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Volume 40; Issue 4
Main
IEEE Electron Device Letters
Volume 40; Issue 4
IEEE Electron Device Letters
Volume 40; Issue 4
1
Total-Ionizing-Dose Irradiation-Induced Dielectric Field Enhancement for High-Voltage SOI LDMOS
Zhou, Xin
,
Yuan, Zhangyi'an
,
Shu, Lei
,
Qiao, Ming
,
Lu, Zhenlin
,
Zhao, Yuanfu
,
Li, Zhaoji
,
Zhang, Bo
Journal:
IEEE Electron Device Letters
Year:
2019
Language:
english
File:
PDF, 1.09 MB
Your tags:
english, 2019
2
Total-Ionizing-Dose Irradiation-Induced Dielectric Field Enhancement for High-Voltage SOI LDMOS
Zhou, Xin
,
Yuan, Zhangyi'an
,
Shu, Lei
,
Qiao, Ming
,
Lu, Zhenlin
,
Zhao, Yuanfu
,
Li, Zhaoji
,
Zhang, Bo
Journal:
IEEE Electron Device Letters
Year:
2019
File:
PDF, 1.09 MB
Your tags:
2019
3
Ultra Wide Band Gap Semiconductors for Power Control and Conversion
Journal:
IEEE Electron Device Letters
Year:
2019
File:
PDF, 1.36 MB
Your tags:
2019
4
Front cover
Journal:
IEEE Electron Device Letters
Year:
2019
File:
PDF, 516 KB
Your tags:
2019
5
EDS Meetings Calendar
Journal:
IEEE Electron Device Letters
Year:
2019
File:
PDF, 925 KB
Your tags:
2019
6
IEEE Electron Device Letters information for authors
Journal:
IEEE Electron Device Letters
Year:
2019
Language:
english
File:
PDF, 125 KB
Your tags:
english, 2019
7
Table of contents
Journal:
IEEE Electron Device Letters
Year:
2019
Language:
english
File:
PDF, 259 KB
Your tags:
english, 2019
8
Call for Papers - T-ED special issue "Memory Devices and Technologies for the Next Decade"
Journal:
IEEE Electron Device Letters
Year:
2019
File:
PDF, 1.08 MB
Your tags:
2019
9
IEEE Electron Devices Society J. J. Ebers Award
Journal:
IEEE Electron Device Letters
Year:
2019
File:
PDF, 529 KB
Your tags:
2019
10
Table of contents
Journal:
IEEE Electron Device Letters
Year:
2019
Language:
english
File:
PDF, 198 KB
Your tags:
english, 2019
11
ESD-Reliability Enhancement of Circular UHV 300-V Power nLDMOS by the Drain-side Superjunction Structure
Chen, Shen-Li
,
Wu, Pei-Lin
,
Lin, Po-Lin
Journal:
IEEE Electron Device Letters
Year:
2019
Language:
english
File:
PDF, 807 KB
Your tags:
english, 2019
12
IEEE Electron Device Letters
Journal:
IEEE Electron Device Letters
Year:
2019
Language:
english
File:
PDF, 1.67 MB
Your tags:
english, 2019
13
Blank page
Journal:
IEEE Electron Device Letters
Year:
2019
Language:
english
File:
PDF, 4.40 MB
Your tags:
english, 2019
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