Volume 69; Issue 3

AT&T Technical Journal

Volume 69; Issue 3
1

Software Productivity Measurements

Yu, Weider D., Smith, D. Paul, Huang, Steel T.
Journal:
AT&T Technical Journal
Year:
1990
Language:
english
File:
PDF, 3.03 MB
english, 1990
3

Design for X (DFX): Key to Competitive, Profitable Products

Gatenby, David A., Foo, George
Journal:
AT&T Technical Journal
Year:
1990
Language:
english
File:
PDF, 3.06 MB
english, 1990
4

Computer-Aided Design for Quality (CADQ)

Liu, Lihsin, Nazaret, William A., Beale, Richard G.
Journal:
AT&T Technical Journal
Year:
1990
Language:
english
File:
PDF, 4.44 MB
english, 1990
5

Design for Multinational EMC Compliance

Heirman, Donald N., Morris, Robert C., Crosby, Steven M.
Journal:
AT&T Technical Journal
Year:
1990
Language:
english
File:
PDF, 5.98 MB
english, 1990
6

Automated Bist for Regular Structures Embedded in Asic Devices

Aadsen, Duane R., Scholz, Harold N., Zorian, Yervant
Journal:
AT&T Technical Journal
Year:
1990
Language:
english
File:
PDF, 2.77 MB
english, 1990
7

Design for Material Logistics

Foo, George, Clancy, James P., Kinney, Lawrence E., Lindemulder, Charles R.
Journal:
AT&T Technical Journal
Year:
1990
Language:
english
File:
PDF, 2.41 MB
english, 1990