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Volume 25; Issue 6
Main
IEEE Micro
Volume 25; Issue 6
IEEE Micro
Volume 25; Issue 6
1
Designing reliable systems from unreliable components: the challenges of transistor variability and degradation
Borkar, S.
Journal:
IEEE Micro
Year:
2005
Language:
english
File:
PDF, 216 KB
Your tags:
english, 2005
2
2006 IEEE Computer Society Professional Membership/Subscription Application
Journal:
IEEE Micro
Year:
2005
Language:
english
File:
PDF, 457 KB
Your tags:
english, 2005
3
An experimental study of soft errors in microprocessors
Saggese, G.P.
,
Wang, N.J.
,
Kalbarczyk, Z.T.
,
Patel, S.J.
,
Iyer, R.K.
Journal:
IEEE Micro
Year:
2005
Language:
english
File:
PDF, 148 KB
Your tags:
english, 2005
4
Cell processor low-power design methodology
Stasiak, D.
,
Chaudhry, R.
,
Cox, D.
,
Posluszny, S.
,
Warnock, J.
,
Weitzel, S.
,
Wendel, D.
,
Wang, M.
Journal:
IEEE Micro
Year:
2005
Language:
english
File:
PDF, 320 KB
Your tags:
english, 2005
5
Computer Society Information
Journal:
IEEE Micro
Year:
2005
Language:
english
File:
PDF, 66 KB
Your tags:
english, 2005
6
Designing microprocessors with robust functionality and performance
Bose, P.
Journal:
IEEE Micro
Year:
2005
Language:
english
File:
PDF, 72 KB
Your tags:
english, 2005
7
[Front cover]
Journal:
IEEE Micro
Year:
2005
File:
PDF, 2.11 MB
Your tags:
2005
8
Guest Editor's Introduction: Reliability-Aware Microarchitecture
Adve, S.V.
,
Sanda, P.
Journal:
IEEE Micro
Year:
2005
Language:
english
File:
PDF, 617 KB
Your tags:
english, 2005
9
IEEE Micro 2005 Annual Index, Vol. 25
Journal:
IEEE Micro
Year:
2005
Language:
english
File:
PDF, 120 KB
Your tags:
english, 2005
10
Improved thermal management with reliability banking
Lu, Z.
,
Lach, J.
,
Stan, M.R.
,
Skadron, K.
Journal:
IEEE Micro
Year:
2005
Language:
english
File:
PDF, 468 KB
Your tags:
english, 2005
11
Masthead
Journal:
IEEE Micro
Year:
2005
Language:
english
File:
PDF, 55 KB
Your tags:
english, 2005
12
Power-efficient error tolerance in chip multiprocessors
Rashid, M.W.
,
Tan, E.J.
,
Huang, M.C.
,
Albonesi, D.H.
Journal:
IEEE Micro
Year:
2005
Language:
english
File:
PDF, 147 KB
Your tags:
english, 2005
13
Recent advances and new avenues in hardware-level reliability support
Iyer, R.K.
,
Nakka, N.M.
,
Kalbarczyk, Z.T.
,
Mitra, S.
Journal:
IEEE Micro
Year:
2005
Language:
english
File:
PDF, 139 KB
Your tags:
english, 2005
14
Table of Contents
Journal:
IEEE Micro
Year:
2005
Language:
english
File:
PDF, 250 KB
Your tags:
english, 2005
15
Transnational electronic systems and patent infringement
Stern, R.H.
Journal:
IEEE Micro
Year:
2005
Language:
english
File:
PDF, 342 KB
Your tags:
english, 2005
16
TRUSS: a reliable, scalable server architecture
Gold, B.T.
,
Kim, J.
,
Smolens, J.C.
,
Chung, E.S.
,
Liaskovitis, V.
,
Nurvitadhi, E.
,
Falsafi, B.
,
Hoe, J.C.
,
Nowatzyk, A.G.
Journal:
IEEE Micro
Year:
2005
Language:
english
File:
PDF, 145 KB
Your tags:
english, 2005
17
Wireless access and electrical markets: Becoming similar?
Greenstein, S.
Journal:
IEEE Micro
Year:
2005
Language:
english
File:
PDF, 94 KB
Your tags:
english, 2005
18
Writing the claims for a patent
Emma, P.
Journal:
IEEE Micro
Year:
2005
Language:
english
File:
PDF, 82 KB
Your tags:
english, 2005
19
Year-end cleanup
Mateosian, R.
Journal:
IEEE Micro
Year:
2005
Language:
english
File:
PDF, 106 KB
Your tags:
english, 2005
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