Volume 33; Issue 1

IEEE Design and Test

Volume 33; Issue 1
4

Report on MECO'2015

Stojanovic, Radovan, Whiffen, Radenka Krsmanovic
Journal:
IEEE Design and Test
Year:
2016
Language:
english
File:
PDF, 130 KB
english, 2016
5

Recap of the ITC15 Test Conference

Eklow, Bill
Journal:
IEEE Design and Test
Year:
2016
Language:
english
File:
PDF, 72 KB
english, 2016
6

From the Heart of Silicon Valley to the Hill Country—Highlights of ICCAD 2015

Liu, Frank
Journal:
IEEE Design and Test
Year:
2016
Language:
english
File:
PDF, 76 KB
english, 2016
7

Approximate Computing: Solving Computing's Inefficiency Problem?

Henkel, Jorg
Journal:
IEEE Design and Test
Year:
2016
Language:
english
File:
PDF, 108 KB
english, 2016
8

Front Cover

Journal:
IEEE Design and Test
Year:
2016
File:
PDF, 555 KB
2016
9

Cover 2

Journal:
IEEE Design and Test
Year:
2016
File:
PDF, 350 KB
2016
10

Table of Contents

Journal:
IEEE Design and Test
Year:
2016
Language:
english
File:
PDF, 198 KB
english, 2016
11

Cover 4

Journal:
IEEE Design and Test
Year:
2016
File:
PDF, 1.61 MB
2016
12

Test Technology TC Newsletter

Theocharides, Theo
Journal:
IEEE Design and Test
Year:
2016
Language:
english
File:
PDF, 112 KB
english, 2016
13

CEDA Currents

Journal:
IEEE Design and Test
Year:
2016
Language:
english
File:
PDF, 180 KB
english, 2016
14

Masthead

Journal:
IEEE Design and Test
Year:
2016
Language:
english
File:
PDF, 57 KB
english, 2016
15

Guest Editors' Introduction: Approximate Computing

Xu, Qiang, Mytkowicz, Todd, Kim, Nam Sung
Journal:
IEEE Design and Test
Year:
2016
Language:
english
File:
PDF, 65 KB
english, 2016
16

Test: Wisdom From the Giants, Visions for the Future—Part 2

Blanton, Shawn, Yeh, David
Journal:
IEEE Design and Test
Year:
2016
Language:
english
File:
PDF, 419 KB
english, 2016