Volume 50; Issue 1

IEEE Transactions on Electron Devices

Volume 50; Issue 1

1

An experimental study of charge diffusion in the undepleted silicon of X-ray CCDs

Prigozhin, G., Butler, N.R., Kissel, S.E., Ricker, G.R.

Journal:

IEEE Transactions on Electron Devices

Year:

2003

Language:

english

File:

PDF, 661 KB

english, 2003

2

Charge sharing modeling in pixel detectors with capacitive charge division

Marczewski, J., Tomaszewski, D., Domanski, K., Grabiec, P., Caccia, M., Borghi, S., Campagnolo, R., Kucewicz, W.

Journal:

IEEE Transactions on Electron Devices

Year:

2003

Language:

english

File:

PDF, 484 KB

english, 2003

3

New signal readout method for ultrahigh-sensitivity CMOS image sensor

Watabe, T., Goto, M., Ohtake, H., Maruyama, H., Abe, M., Tanioka, K., Egami, N.

Journal:

IEEE Transactions on Electron Devices

Year:

2003

Language:

english

File:

PDF, 547 KB

english, 2003

4

Crosstalk and microlens study in a color CMOS image sensor

Agranov, G., Berezin, V., Tsai, R.H.

Journal:

IEEE Transactions on Electron Devices

Year:

2003

Language:

english

File:

PDF, 1.63 MB

english, 2003

5

An image sensor which captures 100 consecutive frames at 1000000 frames/s

Etoh, T.G., Poggemann, D., Kreider, G., Mutoh, H., Theuwissen, A.J.P., Ruckelshausen, A., Kondo, Y., Maruno, H., Takubo, K., Soya, H., Takehara, K., Okinaka, T., Takano, Y.

Journal:

IEEE Transactions on Electron Devices

Year:

2003

Language:

english

File:

PDF, 1.15 MB

english, 2003

6

A 1.5-V 550-μW 176×144 autonomous CMOS active pixel image sensor

Kwang-Bo Cho, Krymski, A.I., Fossum, E.R.

Journal:

IEEE Transactions on Electron Devices

Year:

2003

Language:

english

File:

PDF, 1.01 MB

english, 2003

7

Fully depleted, back-illuminated charge-coupled devices fabricated on high-resistivity silicon

Holland, S.E., Groom, D.E., Palaio, N.P., Stover, R.J., Mingzhi Wei

Journal:

IEEE Transactions on Electron Devices

Year:

2003

Language:

english

File:

PDF, 935 KB

english, 2003

8

A 35-mm format 11 M pixel full-frame CCD for professional digital still imaging

Bosiers, J.T., Dillen, B.G.M., Draijer, C., Kleimann, A.C., Polderdijk, F.J., de Wolf, M.A.R.C., Klaassens, W., Theuwissen, A.J.P., Peek, H.L., Folkerts, H.O.

Journal:

IEEE Transactions on Electron Devices

Year:

2003

Language:

english

File:

PDF, 1.43 MB

english, 2003

9

An image sensor with fast objects' position extraction function

Akita, J., Watanabe, A., Tooyama, O., Miyama, M., Yoshimoto, M.

Journal:

IEEE Transactions on Electron Devices

Year:

2003

Language:

english

File:

PDF, 1.06 MB

english, 2003

10

An image sensor with an in-pixel demodulation function for detecting the intensity of a modulated light signal

Ohta, J., Yamamoto, K., Hirai, T., Kagawa, K., Nunoshita, M., Yamada, M., Yamasaki, Y., Sugishita, S., Watanabe, K.

Journal:

IEEE Transactions on Electron Devices

Year:

2003

Language:

english

File:

PDF, 931 KB

english, 2003

11

Modeling of the bulk versus SOI CMOS performances for the optimal design of APS circuits in low-power low-voltage applications

Afzalian, A., Flandre, D.

Journal:

IEEE Transactions on Electron Devices

Year:

2003

Language:

english

File:

PDF, 357 KB

english, 2003

12

A 9-V/Lux-s 5000-frames/s 512×512 CMOS sensor

Krymski, A.I., Nianrong Tu

Journal:

IEEE Transactions on Electron Devices

Year:

2003

Language:

english

File:

PDF, 691 KB

english, 2003

13

Adaptive-integration-time image sensor with real-time reconstruction function

Yasuda, T., Hamamoto, T., Aizawa, K.

Journal:

IEEE Transactions on Electron Devices

Year:

2003

Language:

english

File:

PDF, 1.26 MB

english, 2003

14

Transversal-readout architecture for CMOS active pixel image sensors

Miyatake, S., Miyamoto, M., Ishida, K., Morimoto, T., Masaki, Y., Tanabe, H.

Journal:

IEEE Transactions on Electron Devices

Year:

2003

Language:

english

File:

PDF, 1.11 MB

english, 2003

15

A high-speed, 240-frames/s, 4.1-Mpixel CMOS sensor

Krymski, A.I., Bock, N.E., Nianrong Tu, Van Blerkom, D., Fossum, E.R.

Journal:

IEEE Transactions on Electron Devices

Year:

2003

Language:

english

File:

PDF, 528 KB

english, 2003

16

Excess noise and other important characteristics of low light level imaging using charge multiplying CCDs

Hynecek, J., Nishiwaki, T.

Journal:

IEEE Transactions on Electron Devices

Year:

2003

Language:

english

File:

PDF, 578 KB

english, 2003

17

Dark current reduction in stacked-type CMOS-APS for charged particle imaging

Takayanagi, I., Nakamura, J., Fossum, E.R., Nagashima, K., Kunihoro, T., Yurimoto, H.

