Volume 35; Issue 1

IEEE Design and Test

Volume 35; Issue 1
1

ZeNA: Zero-Aware Neural Network Accelerator

Kim, Dongyoung, Ahn, Junwhan, Yoo, Sungjoo
Journal:
IEEE Design and Test
Year:
2018
Language:
english
File:
PDF, 435 KB
english, 2018
2

Secure and Resilient Industrial Control Systems

Serpanos, Dimitrios
Journal:
IEEE Design and Test
Year:
2018
Language:
english
File:
PDF, 268 KB
english, 2018
5

The 2017 Embedded Systems Week (ESWEEK)

Thiele, Lothar, Ha, Soonhoi
Journal:
IEEE Design and Test
Year:
2018
Language:
english
File:
PDF, 78 KB
english, 2018
6

Guest Editors’ Introduction: Hardware Accelerators for Data Centers

Ozdal, Mustafa, Nam, Gi-Joon, Marr, Debbie
Journal:
IEEE Design and Test
Year:
2018
Language:
english
File:
PDF, 53 KB
english, 2018
8

Technobabble

Davidson, Scott
Journal:
IEEE Design and Test
Year:
2018
Language:
english
File:
PDF, 56 KB
english, 2018
9

CEDA Currents

Ayala, Jose L.
Journal:
IEEE Design and Test
Year:
2018
Language:
english
File:
PDF, 145 KB
english, 2018
10

25th IFIP/IEEE Conference on Very Large Scale Integration (VLSI-SoC 2017)

Elfadel, Ibrahim Abe M., Ugurdag, H. Fatih
Journal:
IEEE Design and Test
Year:
2018
Language:
english
File:
PDF, 117 KB
english, 2018
11

Table of contents

Journal:
IEEE Design and Test
Year:
2018
Language:
english
File:
PDF, 280 KB
english, 2018
12

[Front cover]

Journal:
IEEE Design and Test
Year:
2018
File:
PDF, 184 KB
2018
13

[Front inside cover]

Journal:
IEEE Design and Test
Year:
2018
File:
PDF, 59 KB
2018
14

[Back inside cover]

Journal:
IEEE Design and Test
Year:
2018
File:
PDF, 277 KB
2018
15

TTTC Newsletter

Theocharides, Theo
Journal:
IEEE Design and Test
Year:
2018
Language:
english
File:
PDF, 146 KB
english, 2018
16

[Back cover]

Journal:
IEEE Design and Test
Year:
2018
File:
PDF, 389 KB
2018
17

IEEE Design&Test publication information

Journal:
IEEE Design and Test
Year:
2018
File:
PDF, 2.46 MB
2018