books search
books
articles search
articles
Donate
Log In
Log In
to access more features
personal recommendations
Telegram Bot
download history
send to Email or Kindle
manage booklists
save to favorites
Personal
Book Requests
Explore
Journals
Contribution
Donate
Litera Library
Donate paper books
Add paper books
Open LITERA Point
Volume 30; Issue 4
Main
IEEE Design and Test
Volume 30; Issue 4
IEEE Design and Test
Volume 30; Issue 4
1
Dynamic Specification Testing and Diagnosis of High-Precision Sigma-Delta ADCs
Sehun Kook,
,
Banerjee, Aritra
,
Chatterjee, Abhijit
Journal:
IEEE Design and Test
Year:
2013
Language:
english
File:
PDF, 1.33 MB
Your tags:
english, 2013
2
SAT-Based Analysis of Sensitizable Paths
Sauer, Matthias
,
Czutro, Alexander
,
Schubert, Tobias
,
Hillebrecht, Stefan
,
Polian, Ilia
,
Becker, Bernd
Journal:
IEEE Design and Test
Year:
2013
Language:
english
File:
PDF, 362 KB
Your tags:
english, 2013
3
A New Approach for Automatic Test Pattern Generation in Register Transfer Level Circuits
Mirzaei, Mohammad
,
Tabandeh, Mahmoud
,
Alizadeh, Bijan
,
Navabi, Zainalabedin
Journal:
IEEE Design and Test
Year:
2013
Language:
english
File:
PDF, 453 KB
Your tags:
english, 2013
4
Design Methods for Parallel Hardware Implementation of Multimedia Iterative Algorithms
Rana, Vincenzo
,
Nacci, Alessandro A.
,
Beretta, Ivan
,
Santambrogio, Marco D.
,
Atienza, David
,
Sciuto, Donatella
Journal:
IEEE Design and Test
Year:
2013
Language:
english
File:
PDF, 522 KB
Your tags:
english, 2013
5
Deriving Feature Fail Rate from Silicon Volume Diagnostics Data
Malik, Shobhit
,
Herrmann, Thomas
,
Madhavan, Sriram
,
Desineni, Rao
,
Schuermyer, Chris
,
Eide, Geir
Journal:
IEEE Design and Test
Year:
2013
Language:
english
File:
PDF, 843 KB
Your tags:
english, 2013
6
Linking the Verification and Validation of Complex Integrated Circuits Through Shared Coverage Metrics
Hung, Eddie
,
Quinton, Brad
,
Wilton, Steven J. E.
Journal:
IEEE Design and Test
Year:
2013
Language:
english
File:
PDF, 692 KB
Your tags:
english, 2013
7
Evolution of Graphics Northbridge Test and Debug Architectures Across Four Generations of AMD ASICs
Margulis, Arie
,
Akselrod, David
,
Rentschler, Eric
,
Ricchetti, Mike
Journal:
IEEE Design and Test
Year:
2013
Language:
english
File:
PDF, 1.33 MB
Your tags:
english, 2013
8
LCTI–SS: Low-Clock-Tree-Impact Scan Segmentation for Avoiding Shift Timing Failures in Scan Testing
Yamato, Yuta
,
Miyase, Kohei
,
Kajihara, Seiji
,
Xiaoqing Wen,
,
Laung-Terng Wang,
,
Kochte, Michael A.
Journal:
IEEE Design and Test
Year:
2013
Language:
english
File:
PDF, 907 KB
Your tags:
english, 2013
9
CEDA Currents
Journal:
IEEE Design and Test
Year:
2013
Language:
english
File:
PDF, 127 KB
Your tags:
english, 2013
10
The Most Important DFT Tool
Davidson, Scott
Journal:
IEEE Design and Test
Year:
2013
Language:
english
File:
PDF, 68 KB
Your tags:
english, 2013
11
A look at silicon debug and diagnosis [From the EIC]
Ivanov, Andre
Journal:
IEEE Design and Test
Year:
2013
Language:
english
File:
PDF, 83 KB
Your tags:
english, 2013
12
Guest Editors' Introduction: Silicon Debug and Diagnosis
Nicolici, Nicola
,
Benware, Brady
Journal:
IEEE Design and Test
Year:
2013
Language:
english
File:
PDF, 56 KB
Your tags:
english, 2013
13
[Back inside cover]
Journal:
IEEE Design and Test
Year:
2013
File:
PDF, 1.45 MB
Your tags:
2013
14
Departments [Table of Contents]
Journal:
IEEE Design and Test
Year:
2013
File:
PDF, 190 KB
Your tags:
2013
15
Masthead
Journal:
IEEE Design and Test
Year:
2013
Language:
english
File:
PDF, 59 KB
Your tags:
english, 2013
16
Can semantic technologies make the Web truly worldwide? [Advertisement: IEEE Xplore Digital Library]
Journal:
IEEE Design and Test
Year:
2013
File:
PDF, 1.63 MB
Your tags:
2013
17
Discover more. IEEE Educational Activities
Journal:
IEEE Design and Test
Year:
2013
Language:
english
File:
PDF, 442 KB
Your tags:
english, 2013
18
[Front cover]
Journal:
IEEE Design and Test
Year:
2013
File:
PDF, 1.53 MB
Your tags:
2013
19
[Back cover]
Journal:
IEEE Design and Test
Year:
2013
File:
PDF, 1.73 MB
Your tags:
2013
20
Can new uses for phaser data measurements prevent blackouts? [advertisement]
Journal:
IEEE Design and Test
Year:
2013
File:
PDF, 798 KB
Your tags:
2013
21
Table of contents
Journal:
IEEE Design and Test
Year:
2013
Language:
english
File:
PDF, 63 KB
Your tags:
english, 2013
22
IEEE was here
Journal:
IEEE Design and Test
Year:
2013
File:
PDF, 1.24 MB
Your tags:
2013
23
[Front inside cover]
Journal:
IEEE Design and Test
Year:
2013
File:
PDF, 352 KB
Your tags:
2013
1
Follow
this link
or find "@BotFather" bot on Telegram
2
Send /newbot command
3
Specify a name for your chatbot
4
Choose a username for the bot
5
Copy an entire last message from BotFather and paste it here
×
×