IEEE Electron Device Letters

1

Negative Differential Resistance in Negative Capacitance FETs

Zhou, Jiuren, Han, Genquan, Li, Jing, Liu, Yan, Peng, Yue, Zhang, Jincheng, Sun, Qing-Qing, Zhang, David Wei, Hao, Yue

Journal:

Year:

2018

Language:

english

File:

PDF, 1.31 MB

english, 2018

2

Spiking Neural Network Using Synaptic Transistors and Neuron Circuits for Pattern Recognition With Noisy Images

Kim, Hyungjin, Hwang, Sungmin, Park, Jungjin, Yun, Sangdoo, Lee, Jong-Ho, Park, Byung-Gook

Journal:

IEEE Electron Device Letters

Year:

2018

Language:

english

File:

PDF, 2.29 MB

english, 2018

3

Solution-Processed Single-Crystal Array for High-Performance Conformable Transistors

Zhou, Yuying, Wang, Haiting, Tang, Qingxin, Tong, Yanhong, Zhao, Xiaoli, Liu, Yichun

Journal:

IEEE Electron Device Letters

Year:

2018

Language:

english

File:

PDF, 907 KB

english, 2018

4

A Reusable and High Sensitivity Nitrogen Dioxide Sensor Based on Monolayer SnSe

Wang, Jin, Yang, Guo-Feng, Xue, Jun-Jun, Lei, Jian-Ming, Chen, Dun-Jun, Lu, Hai, Zhang, Rong, Zheng, You-Dou

Journal:

IEEE Electron Device Letters

Year:

2018

Language:

english

File:

PDF, 685 KB

english, 2018

5

Experimental Demonstration of AlN Heat Spreaders for the Monolithic Integration of Inline Phase-Change Switches

El-Hinnawy, Nabil, Borodulin, Pavel, King, Matthew R., Furrow, Colin, Padilla, Carlos R., Ezis, Andris, Nichols, Doyle T., Paramesh, Jeyanandh, Bain, James A., Young, Robert M.

Journal:

IEEE Electron Device Letters

Year:

2018

Language:

english

File:

PDF, 670 KB

english, 2018

6

Excess Off-State Current in InGaAs FinFETs

Zhao, Xin, Vardi, Alon, del Alamo, Jesus A.

Journal:

IEEE Electron Device Letters

Year:

2018

Language:

english

File:

PDF, 896 KB

english, 2018

7

High ${f}_{{T}}$ AlGa(In)N/GaN HEMTs Grown on Si With a Low Gate Leakage and a High ON/OFF Current Ratio

Dai, Shujun, Zhou, Yu, Zhong, Yaozong, Zhang, Kai, Zhu, Guangrun, Gao, Hongwei, Sun, Qian, Chen, Tangsheng, Yang, Hui

Journal:

IEEE Electron Device Letters

Year:

2018

Language:

english

File:

PDF, 927 KB

english, 2018

8

A Novel Deep Junction Edge Termination for Superjunction MOSFETs

Cheng, Chia-Hui, Huang, Chih-Fang, Lee, Kung-Yen, Zhao, Feng

Journal:

IEEE Electron Device Letters

Year:

2018

Language:

english

File:

PDF, 1.33 MB

english, 2018

9

Determination of Minority Carrier Lifetime of Holes in Diamond p-i-n Diodes Using Reverse Recovery Method

Dutta, Maitreya, Mandal, Saptarshi, Hathwar, Raghuraj, Fischer, Alec M., Koeck, Franz A. M., Nemanich, Robert J., Goodnick, Stephen M., Chowdhury, Srabanti

Journal:

IEEE Electron Device Letters

Year:

2018

Language:

english

File:

PDF, 1.39 MB

english, 2018

10

EDS Meetings Calendar

Journal:

IEEE Electron Device Letters

Year:

2018

File:

PDF, 2.61 MB

2018

12

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Journal:

IEEE Electron Device Letters

Year:

2018

File:

PDF, 3 KB

2018

13