extraction

XinQi Liu, Shigeru Sugiyama, QingYi Xu, Toshiro Kobori, Shoji Hagiwara, Toshio Ohtani

Journal:

Ultramicroscopy

Year:

2003

Language:

english

File:

PDF, 664 KB

english, 2003

8

Particle finding in electron micrographs using a fast local correlation algorithm

Journal:

Ultramicroscopy

Year:

2003

Language:

english

File:

PDF, 6.71 MB

english, 2003

9

Apertureless near-field scanning Raman microscopy using reflection scattering geometry

W.X. Sun, Z.X. Shen

Journal:

Ultramicroscopy

Year:

2003

Language:

english

File:

PDF, 359 KB

english, 2003

10

Lattice parameters from direct-space images at two tilts

W. Qin, P. Fraundorf

Journal:

Ultramicroscopy

Year:

2003

Language:

english

File:

PDF, 801 KB

english, 2003

11

Evaluation of a hybrid pixel detector for electron microscopy

A.R. Faruqi, D.M. Cattermole, R. Henderson, B. Mikulec, C. Raeburn

Journal:

Ultramicroscopy

Year:

2003

Language:

english

File:

PDF, 559 KB

english, 2003

12

Holographic voltage profiling on 75 nm gate architecture CMOS devices

Alexander E. Thesen, Bernhard G. Frost, David C. Joy

Journal:

Ultramicroscopy

Year:

2003

Language:

english

File:

PDF, 415 KB

english, 2003

13

Application of evanescent wave optics to the determination of absolute distance in surface force measurements using the atomic force microscope

S.T. Huntington, P.G. Hartley, J. Katsifolis

Journal:

Ultramicroscopy

Year:

2003

Language:

english

File:

PDF, 710 KB

english, 2003

14

Improved comparison of low energy loss spectra with band structure calculations: the example of BN filaments

P Moreau, M.C Cheynet

Journal:

Ultramicroscopy

Year:

2003

Language:

english

File:

PDF, 608 KB

english, 2003

15

Deconvolution of electron diffraction patterns of amorphous materials formed with convergent beam

W. McBride, D.J.H. Cockayne, K. Tsuda

Journal:

Ultramicroscopy

Year:

2003

Language:

english

File:

PDF, 129 KB

english, 2003

16

Limitations on the s-state approach to the interpretation of sub-angstrom resolution electron microscope images and microanalysis

G.R. Anstis, D.Q. Cai, D.J.H. Cockayne

Journal:

Ultramicroscopy

Year:

2003

Language:

english

File:

PDF, 253 KB

english, 2003

17

IFC (Editorial Board)

Journal:

Ultramicroscopy

Year:

2003

Language:

english

File:

PDF, 80 KB

english, 2003

18

Author index

Journal:

Ultramicroscopy

Year:

2003

Language:

english

File:

PDF, 51 KB

english, 2003

19

Subject guide

Journal:

Ultramicroscopy

Year:

2003

Language:

english

File:

PDF, 43 KB

english, 2003

20

Subject index

Journal:

Ultramicroscopy

Year:

2003

Language:

english

File:

PDF, 69 KB

english, 2003