IEEE Transactions on Reliability

1

Testing exponentiality based on the Kullback-Leibler information with the type II censored data

Sangun Park

Journal:

Year:

2005

Language:

english

File:

PDF, 244 KB

english, 2005

2

Lognormal and Weibull accelerated life test plans under distribution misspecification

Pascual, F.G., Montepiedra, G.

Journal:

IEEE Transactions on Reliability

Year:

2005

Language:

english

File:

PDF, 482 KB

english, 2005

3

Effect of CVD-SiO2 film on reliability of GaAs MESFET with Ti/Pt/Au gate metal

Saito, Y., Hashinaga, T., Nakajima, S.

Journal:

IEEE Transactions on Reliability

Year:

2005

Language:

english

File:

PDF, 408 KB

english, 2005

4

On failure recoverability of client-server applications in mobile wireless environments

Chen, I.-R., Baoshan Gu, George, S.E., Sheng-Tzong Cheng

Journal:

IEEE Transactions on Reliability

Year:

2005

Language:

english

File:

PDF, 203 KB

english, 2005

5

Lifetime distribution based degradation analysis

Zehua Chen, Shurong Zheng

Journal:

IEEE Transactions on Reliability

Year:

2005

Language:

english

File:

PDF, 396 KB

english, 2005

6

The trunsored model and its applications to lifetime analysis: unified censored and truncated models

Hirose, H.

Journal:

IEEE Transactions on Reliability

Year:

2005

Language:

english

File:

PDF, 891 KB

english, 2005

7

A method to take account of inhomogeneity in mechanical component reliability calculations

Jian-Ping Li, Thompson, G.

Journal:

IEEE Transactions on Reliability

Year:

2005

Language:

english

File:

PDF, 433 KB

english, 2005

8

Optimal simple step-stress plan for cumulative exposure model using log-normal distribution

Alhadeed, A.A., Shie-Shien Yang

Journal:

IEEE Transactions on Reliability

Year:

2005

Language:

english

File:

PDF, 292 KB

english, 2005

9

A hierarchy of importance indices

Hwang, F.K.

Journal:

IEEE Transactions on Reliability

Year:

2005

Language:

english

File:

PDF, 149 KB

english, 2005

10

Modeling and analysis of correlated software failures of multiple types

Yuan-Shun Dai, Min Xie, Kim-Leng Poh

Journal:

IEEE Transactions on Reliability

Year:

2005

Language:

english

File:

PDF, 197 KB

english, 2005

11

Optimal age-replacement policy for nonrepairable products under renewing free-replacement warranty

Yeh, R.H., Gaung-Cheng Chen, Ming-Yuh Chen

Journal:

IEEE Transactions on Reliability

Year:

2005

Language:

english

File:

PDF, 187 KB

english, 2005

12

View through the door of the SOFIA project

Frank, M.V.

Journal:

IEEE Transactions on Reliability

Year:

2005

Language:

english

File:

PDF, 532 KB

english, 2005

13

A comparison of two simple prediction intervals for exponential distribution

Balakrishnan, N., Lin, C.-T., Ping-Shing Chan

Journal:

IEEE Transactions on Reliability

Year:

2005

Language:

english

File:

PDF, 782 KB

english, 2005

14

Accelerated life tests at higher usage rates

Guangbin Yang

Journal:

IEEE Transactions on Reliability

Year:

2005

Language:

english

File:

PDF, 214 KB

english, 2005

15

A multiple objective framework for planning accelerated life tests

Loon-Ching Tang, Kai Xu

Journal:

IEEE Transactions on Reliability

Year:

2005

Language:

english

File:

PDF, 251 KB

english, 2005

16

A m log m algorithm to compute the most probable configurations of a system with multi-mode independent components

Rauzy, A.

Journal:

IEEE Transactions on Reliability

Year:

2005

Language:

english

File:

PDF, 141 KB

english, 2005

17

Toward a deeper understanding of the availability of series-systems without aging during repairs

Schneeweiss, W.G.

Journal:

IEEE Transactions on Reliability

Year:

2005

Language:

english

File:

PDF, 77 KB

english, 2005

18

Stochastic fault tree analysis with self-loop basic events

Jenab, K., Dhillon, B.S.

Journal:

IEEE Transactions on Reliability

Year:

2005

Language:

english

File:

PDF, 397 KB

english, 2005

19

A probabilistic approach to evaluate the reliability of piezoelectric micro-actuators

Zhimin He, Han Tong Loh, Eng Hong Ong

Journal:

IEEE Transactions on Reliability

Year:

2005

Language:

english

File:

PDF, 428 KB

english, 2005

20

A concurrent built-in self-test architecture based on a self-testing RAM

Voyiatzis, I., Paschalis, A., Gizopoulos, D., Kranitis, N., Halatsis, C.

Journal:

IEEE Transactions on Reliability

Year:

2005

Language:

english

File:

PDF, 1.11 MB

english, 2005

21

Estimation of parameters of life from progressively censored data using Burr-XII model

Soliman, A.A.

Journal:

IEEE Transactions on Reliability

Year:

2005

Language:

english

File:

PDF, 342 KB

english, 2005

22

Comment on: a hazard function approximation used in reliability theory

Amari, S.V.

Journal:

IEEE Transactions on Reliability

Year:

2005

Language:

english

File:

PDF, 54 KB

english, 2005

23

An efficient cutset approach for evaluating communication-network reliability with heterogeneous link-capacities

Sieteng Soh, Rai, S.

Journal:

IEEE Transactions on Reliability

Year:

2005

Language:

english

File:

PDF, 494 KB

english, 2005

24

Adjusting software failure rates that are estimated from test data

Jeske, D.R., Xuemei Zhang, Pham, L.

Journal:

IEEE Transactions on Reliability

Year:

2005

Language:

english

File:

PDF, 254 KB

english, 2005

25

A spare bandwidth sharing scheme based on network reliability

Kyu-Seek Sohn, Seung Yeob Nam, Sung, D.K.

Journal:

IEEE Transactions on Reliability

Year:

2005

Language:

english

File:

PDF, 374 KB

english, 2005

26

Computing reliability and message delay for Cooperative wireless distributed sensor networks subject to random failures

AboElFotoh, H.M.F., Iyengar, S.S., Chakrabarty, K.

Journal:

IEEE Transactions on Reliability

Year:

2005

Language:

english

File:

PDF, 330 KB

english, 2005

27