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Volume 18; Issue 10
Main
IEEE Electron Device Letters
Volume 18; Issue 10
IEEE Electron Device Letters
Volume 18; Issue 10
1
High-temperature performance of AlGaN/GaN HFETs on SiC substrates
Gaska, R.
,
Chen, Q.
,
Yang, J.
,
Osinsky, A.
,
Asif Khan, M.
,
Shur, M.S.
Journal:
IEEE Electron Device Letters
Year:
1997
Language:
english
File:
PDF, 75 KB
Your tags:
english, 1997
2
Cyclic current-voltage characterization applied to edge damage evaluation in gate definition plasma etching
Okandan, M.
,
Fonash, S.J.
,
Ozaita, M.
,
Preuninger, F.
,
Chan, Y.D.
,
Werking, J.
Journal:
IEEE Electron Device Letters
Year:
1997
Language:
english
File:
PDF, 93 KB
Your tags:
english, 1997
3
Highly reliable polysilicon oxide grown by electron cyclotron resonance nitrous oxide plasma
Nae-In Lee,
,
Jin-Woo Lee,
,
Sung-Hoi Hur,
,
Hyoung-Sub Kim,
,
Chul-Hi Han,
Journal:
IEEE Electron Device Letters
Year:
1997
Language:
english
File:
PDF, 69 KB
Your tags:
english, 1997
4
Investigation of anomalous leakage current in mesa-isolated SOI MOSFETs
Iwamatsu, T.
,
Yamaguchi, Y.
,
Ipposhi, T.
,
Maegawa, S.
,
Inoue, Y.
,
Nishimura, T.
Journal:
IEEE Electron Device Letters
Year:
1997
Language:
english
File:
PDF, 91 KB
Your tags:
english, 1997
5
Prediction of plasma charging induced gate oxide damage by plasma charging probe
Shawming Ma,
,
McVittie, J.P.
,
Saraswat, K.C.
Journal:
IEEE Electron Device Letters
Year:
1997
Language:
english
File:
PDF, 78 KB
Your tags:
english, 1997
6
Degradation characteristics of STI and MESA-isolated thin-film SOI CMOS
Cheng-Liang Huang,
,
Grula, G.J.
Journal:
IEEE Electron Device Letters
Year:
1997
Language:
english
File:
PDF, 70 KB
Your tags:
english, 1997
7
Test structure to investigate the series resistance components of source/drain structure
Biesemans, S.
,
Kubicek, S.
,
De Meyer, K.
Journal:
IEEE Electron Device Letters
Year:
1997
Language:
english
File:
PDF, 117 KB
Your tags:
english, 1997
8
Charge trapping and degradation in high-permittivity TiO2 dielectric films
Hyeon-Seag Kim,
,
Campbell, S.A.
,
Gilmer, C.
Journal:
IEEE Electron Device Letters
Year:
1997
Language:
english
File:
PDF, 76 KB
Your tags:
english, 1997
9
Correlation between fixed positive charge and hot-electron immunity for nitridized oxides
Hook, T.B.
,
Watson, K.
,
Lee, E.
,
Martin, D.
,
Ganesh, R.
,
Kim, S.
,
Ray, A.
Journal:
IEEE Electron Device Letters
Year:
1997
Language:
english
File:
PDF, 33 KB
Your tags:
english, 1997
10
New self-aligned planar resonant-tunneling diodes for monolithic circuits
Chen, C.L.
,
Mathews, R.H.
,
Mahoney, L.J.
,
Maki, P.A.
,
Molvar, K.M.
,
Sage, J.P.
,
Fitch, G.L.
,
Sollner, T.C.L.G.
Journal:
IEEE Electron Device Letters
Year:
1997
Language:
english
File:
PDF, 52 KB
Your tags:
english, 1997
11
An experimental confirmation of automatic threshold voltage convergence in a flash memory using alternating word-line voltage pulses
Gotou, H.
Journal:
IEEE Electron Device Letters
Year:
1997
Language:
english
File:
PDF, 59 KB
Your tags:
english, 1997
12
Empirical model for the low-frequency noise of hot-carrier degraded submicron LDD MOSFETs
Simoen, E.
,
Vasina, P.
,
Sikula, J.
,
Claeys, C.
Journal:
IEEE Electron Device Letters
Year:
1997
Language:
english
File:
PDF, 78 KB
Your tags:
english, 1997
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