Volume 18; Issue 1

IEEE Electron Device Letters

Volume 18; Issue 1

1

Spatial temperature profiles due to nonuniform self-heating in LDMOS's in thin SOI

Ying-keung Leung, S. Kuehne, V. Huang, C. Nguyen, A. Paul, J. Plummer, S. Wong

Journal:

IEEE Electron Device Letters

Year:

1997

Language:

english

File:

PDF, 54 KB

english, 1997

2

Low resistance ohmic contacts to p-Ge/sub 1-x/Cx on Si

Xiaoping Shao, S. Rommel, B. Orner, P. Berger, J. Kolodzey, K. Unruh

Journal:

IEEE Electron Device Letters

Year:

1997

Language:

english

File:

PDF, 91 KB

english, 1997

3

Self-aligned offset gated poly-Si TFTs with a floating sub-gate

Cheol-Min Park,, Byung-Hyuk Min,, Jae-Hong Jun,, Juhn-Suk Yoo,, Min-Koo Han,

Journal:

IEEE Electron Device Letters

Year:

1997

Language:

english

File:

PDF, 54 KB

english, 1997

4

The IBMCT: a novel MOS-gated thyristor structure

Flores, D., Godignon, P., Vellvehi, M., Fernandez, J., Hidalgo, S., Rebollo, J., Millan, J.

Journal:

IEEE Electron Device Letters

Year:

1997

Language:

english

File:

PDF, 74 KB

english, 1997

5

Effect of postoxidation annealing on the reliability of rapid thermal thin gate oxides

Chin-Yang Chen,, Jenn-Gwo Hwu,

Journal:

IEEE Electron Device Letters

Year:

1997

Language:

english

File:

PDF, 64 KB

english, 1997

6

Novel fingerprint scanning arrays using polysilicon TFT's on glass and polymer substrates

Young, N.D., Harkin, G., Bunn, R.M., McCulloch, D.J., Wilks, R.W., Knapp, A.G.

Journal:

IEEE Electron Device Letters

Year:

1997

Language:

english

File:

PDF, 51 KB

english, 1997