Volume 28; Issue 6

IEEE Design & Test of Computers

Volume 28; Issue 6
2

Replacing Error Vector Magnitude Test with RF and Analog BISTs

Webster, D.L., Hudgens, R., Lie, D.Y.C.
Journal:
IEEE Design & Test of Computers
Year:
2011
Language:
english
File:
PDF, 813 KB
english, 2011
4

Adaptive Testing: Dealing with Process Variability

Maxwell, P.
Journal:
IEEE Design & Test of Computers
Year:
2011
Language:
english
File:
PDF, 1.01 MB
english, 2011
5

Advertisement

Journal:
IEEE Design & Test of Computers
Year:
2011
File:
PDF, 512 KB
2011
6

[Advertisement - Back cover]

Journal:
IEEE Design & Test of Computers
Year:
2011
File:
PDF, 1.80 MB
2011
7

[Advertisement - Back cover]

Journal:
IEEE Design & Test of Computers
Year:
2011
File:
PDF, 2.05 MB
2011
8

Call for Papers

Journal:
IEEE Design & Test of Computers
Year:
2011
Language:
english
File:
PDF, 58 KB
english, 2011
9

CEDA Currents

Journal:
IEEE Design & Test of Computers
Year:
2011
Language:
english
File:
PDF, 138 KB
english, 2011
10

Conference Reports

Journal:
IEEE Design & Test of Computers
Year:
2011
Language:
english
File:
PDF, 814 KB
english, 2011
11

Contents

Journal:
IEEE Design & Test of Computers
Year:
2011
Language:
english
File:
PDF, 518 KB
english, 2011
12

Getting Close to Your Computer

Journal:
IEEE Design & Test of Computers
Year:
2011
Language:
english
File:
PDF, 124 KB
english, 2011
13

Long-Term Thermal Overstressing of Computers

Gray, K.A., Pecht, M.
Journal:
IEEE Design & Test of Computers
Year:
2011
Language:
english
File:
PDF, 2.73 MB
english, 2011
14

Major Milestones for Two IEEE Standards Groups in 2011

Eklow, Bill
Journal:
IEEE Design & Test of Computers
Year:
2011
Language:
english
File:
PDF, 447 KB
english, 2011
15

Masthead

Journal:
IEEE Design & Test of Computers
Year:
2011
Language:
english
File:
PDF, 54 KB
english, 2011
16

Product Futures

Kahng, Andrew B.
Journal:
IEEE Design & Test of Computers
Year:
2011
Language:
english
File:
PDF, 100 KB
english, 2011
17

RF Front-End Test Using Built-in Sensors

Abdallah, L., Stratigopoulos, H.-G., Mir, S., Kelma, C.
Journal:
IEEE Design & Test of Computers
Year:
2011
Language:
english
File:
PDF, 981 KB
english, 2011
18

Test Technology TC Newsletter

Journal:
IEEE Design & Test of Computers
Year:
2011
Language:
english
File:
PDF, 381 KB
english, 2011
19

The Promise of Flexible Electronics

Journal:
IEEE Design & Test of Computers
Year:
2011
Language:
english
File:
PDF, 203 KB
english, 2011
20

Annual Index

Journal:
IEEE Design & Test of Computers
Year:
2011
Language:
english
File:
PDF, 238 KB
english, 2011
21

[Front cover]

Journal:
IEEE Design & Test of Computers
Year:
2011
File:
PDF, 4.76 MB
2011
22

[Front cover]

Journal:
IEEE Design & Test of Computers
Year:
2011
File:
PDF, 5.25 MB
2011
23

Pulsed-Latch Circuits: A New Dimension in ASIC Design

Youngsoo Shin, Seungwhun Paik
Journal:
IEEE Design & Test of Computers
Year:
2011
Language:
english
File:
PDF, 732 KB
english, 2011
24

Robust Circuit Design for Flexible Electronics

Tsung-Ching Huang, Jiun-Lang Huang, Kwang-Ting Cheng
Journal:
IEEE Design & Test of Computers
Year:
2011
Language:
english
File:
PDF, 963 KB
english, 2011
25

Placement Optimization of Flexible TFT Digital Circuits

Liu, C., En-Hua Ma, Wen-En Wei, Li, J., I-Chun Cheng, Yung-Hui Yeh
Journal:
IEEE Design & Test of Computers
Year:
2011
Language:
english
File:
PDF, 976 KB
english, 2011
26

Materials, Processing, and Testing of Flexible Image Sensor Arrays

Wong, W., Ng, T.N., Sambandan, S., Chabinyc, M.
Journal:
IEEE Design & Test of Computers
Year:
2011
Language:
english
File:
PDF, 3.59 MB
english, 2011