Volume 20; Issue 1

IEEE Design & Test of Computers

Volume 20; Issue 1

1

A 100-GOPS programmable processor for vehicle vision systems

Raab, W., Bruels, N., Hachmann, U., Harnisch, J., Ramacher, U., Sauer, C., Techmer, A.

Journal:

IEEE Design & Test of Computers

Year:

2003

Language:

english

File:

PDF, 282 KB

english, 2003

2

Circuit-level considerations for mixed-signal programmable components

Carro, L., Negreiros, M., Jahn, G.P., de Souza, A.A., Franco, D.T.

Journal:

IEEE Design & Test of Computers

Year:

2003

Language:

english

File:

PDF, 318 KB

english, 2003

3

Boundary scan test standards

Journal:

IEEE Design & Test of Computers

Year:

2003

Language:

english

File:

PDF, 197 KB

english, 2003

4

Making the best of those extra transistors

Journal:

IEEE Design & Test of Computers

Year:

2003

Language:

english

File:

PDF, 175 KB

english, 2003

5

An all-digital DFT scheme for testing catastrophic faults in PLLs

Azais, F., Bertrand, Y., Renovell, M., Ivanov, A., Tabatabaei, S.

Journal:

IEEE Design & Test of Computers

Year:

2003

Language:

english

File:

PDF, 291 KB

english, 2003

6

Error tolerance

Journal:

IEEE Design & Test of Computers

Year:

2003

Language:

english

File:

PDF, 265 KB

english, 2003

7

Design techniques for EEPROMs embedded in portable systems on chips

Daga, J.M., Papaix, C., Merandat, M., Ricard, S., Medulla, G., Guichaoua, J., Auvergne, D.

Journal:

IEEE Design & Test of Computers

Year:

2003

Language:

english

File:

PDF, 244 KB

english, 2003

8

2D test sequence generators

Mrugalski, G., Tyszer, J., Rajski, J.

Journal:

IEEE Design & Test of Computers

Year:

2003

Language:

english

File:

PDF, 267 KB

english, 2003

9

Instruction scheduler generation for retargetable compilation

Wahlen, O., Hohenauer, M., Leupers, R., Meyr, H.

Journal:

IEEE Design & Test of Computers

Year:

2003

Language:

english

File:

PDF, 383 KB

english, 2003

10

Application-specific instruction memory customizations for power-efficient embedded processors

Petrov, P., Orailoglu, A.

Journal:

IEEE Design & Test of Computers

Year:

2003

Language:

english

File:

PDF, 241 KB

english, 2003

11

Compilation approach for coarse-grained reconfigurable architectures

Jong-eun Lee,, Kiyoung Choi,, Dutt, N.D.

Journal:

IEEE Design & Test of Computers

Year:

2003

Language:

english

File:

PDF, 334 KB

english, 2003

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