Volume 29; Issue 2

IEEE Design & Test of Computers

Volume 29; Issue 2
1

IEEE Council on Electronic Design Automation

Journal:
IEEE Design & Test of Computers
Year:
2012
Language:
english
File:
PDF, 116 KB
english, 2012
2

Test Technology TC Newsletter

Pande, P.
Journal:
IEEE Design & Test of Computers
Year:
2012
Language:
english
File:
PDF, 74 KB
english, 2012
3

Standards, Interoperability, and Innovation in a Disaggregated IC Industry

Chakrabarty, K.
Journal:
IEEE Design & Test of Computers
Year:
2012
Language:
english
File:
PDF, 96 KB
english, 2012
5

10.1109/mdt.2012.2203909

Journal:
IEEE Design & Test of Computers
Year:
2012
File:
PDF, 1.59 MB
2012
6

10.1109/mdt.2012.2203950

Journal:
IEEE Design & Test of Computers
Year:
2012
File:
PDF, 1.63 MB
2012
7

10.1109/mdt.2012.2205970

Journal:
IEEE Design & Test of Computers
Year:
2012
File:
PDF, 137 KB
2012
8

Interoperable Design Constraints for Custom IC Design

Morse, R.
Journal:
IEEE Design & Test of Computers
Year:
2012
Language:
english
File:
PDF, 467 KB
english, 2012
11

Leakage Power Contributor Modeling

Dhanwada, N., Hathaway, D., Frenkil, J., Davis, W. R., Demircioglu, H.
Journal:
IEEE Design & Test of Computers
Year:
2012
Language:
english
File:
PDF, 430 KB
english, 2012
12

Low-Power Design Using the Si2 Common Power Format

Carver, S., Mathur, A., Sharma, L., Subbarao, P., Urish, S., Wang, Q.
Journal:
IEEE Design & Test of Computers
Year:
2012
Language:
english
File:
PDF, 460 KB
english, 2012
14

Abstraction and Standardization in Hardware Design

Sanguinetti, J.
Journal:
IEEE Design & Test of Computers
Year:
2012
Language:
english
File:
PDF, 318 KB
english, 2012
16

OpenAccess: Standard and Practices

Hahn, M.
Journal:
IEEE Design & Test of Computers
Year:
2012
Language:
english
File:
PDF, 693 KB
english, 2012
17

Too Much Automation?

Journal:
IEEE Design & Test of Computers
Year:
2012
Language:
english
File:
PDF, 147 KB
english, 2012
18

A World Without Standards

Davidson, S.
Journal:
IEEE Design & Test of Computers
Year:
2012
Language:
english
File:
PDF, 73 KB
english, 2012
19

Guest Editors' Introduction: Special Issue on EDA Industry Standards

Rawat, S. S., DasGupta, S.
Journal:
IEEE Design & Test of Computers
Year:
2012
Language:
english
File:
PDF, 59 KB
english, 2012
20

Managing Complex Boundary-Scan Operations

Eklow, B.
Journal:
IEEE Design & Test of Computers
Year:
2012
Language:
english
File:
PDF, 76 KB
english, 2012
21

[Front cover]

Journal:
IEEE Design & Test of Computers
Year:
2012
File:
PDF, 997 KB
2012
22

Call for Papers

Journal:
IEEE Design & Test of Computers
Year:
2012
Language:
english
File:
PDF, 44 KB
english, 2012
23

Table of Contents

Journal:
IEEE Design & Test of Computers
Year:
2012
Language:
english
File:
PDF, 60 KB
english, 2012
24

10.1109/mdt.2012.2203912

Journal:
IEEE Design & Test of Computers
Year:
2012
Language:
english
File:
PDF, 48 KB
english, 2012
25

IEEE Design & Test of Computers publication information

Journal:
IEEE Design & Test of Computers
Year:
2012
Language:
english
File:
PDF, 62 KB
english, 2012
26

[Inside back cover]

Journal:
IEEE Design & Test of Computers
Year:
2012
File:
PDF, 1.33 MB
2012
27

[Back cover]

Journal:
IEEE Design & Test of Computers
Year:
2012
File:
PDF, 1.05 MB
2012
28

Departments

Journal:
IEEE Design & Test of Computers
Year:
2012
File:
PDF, 180 KB
2012
29

10.1109/mdt.2012.2203949

Journal:
IEEE Design & Test of Computers
Year:
2012
File:
PDF, 799 KB
2012
30

10.1109/mdt.2012.2205869

Journal:
IEEE Design & Test of Computers
Year:
2012
File:
PDF, 1.38 MB
2012
31

10.1109/mdt.2012.2205967

Journal:
IEEE Design & Test of Computers
Year:
2012
File:
PDF, 789 KB
2012
32

10.1109/mdt.2012.2205968

Journal:
IEEE Design & Test of Computers
Year:
2012
Language:
english
File:
PDF, 442 KB
english, 2012
33

10.1109/mdt.2012.2205969

Journal:
IEEE Design & Test of Computers
Year:
2012
File:
PDF, 1.24 MB
2012