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Volume 30; Issue 2
Main
IEEE Design and Test
Volume 30; Issue 2
IEEE Design and Test
Volume 30; Issue 2
1
Hardware Trojan Insertion by Direct Modification of FPGA Configuration Bitstream
Chakraborty, R. S.
,
Saha, I.
,
Palchaudhuri, A.
,
Naik, G. K.
Journal:
IEEE Design and Test
Year:
2013
Language:
english
File:
PDF, 835 KB
Your tags:
english, 2013
2
Practical, Lightweight Secure Inclusion of Third-Party Intellectual Property
Waksman, A.
,
Sethumadhavan, S.
,
Eum, J.
Journal:
IEEE Design and Test
Year:
2013
Language:
english
File:
PDF, 605 KB
Your tags:
english, 2013
3
A Clock Sweeping Technique for Detecting Hardware Trojans Impacting Circuits Delay
Kan Xiao,
,
Xuehui Zhang,
,
Tehranipoor, Mohammad
Journal:
IEEE Design and Test
Year:
2013
Language:
english
File:
PDF, 633 KB
Your tags:
english, 2013
4
Securing Processors Against Insider Attacks: A Circuit-Microarchitecture Co-Design Approach
Rajendran, J.
,
Kanuparthi, A. K.
,
Zahran, M.
,
Addepalli, S. K.
,
Ormazabal, G.
,
Karri, R.
Journal:
IEEE Design and Test
Year:
2013
Language:
english
File:
PDF, 780 KB
Your tags:
english, 2013
5
Let's stop trusting software with our sensitive data
Fletcher, C.
,
van Dijk, M.
,
Devadas, S.
Journal:
IEEE Design and Test
Year:
2013
Language:
english
File:
PDF, 216 KB
Your tags:
english, 2013
6
Eliminating Timing Information Flows in a Mix-Trusted System-on-Chip
Oberg, J.
,
Sherwood, T.
,
Kastner, R.
Journal:
IEEE Design and Test
Year:
2013
Language:
english
File:
PDF, 466 KB
Your tags:
english, 2013
7
Diverse Double Modular Redundancy: A New Direction for Soft-Error Detection and Correction
Reviriego, P.
,
Bleakley, C. J.
,
Maestro, J. A.
Journal:
IEEE Design and Test
Year:
2013
Language:
english
File:
PDF, 249 KB
Your tags:
english, 2013
8
Creating Structural Patterns for At-Speed Testing: A Case Study
McLaurin, T.
Journal:
IEEE Design and Test
Year:
2013
Language:
english
File:
PDF, 1.22 MB
Your tags:
english, 2013
9
HELP: A Hardware-Embedded Delay PUF
Aarestad, J.
,
Ortiz, P.
,
Acharyya, D.
,
Plusquellic, J.
Journal:
IEEE Design and Test
Year:
2013
Language:
english
File:
PDF, 811 KB
Your tags:
english, 2013
10
CEDA Currents
Journal:
IEEE Design and Test
Year:
2013
Language:
english
File:
PDF, 128 KB
Your tags:
english, 2013
11
Test Technology TC Newsletter
Theocharides, Theo
Journal:
IEEE Design and Test
Year:
2013
File:
PDF, 75 KB
Your tags:
2013
12
Guest Editors' Introduction: Trusted System-on-Chip with Untrusted Components
Bhunia, Swarup
,
Agrawal, Dakshi
,
Nazhandali, Leyla
Journal:
IEEE Design and Test
Year:
2013
File:
PDF, 81 KB
Your tags:
2013
13
Test Technology TC Newsletter
Theocharides, Theo
Journal:
IEEE Design and Test
Year:
2013
Language:
english
File:
PDF, 75 KB
Your tags:
english, 2013
14
Guest Editors' Introduction: Trusted System-on-Chip with Untrusted Components
Bhunia, Swarup
,
Agrawal, Dakshi
,
Nazhandali, Leyla
Journal:
IEEE Design and Test
Year:
2013
Language:
english
File:
PDF, 81 KB
Your tags:
english, 2013
15
While the world benefi ts from what's new, ieee can focus you on what's next [advertisement]
Journal:
IEEE Design and Test
Year:
2013
File:
PDF, 1.59 MB
Your tags:
2013
16
Table of contents
Journal:
IEEE Design and Test
Year:
2013
Language:
english
File:
PDF, 63 KB
Your tags:
english, 2013
17
IEEE Phaser Data
Journal:
IEEE Design and Test
Year:
2013
File:
PDF, 798 KB
Your tags:
2013
18
IEEE Was Here
Journal:
IEEE Design and Test
Year:
2013
File:
PDF, 1.24 MB
Your tags:
2013
19
[Front cover]
Journal:
IEEE Design and Test
Year:
2013
File:
PDF, 1.76 MB
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2013
20
IEEE Xplore Digital Library
Journal:
IEEE Design and Test
Year:
2013
File:
PDF, 1.33 MB
Your tags:
2013
21
IEEE Semantic Technology
Journal:
IEEE Design and Test
Year:
2013
File:
PDF, 1.63 MB
Your tags:
2013
22
Call for Tutorial and Survey Articles
Journal:
IEEE Design and Test
Year:
2013
Language:
english
File:
PDF, 57 KB
Your tags:
english, 2013
23
[Masthead]
Journal:
IEEE Design and Test
Year:
2013
Language:
english
File:
PDF, 59 KB
Your tags:
english, 2013
24
Technology insight on demand on IEEE.tv [advertisement]
Journal:
IEEE Design and Test
Year:
2013
File:
PDF, 1.05 MB
Your tags:
2013
25
Departments [Table of Contents]
Journal:
IEEE Design and Test
Year:
2013
File:
PDF, 278 KB
Your tags:
2013
26
Discover more. IEEE Educational Activities
Journal:
IEEE Design and Test
Year:
2013
Language:
english
File:
PDF, 442 KB
Your tags:
english, 2013
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