Volume 30; Issue 2

IEEE Design and Test

Volume 30; Issue 2
2

Practical, Lightweight Secure Inclusion of Third-Party Intellectual Property

Year:
2013
Language:
english
File:
PDF, 605 KB
english, 2013
5

Let's stop trusting software with our sensitive data

Year:
2013
Language:
english
File:
PDF, 216 KB
english, 2013
6

Eliminating Timing Information Flows in a Mix-Trusted System-on-Chip

Year:
2013
Language:
english
File:
PDF, 466 KB
english, 2013
8

Creating Structural Patterns for At-Speed Testing: A Case Study

Year:
2013
Language:
english
File:
PDF, 1.22 MB
english, 2013
9

HELP: A Hardware-Embedded Delay PUF

Year:
2013
Language:
english
File:
PDF, 811 KB
english, 2013
10

CEDA Currents

Year:
2013
Language:
english
File:
PDF, 128 KB
english, 2013
11

Test Technology TC Newsletter

Year:
2013
File:
PDF, 75 KB
2013
13

Test Technology TC Newsletter

Year:
2013
Language:
english
File:
PDF, 75 KB
english, 2013
16

Table of contents

Year:
2013
Language:
english
File:
PDF, 63 KB
english, 2013
17

IEEE Phaser Data

Year:
2013
File:
PDF, 798 KB
2013
18

IEEE Was Here

Year:
2013
File:
PDF, 1.24 MB
2013
19

[Front cover]

Year:
2013
File:
PDF, 1.76 MB
2013
20

IEEE Xplore Digital Library

Year:
2013
File:
PDF, 1.33 MB
2013
21

IEEE Semantic Technology

Year:
2013
File:
PDF, 1.63 MB
2013
22

Call for Tutorial and Survey Articles

Year:
2013
Language:
english
File:
PDF, 57 KB
english, 2013
23

[Masthead]

Year:
2013
Language:
english
File:
PDF, 59 KB
english, 2013
24

Technology insight on demand on IEEE.tv [advertisement]

Year:
2013
File:
PDF, 1.05 MB
2013
25

Departments [Table of Contents]

Year:
2013
File:
PDF, 278 KB
2013
26

Discover more. IEEE Educational Activities

Year:
2013
Language:
english
File:
PDF, 442 KB
english, 2013