Volume 27; Issue 3

IEEE Design & Test of Computers

Volume 27; Issue 3
1

Determination of Dominant-Yield-Loss Mechanism with Volume Diagnosis

Sharma, M., Schuermyer, C., Benware, B.
Journal:
IEEE Design & Test of Computers
Year:
2010
Language:
english
File:
PDF, 341 KB
english, 2010
3

Economic Analysis of the HOY Wireless Test Methodology

YuTsao Hsing, LiMing Denq, Chao-Hsun Chen, Cheng-Wen Wu
Journal:
IEEE Design & Test of Computers
Year:
2010
Language:
english
File:
PDF, 950 KB
english, 2010
4

Microprocessor Software-Based Self-Testing

Psarakis, M., Gizopoulos, D., Sanchez, E., Reorda, M.S.
Journal:
IEEE Design & Test of Computers
Year:
2010
Language:
english
File:
PDF, 1.12 MB
english, 2010
5

Automatic Test Wrapper Synthesis for a Wireless ATE Platform

Chun-Yu Yang, Ying-Yen Chen, Sung-Yu Chen, Jing-Jia Liou
Journal:
IEEE Design & Test of Computers
Year:
2010
Language:
english
File:
PDF, 1.07 MB
english, 2010
6

[Advertisement - Back cover]

Journal:
IEEE Design & Test of Computers
Year:
2010
File:
PDF, 859 KB
2010
7

[Advertisement - Back cover]

Journal:
IEEE Design & Test of Computers
Year:
2010
File:
PDF, 818 KB
2010
8

CEDA Currents

Journal:
IEEE Design & Test of Computers
Year:
2010
Language:
english
File:
PDF, 859 KB
english, 2010
10

Conference Reports

Kapur, Rohit
Journal:
IEEE Design & Test of Computers
Year:
2010
Language:
english
File:
PDF, 414 KB
english, 2010
11

Contents

Journal:
IEEE Design & Test of Computers
Year:
2010
Language:
english
File:
PDF, 301 KB
english, 2010
12

Design Automation Technical Committee Newsletter

Journal:
IEEE Design & Test of Computers
Year:
2010
Language:
english
File:
PDF, 180 KB
english, 2010
13

[Front cover]

Journal:
IEEE Design & Test of Computers
Year:
2010
File:
PDF, 267 KB
2010
14

[Front cover]

Journal:
IEEE Design & Test of Computers
Year:
2010
File:
PDF, 58 KB
2010
15

Masthead

Journal:
IEEE Design & Test of Computers
Year:
2010
Language:
english
File:
PDF, 54 KB
english, 2010
16

NSF Workshop on EDA: Past, Present, and Future (Part 2)

Brayton, Robert, Cong, Jason
Journal:
IEEE Design & Test of Computers
Year:
2010
Language:
english
File:
PDF, 439 KB
english, 2010
17

Scaling: More than Moore's law

Kahng, Andrew B.
Journal:
IEEE Design & Test of Computers
Year:
2010
Language:
english
File:
PDF, 123 KB
english, 2010
18

Test Technology TC Newsletter

Journal:
IEEE Design & Test of Computers
Year:
2010
Language:
english
File:
PDF, 303 KB
english, 2010
19

Time to retire our benchmarks

Aitken, Rob
Journal:
IEEE Design & Test of Computers
Year:
2010
Language:
english
File:
PDF, 78 KB
english, 2010
20

Enabling design and manufacturing through innovations in DFT

Journal:
IEEE Design & Test of Computers
Year:
2010
Language:
english
File:
PDF, 124 KB
english, 2010