Volume 29; Issue 4

IEEE Design & Test of Computers

Volume 29; Issue 4
3

Adaptive Alternate Analog Test

Year:
2012
Language:
english
File:
PDF, 577 KB
english, 2012
6

A Highly Fault-Efficient SAT-Based ATPG Flow

Year:
2012
Language:
english
File:
PDF, 464 KB
english, 2012
8

From measurements to sustainable choices [Persepectives]

Year:
2012
Language:
english
File:
PDF, 264 KB
english, 2012
9

CEDA Currents

Year:
2012
Language:
english
File:
PDF, 122 KB
english, 2012
10

Energy Efficiency Like Your Momma Used to Make

Year:
2012
Language:
english
File:
PDF, 69 KB
english, 2012
14

Guest Editors' Introduction: Green Buildings

Year:
2012
Language:
english
File:
PDF, 64 KB
english, 2012
15

Test Technology TC Newsletter

Year:
2012
Language:
english
File:
PDF, 72 KB
english, 2012
16

Electronic Design Methods and Technologies for Green Buildings

Year:
2012
Language:
english
File:
PDF, 97 KB
english, 2012
17

10.1109/MDT.2012.2221225

Year:
2012
File:
PDF, 909 KB
2012
18

10.1109/MDT.2012.2221226

Year:
2012
File:
PDF, 1.59 MB
2012
19

10.1109/MDT.2012.2221227

Year:
2012
File:
PDF, 1.33 MB
2012
20

10.1109/MDT.2012.2221228

Year:
2012
File:
PDF, 1.05 MB
2012
21

Departments

Year:
2012
File:
PDF, 165 KB
2012
22

IEEE Design & Test of Computers publication information

Year:
2012
Language:
english
File:
PDF, 65 KB
english, 2012
23

Table of Contents

Year:
2012
Language:
english
File:
PDF, 62 KB
english, 2012
24

IEEE Open Access Publishing

Year:
2012
File:
PDF, 732 KB
2012
25

10.1109/MDT.2012.2222132

Year:
2012
File:
PDF, 1.24 MB
2012