Volume 28; Issue 1

IEEE Design & Test of Computers

Volume 28; Issue 1
2

Scalable Spin-Transfer Torque RAM Technology for Normally-Off Computing

Kawahara, T.
Journal:
IEEE Design & Test of Computers
Year:
2011
Language:
english
File:
PDF, 2.25 MB
english, 2011
3

Contents

Journal:
IEEE Design & Test of Computers
Year:
2011
Language:
english
File:
PDF, 352 KB
english, 2011
4

Design Automation Technical Committee Newsletter

Journal:
IEEE Design & Test of Computers
Year:
2011
Language:
english
File:
PDF, 459 KB
english, 2011
5

Design for manufacturability: Then and now

Kahng, A.B.
Journal:
IEEE Design & Test of Computers
Year:
2011
Language:
english
File:
PDF, 115 KB
english, 2011
7

Embedded Memories: Progress and a Look into the Future

Itoh, K.
Journal:
IEEE Design & Test of Computers
Year:
2011
Language:
english
File:
PDF, 397 KB
english, 2011
8

Embedded memory technologies: Present and future

Journal:
IEEE Design & Test of Computers
Year:
2011
Language:
english
File:
PDF, 167 KB
english, 2011
9

Evolution of EDA standards worldwide

Krolikoski, S.
Journal:
IEEE Design & Test of Computers
Year:
2011
Language:
english
File:
PDF, 989 KB
english, 2011
10

[Front cover]

Journal:
IEEE Design & Test of Computers
Year:
2011
File:
PDF, 7.48 MB
2011
11

[Front cover]

Journal:
IEEE Design & Test of Computers
Year:
2011
File:
PDF, 6.23 MB
2011
12

Masthead

Journal:
IEEE Design & Test of Computers
Year:
2011
Language:
english
File:
PDF, 47 KB
english, 2011
13

Embedded DRAM in 45-nm Technology and Beyond

Anand, D.L., Gorman, K.W., Jacunski, M.D., Paparelli, A.J.
Journal:
IEEE Design & Test of Computers
Year:
2011
Language:
english
File:
PDF, 563 KB
english, 2011
14

Guest editors' introduction: Nanoscale Memories Pose Unique Challenges

Kim, Chris H., Chang, Leland
Journal:
IEEE Design & Test of Computers
Year:
2011
Language:
english
File:
PDF, 830 KB
english, 2011
15

[Advertisement - Back cover]

Journal:
IEEE Design & Test of Computers
Year:
2011
File:
PDF, 3.08 MB
2011
16

[Advertisement - Back cover]

Journal:
IEEE Design & Test of Computers
Year:
2011
File:
PDF, 1.71 MB
2011
18

Call for Papers

Journal:
IEEE Design & Test of Computers
Year:
2011
Language:
english
File:
PDF, 39 KB
english, 2011
19

Call for Papers

Journal:
IEEE Design & Test of Computers
Year:
2011
Language:
english
File:
PDF, 38 KB
english, 2011
20

CEDA Currents

Journal:
IEEE Design & Test of Computers
Year:
2011
Language:
english
File:
PDF, 91 KB
english, 2011
21

Conference Reports

Journal:
IEEE Design & Test of Computers
Year:
2011
Language:
english
File:
PDF, 1.28 MB
english, 2011
22

Challenges and Directions for Low-Voltage SRAM

Qazi, M., Sinangil, M.E., Chandrakasan, A.P.
Journal:
IEEE Design & Test of Computers
Year:
2011
Language:
english
File:
PDF, 4.33 MB
english, 2011
23

Modeling, Architecture, and Applications for Emerging Memory Technologies

Yuan Xie
Journal:
IEEE Design & Test of Computers
Year:
2011
Language:
english
File:
PDF, 1.37 MB
english, 2011
24

Playing together nicely

Davidson, S.
Journal:
IEEE Design & Test of Computers
Year:
2011
Language:
english
File:
PDF, 78 KB
english, 2011
25

Test Technology TC Newsletter

Journal:
IEEE Design & Test of Computers
Year:
2011
Language:
english
File:
PDF, 657 KB
english, 2011