IEEE Transactions on Reliability

1

A Modified Universal Generating Function Algorithm for the Acyclic Binary-State Network Reliability

Wei-Chang Yeh,

Journal:

Year:

2012

Language:

english

File:

PDF, 1.50 MB

english, 2012

2

Weighted Estimation of Component Reliability in Series Systems

Gamiz, M. L.

Journal:

IEEE Transactions on Reliability

Year:

2012

Language:

english

File:

PDF, 1.27 MB

english, 2012

3

A Parametric Uncertainty Analysis Method for Markov Reliability and Reward Models

Dhople, S. V., Dominguez-Garcia, A. D.

Journal:

IEEE Transactions on Reliability

Year:

2012

Language:

english

File:

PDF, 4.03 MB

english, 2012

4

The Extended Cumulative Exposure Model (ECEM) and Its Application to Oil Insulation Tests

Hirose, H., Sakumura, T.

Journal:

IEEE Transactions on Reliability

Year:

2012

Language:

english

File:

PDF, 1.43 MB

english, 2012

5

Two Dimensional Multi-Release Software Reliability Modeling and Optimal Release Planning

Kapur, P. K., Pham, H., Aggarwal, A. G., Kaur, G.

Journal:

IEEE Transactions on Reliability

Year:

2012

Language:

english

File:

PDF, 2.12 MB

english, 2012

6

Reliability Evaluation for Single Event Transients on Digital Circuits

Baojun Liu,, Li Cai,

Journal:

IEEE Transactions on Reliability

Year:

2012

Language:

english

File:

PDF, 860 KB

english, 2012

7

Linear $m$-Consecutive-$k$, $l$-Out-of-$n$: F System

Eryilmaz, S., Mahmoud, B.

Journal:

IEEE Transactions on Reliability

Year:

2012

Language:

english

File:

PDF, 1.04 MB

english, 2012

8

Accelerated Life Tests of a Series System With Masked Interval Data Under Exponential Lifetime Distributions

Tsai-Hung Fan,, Tsung-Ming Hsu,

Journal:

IEEE Transactions on Reliability

Year:

2012

Language:

english

File:

PDF, 2.96 MB

english, 2012

9

Multiple-Stress Model for One-Shot Device Testing Data Under Exponential Distribution

Balakrishnan, N., Man Ho Ling,

Journal:

IEEE Transactions on Reliability

Year:

2012

Language:

english

File:

PDF, 2.02 MB

english, 2012

10

A New Warranty Policy With Failure Times and Warranty Servicing Times

Minjae Park,, Hoang Pham,

Journal:

IEEE Transactions on Reliability

Year:

2012

Language:

english

File:

PDF, 1.79 MB

english, 2012

11

Optimum Reliability Sizing for Complementary Metal Oxide Semiconductor Gates

Ibrahim, W., Beiu, V., Beg, A.

Journal:

IEEE Transactions on Reliability

Year:

2012

Language:

english

File:

PDF, 2.32 MB

english, 2012

12

Self-Tuning Routine Alarm Analysis of Vibration Signals in Steam Turbine Generators

Costello, J. J. A., West, G. M., McArthur, S. D. J., Campbell, G.

Journal:

IEEE Transactions on Reliability

Year:

2012

Language:

english

File:

PDF, 1.59 MB

english, 2012

13

Quantifying the Impact of Correlated Failures on Stochastic Flow Network Reliability

Yi-Kuei Lin,, Ping-Chen Chang,, Fiondella, L.

Journal:

IEEE Transactions on Reliability

Year:

2012

Language:

english

File:

PDF, 1.24 MB

english, 2012

14

Estimating Mean Residual Life for a Case Study of Rail Wagon Bearings

Ghasemi, A., Hodkiewicz, M. R.

Journal:

IEEE Transactions on Reliability

Year:

2012

Language:

english

File:

PDF, 1.46 MB

english, 2012

15

A Block Replacement Policy for Systems Subject to Non-homogeneous Pure Birth Shocks

Shey-Huei Sheu,, Yen-Luan Chen,, Chin-Chih Chang,, Zhang, Z. G.

Journal:

IEEE Transactions on Reliability

Year:

2012

Language:

english

File:

PDF, 2.01 MB

english, 2012

16

Intermittent Failure Dynamics Characterization

Correcher, A., Garcia, E., Morant, F., Quiles, E., Rodriguez, L.

Journal:

IEEE Transactions on Reliability

Year:

2012

Language:

english

File:

PDF, 1.73 MB

english, 2012

17

Residual Lifetime of Consecutive $k$-out-of-$n$ Systems Under Double Monitoring

Eryilmaz, S., Bayramoglu, K.

Journal:

IEEE Transactions on Reliability

Year:

2012

Language:

english

File:

PDF, 1.52 MB

english, 2012

18

Relations and Generalizations of Importance Measures in Reliability

Way Kuo,, Xiaoyan Zhu,

Journal:

IEEE Transactions on Reliability

Year:

2012

Language:

english

File:

PDF, 2.59 MB

english, 2012

19

Inference From Lumen Degradation Data Under Wiener Diffusion Process

Tzong-Ru Tsai,, Chin-Wei Lin,, Yi-Ling Sung,, Pei-Ting Chou,, Chiu-Ling Chen,, Yuhlong Lio,

Journal:

IEEE Transactions on Reliability

Year:

2012

Language:

english

File:

PDF, 1.57 MB

english, 2012

20

Performance Measures for Systems With Markovian Missions and Aging

Cekyay, B., Ozekici, S.

Journal:

IEEE Transactions on Reliability

Year:

2012

Language:

english

File:

PDF, 1.92 MB

english, 2012

21

Kernelized Proportional Intensity Model for Repairable Systems Considering Piecewise Operating Conditions

Yuan Fuqing,, Kumar, U.

Journal:

IEEE Transactions on Reliability

Year:

2012

Language:

english

File:

PDF, 919 KB

english, 2012

22

Errata to “Reliability Analysis of $k$-out-of-$n$ Systems With Single Cold Standby Using Pearson Distributions” [Jun 12 526-532]

van Gemund, Arjan J. C., Reijns, Gerard L.

Journal:

IEEE Transactions on Reliability

Year:

2012

Language:

english

File:

PDF, 252 KB

english, 2012

23

Security Analysis of Compromised-Neighbor-Tolerant Networks Using Stochastics

Xiaohu Li,, Linxiong Li,

Journal:

IEEE Transactions on Reliability

Year:

2012

Language:

english

File:

PDF, 1.68 MB

english, 2012

24