Volume 44; Issue 4

1

Electrolytic models for metallic electromigration failure mechanisms

Year:
1995
Language:
english
File:
PDF, 2.92 MB
english, 1995
3

Simulating IC reliability with emphasis on process-flaw related early failures

Year:
1995
Language:
english
File:
PDF, 713 KB
english, 1995
5

Mean time to first failure of repairable systems with one cold spare

Year:
1995
Language:
english
File:
PDF, 593 KB
english, 1995
10

Component redundancy vs system redundancy in the hazard rate ordering

Year:
1995
Language:
english
File:
PDF, 491 KB
english, 1995
11

Comment on: reliability modeling and performance of variable link-capacity networks

Year:
1995
Language:
english
File:
PDF, 167 KB
english, 1995
14

Calculating exact top-event probabilities using Σ-Patrec

Year:
1995
Language:
english
File:
PDF, 544 KB
english, 1995
15

Optimal test-times for intermittent faults

Year:
1995
Language:
english
File:
PDF, 214 KB
english, 1995
16

All opportunity-triggered replacement policy for multiple-unit systems

Year:
1995
Language:
english
File:
PDF, 444 KB
english, 1995
19

Fault severity in models of fault-correction activity

Year:
1995
Language:
english
File:
PDF, 729 KB
english, 1995
20

An empirical model of enhancement-induced defect activity in software

Year:
1995
Language:
english
File:
PDF, 611 KB
english, 1995
21

The impact of software enhancement on software reliability

Year:
1995
Language:
english
File:
PDF, 664 KB
english, 1995
22

Dynamic reliability analysis of coherent multistate systems

Year:
1995
Language:
english
File:
PDF, 523 KB
english, 1995
23

Symmetric relations in multistate systems

Year:
1995
Language:
english
File:
PDF, 418 KB
english, 1995
25

Domination of k-out-of-n systems

Year:
1995
Language:
english
File:
PDF, 374 KB
english, 1995
26

EDITORIALS

Year:
1995
Language:
english
File:
PDF, 147 KB
english, 1995