IEEE Transactions on Reliability

1

Reliability of a System of k Nodes for High Performance Computing Applications

Gottumukkala, N.R., Nassar, R., Paun, M., Leangsuksun, C.B., Scott, S.L.

Journal:

Year:

2010

Language:

english

File:

PDF, 528 KB

english, 2010

2

Accelerated Degradation Tests Applied to Software Aging Experiments

Matias, R., Barbetta, P.A., Trivedi, K.S., Filho, P.J.F.

Journal:

IEEE Transactions on Reliability

Year:

2010

Language:

english

File:

PDF, 965 KB

english, 2010

3

Decision Diagram Based Methods and Complexity Analysis for Multi-State Systems

Shrestha, A., Liudong Xing, Yuanshun Dai

Journal:

IEEE Transactions on Reliability

Year:

2010

Language:

english

File:

PDF, 674 KB

english, 2010

4

Evaluating the Reliability Function and the Mean Residual Life for Equipment With Unobservable States

Ghasemi, A., Yacout, S., Ouali, M.-S.

Journal:

IEEE Transactions on Reliability

Year:

2010

Language:

english

File:

PDF, 686 KB

english, 2010

5

Mean Residual Life Function, Associated Orderings and Properties

Nanda, A.K., Bhattacharjee, S., Balakrishnan, N.

Journal:

IEEE Transactions on Reliability

Year:

2010

Language:

english

File:

PDF, 263 KB

english, 2010

6

Higher Order Equilibrium Life Distributions

Ahmad, I.A., Mugdadi, A.R.

Journal:

IEEE Transactions on Reliability

Year:

2010

Language:

english

File:

PDF, 187 KB

english, 2010

7

Probabilistic Algebraic Analysis of Fault Trees With Priority Dynamic Gates and Repeated Events

Merle, G., Roussel, J.-M., Lesage, J.-J., Bobbio, A.

Journal:

IEEE Transactions on Reliability

Year:

2010

Language:

english

File:

PDF, 250 KB

english, 2010

8

Reliability of Separate Minimal Paths Under Both Time and Budget Constraints

Yi-Kuei Lin

Journal:

IEEE Transactions on Reliability

Year:

2010

Language:

english

File:

PDF, 298 KB

english, 2010

9

A New Reliability Prediction Model in Manufacturing Systems

Guo-Dong Li, Masuda, S., Yamaguchi, D., Nagai, M.

Journal:

IEEE Transactions on Reliability

Year:

2010

Language:

english

File:

PDF, 267 KB

english, 2010

10

A Particle Swarm Optimization Approach Based on Monte Carlo Simulation for Solving the Complex Network Reliability Problem

Wei-Chang Yeh, Yi-Cheng Lin, Yuk Ying Chung, Mingchang Chih

Journal:

IEEE Transactions on Reliability

Year:

2010

Language:

english

File:

PDF, 1.27 MB

english, 2010

11

A New Efficient Algorithm for Generating All Minimal Tie-Sets Connecting Selected Nodes in a Mesh-Structured Network

Malinowski, J.

Journal:

IEEE Transactions on Reliability

Year:

2010

Language:

english

File:

PDF, 566 KB

english, 2010

12

A Practical Application of Quantitative Accelerated Life Testing in Power Systems Engineering

Turner, M.D.

Journal:

IEEE Transactions on Reliability

Year:

2010

Language:

english

File:

PDF, 224 KB

english, 2010

13

Effect of Intrusion Detection on Reliability of Mission-Oriented Mobile Group Systems in Mobile Ad Hoc Networks

Jin-Hee Cho, Ing-Ray Chen, Phu-Gui Feng

Journal:

IEEE Transactions on Reliability

Year:

2010

Language:

english

File:

PDF, 645 KB

english, 2010

14

Accelerated Life Test Plans for Repairable Systems With Multiple Independent Risks

Xiao Liu, Long-Ching Tang

Journal:

IEEE Transactions on Reliability

Year:

2010

Language:

english

File:

PDF, 763 KB

english, 2010

15

A Genetic Programming Approach for Software Reliability Modeling

Costa, E.O., Pozo, A., Vergilio, S.R.

Journal:

IEEE Transactions on Reliability

Year:

2010

Language:

english

File:

PDF, 348 KB

english, 2010

16

Direct Prediction Methods on Lifetime Distribution of Organic Light-Emitting Diodes From Accelerated Degradation Tests

Jong In Park, Suk Joo Bae

Journal:

IEEE Transactions on Reliability

Year:

2010

Language:

english

File:

PDF, 799 KB

english, 2010

17

Spare Routing Reliability for a Stochastic Flow Network Through Two Minimal Paths Under Budget Constraint

Yi-Kuei Lin

Journal:

IEEE Transactions on Reliability

Year:

2010

Language:

english

File:

PDF, 308 KB

english, 2010

18

Progressive-Stress Accelerated Degradation Test for Highly-Reliable Products

Chien-Yu Peng, Sheng-Tsaing Tseng

Journal:

IEEE Transactions on Reliability

Year:

2010

Language:

english

File:

PDF, 231 KB

english, 2010

19

Nonparametric Estimation of Decreasing Mean Residual Life With Type II Censored Data

Yan Shen, Min Xie, Loon Ching Tang

Journal:

IEEE Transactions on Reliability

Year:

2010

Language:

english

File:

PDF, 303 KB

english, 2010

20

Assessing 2-Dimensional Nanocomponent's Limiting Reliability

Ebrahimi, N.

Journal:

IEEE Transactions on Reliability

Year:

2010

Language:

english

File:

PDF, 180 KB

english, 2010

21

Conditional Lifetimes of Consecutive -Out-of- Systems

Eryilmaz, S.

Journal:

IEEE Transactions on Reliability

Year:

2010

Language:

english

File:

PDF, 152 KB

english, 2010

22

Bayesian Analysis of Hazard Rate, Change Point, and Cost-Optimal Burn-In Time for Electronic Devices

Tao Yuan, Yue Kuo

Journal:

IEEE Transactions on Reliability

Year:

2010

Language:

english

File:

PDF, 309 KB

english, 2010

23

Linear and Nonlinear Preventive Maintenance Models

Shaomin Wu, Zuo, M.J.

Journal:

IEEE Transactions on Reliability

Year:

2010

Language:

english

File:

PDF, 178 KB

english, 2010

24

A New Start-Up Demonstration Test

Gera, A.E.

Journal:

IEEE Transactions on Reliability

Year:

2010

Language:

english

File:

PDF, 208 KB

english, 2010

25

Availability Analysis of an Intrusion Tolerant Distributed Server System With Preventive Maintenance

Uemura, T., Dohi, T., Kaio, N.

Journal:

IEEE Transactions on Reliability

Year:

2010

Language:

english

File:

PDF, 536 KB

english, 2010

26

Useful Lifetime Prediction of Rubber Components Using Accelerated Testing

Chang Su Woo, Sung Seen Choi, Seong Beom Lee, Hyun Sub Kim

Journal:

IEEE Transactions on Reliability

Year:

2010

Language:

english

File:

PDF, 933 KB

english, 2010

27

Modeling Link Events in High Reliability Networks With Support Vector Machines

Feijoo, J., Rojo-Alvarez, J.L., Sueiro, J.C., Conde-Pardo, P., Mata-Vigil-Escalera, J.L.

Journal:

IEEE Transactions on Reliability

Year:

2010

Language:

english

File:

PDF, 1.01 MB

english, 2010

28