Volume 57; Issue 1

Main
Vacuum
Volume 57; Issue 1

Vacuum

Volume 57; Issue 1

1

Homologous micro-clusters of carbon disulphide

Leszek Michalak, Andrzej Pelc

Journal:

Year:

2000

Language:

english

File:

PDF, 342 KB

english, 2000

2

LEED study of Ni (1 0 0) and (1 1 1) surface damage caused by Ar+ ion bombardment with low energy and small doses

M.A Vasylyev, A.G Blaschuk, N.S Mashovets, N.Yu Vilkova

Journal:

Year:

2000

Language:

english

File:

PDF, 169 KB

english, 2000

3

Phosphorus concentration profile in silicon produced by means of the nuclear reaction 30Si(p, γ)31P

Rafael Garcia-Molina, Santiago Heredia-Avalos, Isabel Abril

Journal:

Year:

2000

Language:

english

File:

PDF, 95 KB

english, 2000

4

The influence of the incidence energy of deposited particles on the growth morphology of thin films

Helin Wei, Zuli Liu, Kailun Yao

Journal:

Year:

2000

Language:

english

File:

PDF, 326 KB

english, 2000

5

Flicker noise of the channel electron multiplier

A Grzeszczak, S Kaszczyszyn, S Klein

Journal:

Year:

2000

Language:

english

File:

PDF, 112 KB

english, 2000

6

Book review

Journal:

Year:

2000

Language:

english

File:

PDF, 33 KB

english, 2000

7

Thermal stability of nitride thin films

Journal:

Year:

2000

Language:

english

File:

PDF, 1.43 MB

english, 2000

8

Erratum

Journal:

Year:

2000

File:

PDF, 34 KB

2000

9

Structural and electrical properties of HgTe thin films

M.A.M Seyam, A Elfalaky

Journal:

Year:

2000

Language:

english

File:

PDF, 218 KB

english, 2000

10

Chemical analysis of the plasma-polymerized diphenyl thin films

F.-U.-Z Chowdhury, A.B.M.O Islam, A.H Bhuiyan

Journal:

Year:

2000

Language:

english

File:

PDF, 377 KB

english, 2000

11

Investigations on the effect of alpha particle irradiation-induced defects near Pd/n-GaAs interface

P Jayavel, J Kumar, K Santhakumar, P Magudapathy, K.G.M Nair

Journal:

Year:

2000

Language:

english

File:

PDF, 235 KB

english, 2000