Volume 66; Issue 3

IEEE Transactions on Nuclear Science

Volume 66; Issue 3

1

Method to Extract System-Independent Material Properties From Dual-Energy X-Ray CT

Champley, Kyle M., Azevedo, Stephen G., Seetho, Isaac M., Glenn, Steven M., McMichael, Larry D., Smith, Jerel A., Kallman, Jeffrey S., Brown, William D., Martz, Harry E.

Journal:

IEEE Transactions on Nuclear Science

Year:

2019

File:

PDF, 12 KB

2019

2

Study on the Effect of Laser Parameters on the SEY of Aluminum Alloy

Wang, Jie, Gao, Yong, Fan, Jiakun, You, Zhiming, Wang, Sheng, Xu, Zhanglian

Journal:

IEEE Transactions on Nuclear Science

Year:

2019

File:

PDF, 8 KB

2019

3

A Bias-Dependent Single-Event-Enabled Compact Model for Bulk FinFET Technologies

Kauppila, J. S., Ball, D. R., Maharrey, J. A., Harrington, R. C., Haeffner, T. D., Sternberg, A. L., Alles, M. L., Massengill, L. W.

Journal:

IEEE Transactions on Nuclear Science

Year:

2019

File:

PDF, 3.11 MB

2019

4

An Analytical Study of the Effect of Total Ionizing Dose on Body Current in 130-nm PDSOI I/O nMOSFETs

Xie, Xin, Zhu, Huilong, Zhang, Mengying, Liu, Xiaonian, Dai, Lihua, Bi, Dawei, Hu, Zhiyuan, Zhang, Zhengxuan, Zou, Shichang

Journal:

IEEE Transactions on Nuclear Science

Year:

2019

Language:

english

File:

PDF, 5.68 MB

english, 2019

5

Affiliate Plan of the IEEE Nuclear and Plasma Sciences Society

Journal:

IEEE Transactions on Nuclear Science

Year:

2019

Language:

english

File:

PDF, 144 KB

english, 2019

6

Table of contents

Journal:

IEEE Transactions on Nuclear Science

Year:

2019

Language:

english

File:

PDF, 262 KB

english, 2019

7

IEEE Transactions on Nuclear Science information for authors

Journal:

IEEE Transactions on Nuclear Science

Year:

2019

Language:

english

File:

PDF, 62 KB

english, 2019