Journal:

IEEE Transactions on Electron Devices

Year:

2003

Language:

english

File:

PDF, 531 KB

english, 2003

18

A CMOS image sensor with dark-current cancellation and dynamic sensitivity operations

Hsiu-Yu Cheng, Ya-Chin King

Journal:

IEEE Transactions on Electron Devices

Year:

2003

Language:

english

File:

PDF, 549 KB

english, 2003

19

3-D optical and electrical simulation for CMOS image sensors

Journal:

IEEE Transactions on Electron Devices

Year:

2003

Language:

english

File:

PDF, 646 KB

english, 2003

20

Photoresponse analysis and pixel shape optimization for CMOS active pixel sensors

Shcherback, I., Yadid-Pecht, O.

Journal:

IEEE Transactions on Electron Devices

Year:

2003

Language:

english

File:

PDF, 695 KB

english, 2003

21

A CMOS image sensor for high-speed active range finding using column-parallel time-domain ADC and position encoder

Oike, Y., Ikeda, M., Asada, K.

Journal:

IEEE Transactions on Electron Devices

Year:

2003

Language:

english

File:

PDF, 1.09 MB

english, 2003

22

Amorphous silicon active pixel sensor readout circuit for digital imaging

Karim, K.S., Nathan, A., Rowlands, J.A.

Journal:

IEEE Transactions on Electron Devices

Year:

2003

Language:

english

File:

PDF, 719 KB

english, 2003

23

An enhanced-performance CMOS imager with a flushed-reset photodiode pixel

Pain, B., Guang Yang, Cunningham, T.J., Wrigley, C., Hancock, B.

Journal:

IEEE Transactions on Electron Devices

Year:

2003

Language:

english

File:

PDF, 512 KB

english, 2003

24

Ag-GaP Schottky photodiodes for UV sensors

Pikhtin, A.N., Tarasov, S.A., Kloth, B.

Journal:

IEEE Transactions on Electron Devices

Year:

2003

Language:

english

File:

PDF, 273 KB

english, 2003

25

Leakage current modeling of test structures for characterization of dark current in CMOS image sensors

Loukianova, N.V., Folkerts, H.O., Maas, J.P.V., Verbugt, D.W.E., Mierop, A.J., Hoekstra, W., Roks, E., Theuwissen, A.J.P.

Journal:

IEEE Transactions on Electron Devices

Year:

2003

Language:

english

File:

PDF, 628 KB

english, 2003

26

An APS with 2-D winner-take-all selection employing adaptive spatial filtering and false alarm reduction

Fish, A., Turchin, D., Yadid-Pecht, O.

Journal:

IEEE Transactions on Electron Devices

Year:

2003

Language:

english

File:

PDF, 610 KB

english, 2003

27

Total dose and displacement damage effects in a radiation-hardened CMOS APS

Bogaerts, J., Dierickx, B., Meynants, G., Uwaerts, D.

Journal:

IEEE Transactions on Electron Devices

Year:

2003

Language:

english

File:

PDF, 680 KB

english, 2003

28

CMOS image sensor with NMOS-only global shutter and enhanced responsivity

Wany, M., Israel, G.P.

Journal:

IEEE Transactions on Electron Devices

Year:

2003

Language:

english

File:

PDF, 440 KB

english, 2003

29

A digital vision chip specialized for high-speed target tracking

Komuro, T., Ishii, I., Ishikawa, M., Yoshida, A.

Journal:

IEEE Transactions on Electron Devices

Year:

2003

Language:

english

File:

PDF, 729 KB

english, 2003

30

Two-dimensional monolithic lead chalcogenide infrared sensor arrays on silicon read-out chips and noise mechanisms

Zogg, H., Alchalabi, K., Zimin, D., Kellermann, K.

Journal:

IEEE Transactions on Electron Devices

Year:

2003

Language:

english

File:

PDF, 577 KB

english, 2003

31

CMOS imaging for automotive applications

Hosticka, B.J., Brockherde, W., Bussmann, A., Heimann, T., Jeremias, R., Kemna, A., Nitta, C., Schrey, O.

Journal:

IEEE Transactions on Electron Devices

Year:

2003

Language:

english

File:

PDF, 1.67 MB

english, 2003

32

A CMOS image sensor with a double-junction active pixel

Findlater, K.M., Renshaw, D., Hurwitz, J.E.D., Henderson, R.K., Purcell, M.D., Smith, S.G., Bailey, T.E.R.

Journal:

IEEE Transactions on Electron Devices

Year:

2003

Language:

english

File:

PDF, 795 KB

english, 2003

33

Foreword special issue on solid-state image sensors

Fossum, E.R., Teranishi, N., Theuwissen, A.J.P., Hynecek, J.

Journal:

IEEE Transactions on Electron Devices

Year:

2003

Language:

english

File:

PDF, 246 KB

english, 2003

34

Low-leakage-current and low-operating-voltage buried photodiode for a CMOS imager

Inoue, I., Tanaka, N., Yamashita, H., Yamaguchi, T., Ishiwata, H., Ihara, H.

Journal:

IEEE Transactions on Electron Devices

Year:

2003

Language:

english

File:

PDF, 615 KB

english, 2003

35

Large format backside illuminated CCD imager for space surveillance

Tower, J.R., Swain, P.K., Fu-Lung Hsueh, Dawson, R.M., Levine, P.A., Meray, G.M., Andrews, J.T., Frantz, V.L., Grygon, M.S., Reale, M.A., Sudol, T.M.

Journal:

IEEE Transactions on Electron Devices

Year:

2003

Language:

english

File:

PDF, 1.48 MB

english, 2003

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