IEEE Electron Device Letters

1

Demonstration of a Curable Nanowire FinFET Using Punchthrough Current to Repair Hot-Carrier Damage

Park, Jun-Young, Hur, Jae, Choi, Yang-Kyu

Journal:

Year:

2018

Language:

english

File:

PDF, 1.38 MB

english, 2018

2

Flexible Pressure Sensor With High Sensitivity and Low Hysteresis Based on a Hierarchically Microstructured Electrode

Cheng, Wen, Wang, Jun, Ma, Zhong, Yan, Ke, Wang, Yunmu, Wang, Huiting, Li, Sheng, Li, Yun, Pan, Lijia, Shi, Yi

Journal:

IEEE Electron Device Letters

Year:

2018

Language:

english

File:

PDF, 911 KB

english, 2018

3

Simulation Study of a Novel Snapback-Free and Low Turn-Off Loss Reverse-Conducting IGBT With Controllable Trench Gate

Wei, Jie, Luo, Xiaorong, Huang, Linhua, Zhang, Bo

Journal:

IEEE Electron Device Letters

Year:

2018

Language:

english

File:

PDF, 2.59 MB

english, 2018

4

Oxide, GaN Interlayer-Based Vertical Trench MOSFET (OG-FET) on Bulk GaN Substrates’ [Mar 17 353-355]

Gupta, Chirag, Lund, Cory, Chan, Silvia H., Agarwal, Anchal, Liu, Junqian, Enatsu, Yuuki, Keller, Stacia, Mishra, Umesh K.

Journal:

IEEE Electron Device Letters

Year:

2018

Language:

english

File:

PDF, 109 KB

english, 2018

5

A Fast $V_{th}$ Measurement (FVM) Technique for NBTI Behavior Characterization

Yu, Xiao, Cheng, Ran, Liu, Wei, Qu, Yiming, Han, Jinghui, Chen, Bing, Lu, Jiwu, Zhao, Yi

Journal:

IEEE Electron Device Letters

Year:

2018

Language:

english

File:

PDF, 828 KB

english, 2018

6

Adsorption of Small Molecules on Niobium Doped Graphene: A Study Based on Density Functional Theory

Kumar, Jitendra, Nemade, Harshal B., Giri, P. K.

Journal:

IEEE Electron Device Letters

Year:

2018

Language:

english

File:

PDF, 1.05 MB

english, 2018

7

Superior Selectivity and Sensitivity of C 3 N Sensor in Probing Toxic Gases NO 2 and SO 2

Cui, Heping, Zheng, Kai, Zhang, Yingying, Ye, Huaiyu, Chen, Xianping

Journal:

IEEE Electron Device Letters

Year:

2018

Language:

english

File:

PDF, 936 KB

english, 2018

8

650-V Double-Channel Lateral Schottky Barrier Diode With Dual-Recess Gated Anode

Lei, Jiacheng, Wei, Jin, Tang, Gaofei, Zhang, Zhaofu, Qian, Qingkai, Zheng, Zheyang, Hua, Mengyuan, Chen, Kevin J.

Journal:

IEEE Electron Device Letters

Year:

2018

Language:

english

File:

PDF, 1.28 MB

english, 2018

9

The Importance of Contact Resistance in High-Mobility Organic Field-Effect Transistors Studied by Scanning Kelvin Probe Microscopy

Hu, Yuanyuan, Li, Guodong, Chen, Zhuojun

Journal:

IEEE Electron Device Letters

Year:

2018

Language:

english

File:

PDF, 768 KB

english, 2018

10

Room Temperature Fabrication of High Quality ZrO 2 Dielectric Films for High Performance Flexible Organic Transistor Applications

Gong, Yanfen, Zhao, Kai, Yan, Longsen, Wei, Weiyao, Yang, Cheng, Ning, Honglong, Wu, Sujuan, Gao, Jinwei, Zhou, Guofu, Lu, Xubing, Liu, J.-M.

