Volume 59; Issue 8

7

-Dot Probe for Fast-Front High-Voltage Measurement

Year:
2010
Language:
english
File:
PDF, 1008 KB
english, 2010
8

Calibration of Line-Scan Cameras

Year:
2010
Language:
english
File:
PDF, 420 KB
english, 2010
15

The Evaluation of Scan-Derived Anthropometric Measurements

Year:
2010
Language:
english
File:
PDF, 262 KB
english, 2010
19

ADC Static Characterization Using Nonlinear Ramp Signal

Year:
2010
Language:
english
File:
PDF, 892 KB
english, 2010
20

A Robust Microwave Rain Gauge

Year:
2010
Language:
english
File:
PDF, 632 KB
english, 2010
30

Table of contents

Year:
2010
Language:
english
File:
PDF, 54 KB
english, 2010
31

IEEE Transactions on Instrumentation and Measurement publication information

Year:
2010
Language:
english
File:
PDF, 46 KB
english, 2010
33

IEEE 2009 Membership Application

Year:
2010
File:
PDF, 1.18 MB
2010
34

IEEE Instrumentation and Measurement Society Information

Year:
2010
Language:
english
File:
PDF, 32 KB
english, 2010
35

IEEE Transactions on Instrumentation and Measurement information for authors

Year:
2010
Language:
english
File:
PDF, 23 KB
english, 2010