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Volume 22; Issue 3
Main
Critical Reviews in Solid State and Material Sciences
Volume 22; Issue 3
Critical Reviews in Solid State and Material Sciences
Volume 22; Issue 3
1
Ohmic contacts to GaAs epitaxial layers
Kim, T-J.
,
Holloway, P. H.
Journal:
Critical Reviews in Solid State and Material Sciences
Year:
1997
Language:
english
File:
PDF, 2.55 MB
Your tags:
english, 1997
2
Electromigration in integrated circuits
Malone, D. W.
,
Hummel, R. E.
Journal:
Critical Reviews in Solid State and Material Sciences
Year:
1997
Language:
english
File:
PDF, 2.78 MB
Your tags:
english, 1997
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