Volume 30; Issue 2

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X-Ray Spectrometry
Volume 30; Issue 2

X-Ray Spectrometry

Volume 30; Issue 2

1

Size and origin of the escape peak in various Si(Li) detectors

T. Papp, J. L. Campbell

Journal:

X-Ray Spectrometry

Year:

2001

Language:

english

File:

PDF, 149 KB

english, 2001

2

Application of J. E. Fernández algorithms in the evaluation of x-ray intensities measured on fused glass discs for a set of international standards and a proposed calibration procedure

Journal:

X-Ray Spectrometry

Year:

2001

Language:

english

File:

PDF, 198 KB

english, 2001

3

Edited by Enrico Ciliberto and Giuseppe Spoto Modern Analytical Methods in Art and Archaeology. Vol. 155 in the Chemical Analysis Series John Wiley & Sons, New York, pp. 755. ISBN 0 471 29361 X

Journal:

X-Ray Spectrometry

Year:

2001

Language:

english

File:

PDF, 47 KB

english, 2001

4

Method for the calculation of the chemical composition of a thin film by Monte Carlo simulation and electron probe microanalysis

Youhua Hu, Yinrong Pan

Journal:

X-Ray Spectrometry

Year:

2001

Language:

english

File:

PDF, 140 KB

english, 2001

5

Measurement of detection efficiency and response functions for an Si(Li) x-ray spectrometer in the range 0.1–5 keV

F. Scholze, M. Procop

Journal:

X-Ray Spectrometry

Year:

2001

Language:

english

File:

PDF, 223 KB

english, 2001

6

EPMA line analysis of chemical states of chromium

Satoshi Hashimoto, Yukihiko Fujiwara, Yasuko Kitahara, Yasuo Tsuchiya, Toshiyasu Nishimura

Journal:

X-Ray Spectrometry

Year:

2001

Language:

english

File:

PDF, 223 KB

english, 2001

7

Background spectrum of synchrotron radiation-excited total reflection x-ray fluorescence for Si wafer analysis

N. S. Shin, C. H. Chang, Y. M. Koo, H. Padmore

Journal:

X-Ray Spectrometry

Year:

2001

Language:

english

File:

PDF, 205 KB

english, 2001

8

Multielemental x-ray fluorescence analysis by using a non-explicit description of the excitation beam

R. A. Barrea, V. Delgado Martínez, T. S. Plivelic

Journal:

X-Ray Spectrometry

Year:

2001

Language:

english

File:

PDF, 171 KB

english, 2001

9

Theoretical study of a secondary target XRF setup at different operational tube voltages

Ch. Zarkadas, A. G. Karydas, Th. Paradellis

Journal:

X-Ray Spectrometry

Year:

2001

Language:

english

File:

PDF, 352 KB

english, 2001

10

Surface studies by grazing-exit electron probe microanalysis (GE-EPMA)

K. Tsuji, Y. Murakami, K. Wagatsuma, G. Love

Journal:

X-Ray Spectrometry

Year:

2001

Language:

english

File:

PDF, 156 KB

english, 2001

11

Editorial

Rene Van Grieken

Journal:

X-Ray Spectrometry

Year:

2001

Language:

english

File:

PDF, 50 KB

english, 2001