Journal:

IEEE Electron Device Letters

Year:

2018

Language:

english

File:

PDF, 1.13 MB

english, 2018

11

Tensile Stress Effect on Performance of a-IGZO TFTs With Source/Drain Offsets

Hasan, Mehedi, Billah, Mohammad Masum, Jang, Jin

Journal:

IEEE Electron Device Letters

Year:

2018

Language:

english

File:

PDF, 906 KB

english, 2018

12

Universality of Short-Channel Effects on Ultrascaled MOSFET Performance

Pourghaderi, M. Ali, Pham, Anh-Tuan, Ilatikhameneh, Hesameddin, Kim, Jongchol, Park, Hong-Hyun, Jin, Seonghoon, Chung, Won-Young, Choi, Woosung, Maeda, Shigenobu, Lee, Keun-Ho

Journal:

IEEE Electron Device Letters

Year:

2018

Language:

english

File:

PDF, 1.64 MB

english, 2018

13

Weak Localization and Weak Antilocalization in Double-Gate a-InGaZnO Thin-Film Transistors

Wang, Wei-Hsiang, Heredia, Elica, Lyu, Syue-Ru, Liu, Shu-Hao, Liao, Po-Yung, Chang, Ting-Chang, Jiang, Pei-hsun

Journal:

IEEE Electron Device Letters

Year:

2018

Language:

english

File:

PDF, 1.30 MB

english, 2018

14

A Novel 1.2 kV 4H-SiC Buffered-Gate (BG) MOSFET: Analysis and Experimental Results

Han, Kijeong, Baliga, B. J., Sung, Woongje

Journal:

IEEE Electron Device Letters

Year:

2018

Language:

english

File:

PDF, 915 KB

english, 2018

15

A Comparative Study on Fluorination and Oxidation of Indium–Gallium–Zinc Oxide Thin-Film Transistors

Lu, Lei, Xia, Zhihe, Li, Jiapeng, Feng, Zhuoqun, Wang, Sisi, Kwok, Hoi Sing, Wong, Man

Journal:

IEEE Electron Device Letters

Year:

2018

Language:

english

File:

PDF, 1.03 MB

english, 2018

16

Thermal Stability of HfO x -Based Resistive Memory Array: A Temperature Coefficient Study

Wang, Xiao Hu, Wu, Huaqiang, Gao, Bin, Li, Xinyi, Deng, Ning, Qian, He

Journal:

IEEE Electron Device Letters

Year:

2018

Language:

english

File:

PDF, 607 KB

english, 2018

17

Carrier Mobility Enhancement by Applying Back-Gate Bias in Ge-on-Insulator MOSFETs

Wu, Wangran, Wu, Heng, Zhang, Jingyun, Si, Mengwei, Zhao, Yi, Ye, Peide D.

Journal:

IEEE Electron Device Letters

Year:

2018

Language:

english

File:

PDF, 1.09 MB

english, 2018

18

Improved Synapse Device With MLC and Conductance Linearity Using Quantized Conduction for Neuromorphic Systems

Lim, Seokjae, Sung, Changhyuck, Kim, Hyungjun, Kim, Taesu, Song, Jeonghwan, Kim, Jae-Joon, Hwang, Hyunsang

Journal:

IEEE Electron Device Letters

Year:

2018

Language:

english

File:

PDF, 1.18 MB

english, 2018

19

Complementary Integrated Circuits Based on p-Type SnO and n-Type IGZO Thin-Film Transistors

Li, Yunpeng, Yang, Jin, Wang, Yiming, Ma, Pengfei, Yuan, Yvzhuo, Zhang, Jiawei, Lin, Zhaojun, Zhou, Li, Xin, Qian, Song, Aimin

Journal:

IEEE Electron Device Letters

Year:

2018

Language:

english

File:

PDF, 1.26 MB

english, 2018

20

Sub-100 nm Channel ZnSe Film/Graphene Hybrid-Based Photodetectors With an Ultrahigh Responsivity of 10 9 A/W

Xu, Zhihao, Wu, Congjun, Li, Alei, Ma, Yang, Fei, Guang Tao, Wang, Min

Journal:

IEEE Electron Device Letters

Year:

2018

Language:

english

File:

PDF, 746 KB

english, 2018

21

High-Time Resolved Two-Dimensional Tetra-Lateral Position-Sensitive Silicon Photomultiplier

Zhao, Tianqi, Peng, Yu, Li, Baicheng, He, Ran, Liang, Kun, Yang, Ru, Han, Dejun

Journal:

IEEE Electron Device Letters

Year:

2018

Language:

english

File:

PDF, 2.23 MB

english, 2018

22

7th World Conference on Pholtovoltaic Energy Conversion

Journal:

IEEE Electron Device Letters

Year:

2018

File:

PDF, 877 KB

2018

23

EDS Meetings Calendar

Journal:

IEEE Electron Device Letters

Year:

2018

File:

PDF, 2.41 MB

2018

24