Volume 21; Issue 4

IEEE Design & Test of Computers

Volume 21; Issue 4
1

A built-in parametric timing measurement unit

Year:
2004
Language:
english
File:
PDF, 475 KB
english, 2004
2

Multiplexing ATE channels for production testing at 2.5 Gbps

Year:
2004
Language:
english
File:
PDF, 1.08 MB
english, 2004
4

Guest Editors' Introduction: Advances in VLSI Testing at MultiGbps Rates

Year:
2004
Language:
english
File:
PDF, 130 KB
english, 2004
5

From the EIC: Manufacturing test woes

Year:
2004
Language:
english
File:
PDF, 138 KB
english, 2004
6

Design & Test Education in Asia

Year:
2004
Language:
english
File:
PDF, 77 KB
english, 2004
7

On-chip digital jitter measurement, from megahertz to gigahertz

Year:
2004
Language:
english
File:
PDF, 161 KB
english, 2004
8

Panel Summaries

Year:
2004
Language:
english
File:
PDF, 48 KB
english, 2004
9

Test at Gbps: Megaproblem or micromanagement?

Year:
2004
Language:
english
File:
PDF, 46 KB
english, 2004
10

Design automation Technical Committee Newsletter

Year:
2004
Language:
english
File:
PDF, 32 KB
english, 2004
11

Testing Gbps interfaces without a gigahertz tester

Year:
2004
Language:
english
File:
PDF, 461 KB
english, 2004
12

Looking back, looking around [electronic design automation]

Year:
2004
Language:
english
File:
PDF, 137 KB
english, 2004