Volume 43; Issue 2

2

Device simulation of charge collection and single-event upset

Year:
1996
Language:
english
File:
PDF, 2.07 MB
english, 1996
4

Single-event effects in avionics

Year:
1996
Language:
english
File:
PDF, 1.41 MB
english, 1996
5

Total-dose issues for microelectronics in space systems

Year:
1996
Language:
english
File:
PDF, 1.31 MB
english, 1996
6

Microbeam studies of single-event effects

Year:
1996
Language:
english
File:
PDF, 1.01 MB
english, 1996
7

Upsets related to spacecraft charging

Year:
1996
Language:
english
File:
PDF, 2.13 MB
english, 1996
14

Single-event effects in SOI technologies and devices

Year:
1996
Language:
english
File:
PDF, 1.10 MB
english, 1996
15

Problems with models of the radiation belts

Year:
1996
Language:
english
File:
PDF, 1.32 MB
english, 1996
16

Single-event effects in analog and mixed-signal integrated circuits

Year:
1996
Language:
english
File:
PDF, 996 KB
english, 1996
17

Review of commercial spacecraft anomalies and single-event-effect occurrences

Year:
1996
Language:
english
File:
PDF, 750 KB
english, 1996
18

Approaches to proton single-event rate calculations

Year:
1996
Language:
english
File:
PDF, 977 KB
english, 1996
19

High-energy charged particles in space at one astronomical unit

Year:
1996
Language:
english
File:
PDF, 906 KB
english, 1996
20

Single particle-induced latchup

Year:
1996
Language:
english
File:
PDF, 1.42 MB
english, 1996
22

Dynamic modeling of trapped particles

Year:
1996
Language:
english
File:
PDF, 1.46 MB
english, 1996
24

Laboratory tests for single-event effects

Year:
1996
Language:
english
File:
PDF, 1.02 MB
english, 1996
26

Single-event-effect mitigation from a system perspective

Year:
1996
Language:
english
File:
PDF, 912 KB
english, 1996
27

Compensation for nonuniform attenuation in SPECT brain imaging

Year:
1996
Language:
english
File:
PDF, 1.46 MB
english, 1996
28

Recent trends in single-event effect ground testing

Year:
1996
Language:
english
File:
PDF, 862 KB
english, 1996
30

Proton effects in charge-coupled devices

Year:
1996
Language:
english
File:
PDF, 1.71 MB
english, 1996
33

Single-event effect ground test issues

Year:
1996
Language:
english
File:
PDF, 1.17 MB
english, 1996
36

Single-event effects rate prediction

Year:
1996
Language:
english
File:
PDF, 1.58 MB
english, 1996