Volume 64; Issue 1

IEEE Transactions on Reliability

Volume 64; Issue 1

1

Accelerated Degradation Analysis for the Quality of a System Based on the Gamma Process

Ling, Man Ho, Tsui, Kwok Leung, Balakrishnan, Narayanaswamy

Journal:

IEEE Transactions on Reliability

Year:

2015

Language:

english

File:

PDF, 2.27 MB

english, 2015

2

A Test for Convex Dominance With Respect to the Exponential Class Based on an $L^1$ Distance

Baillo, Amparo, Carcamo, Javier, Nieto, Sofia

Journal:

IEEE Transactions on Reliability

Year:

2015

Language:

english

File:

PDF, 2.32 MB

english, 2015

3

An Automated Test Generation Technique for Software Quality Assurance

Xu, Dianxiang, Xu, Weifeng, Kent, Michael, Thomas, Lijo, Wang, Linzhang

Journal:

IEEE Transactions on Reliability

Year:

2015

Language:

english

File:

PDF, 2.75 MB

english, 2015

4

A Hierarchical Bayesian Degradation Model for Heterogeneous Data

Yuan, Tao, Ji, Yizhen

Journal:

IEEE Transactions on Reliability

Year:

2015

Language:

english

File:

PDF, 1.63 MB

english, 2015

5

Advances on the Stress Interaction Model

Lewitschnig, Horst

Journal:

IEEE Transactions on Reliability

Year:

2015

Language:

english

File:

PDF, 1.15 MB

english, 2015

6

Ameliorating Thermally Accelerated Aging With State-Based Application of Fault-Tolerance in Cyber-Physical Computers

Krishna, C. Mani

Journal:

IEEE Transactions on Reliability

Year:

2015

Language:

english

File:

PDF, 1.46 MB

english, 2015

7

Characterizing the Impact of Intermittent Hardware Faults on Programs

Rashid, Layali, Pattabiraman, Karthik, Gopalakrishnan, Sathish

Journal:

IEEE Transactions on Reliability

Year:

2015

Language:

english

File:

PDF, 1020 KB

english, 2015

8

Test Generation for Embedded Executables via Concolic Execution in a Real Environment

Chen, Ting, Zhang, Xiao-Song, Ji, Xiao-Li, Zhu, Cong, Bai, Yang, Wu, Yue

Journal:

IEEE Transactions on Reliability

Year:

2015

Language:

english

File:

PDF, 737 KB

english, 2015

9

A Physics-Based Modeling Approach for Performance Monitoring in Gas Turbine Engines

Hanachi, Houman, Liu, Jie, Banerjee, Avisekh, Chen, Ying, Koul, Ashok

Journal:

IEEE Transactions on Reliability

Year:

2015

Language:

english

File:

PDF, 1.28 MB

english, 2015

10

Bayesian Reliability and Performance Assessment for Multi-State Systems

Liu, Yu, Lin, Peng, Li, Yan-Feng, Huang, Hong-Zhong

Journal:

IEEE Transactions on Reliability

Year:

2015

Language:

english

File:

PDF, 3.06 MB

english, 2015

11

Multi-Level Decision-Making for The Predictive Maintenance of $k$ -Out-of-$n$ :F Deteriorating Systems

Huynh, Khac Tuan, Barros, Anne, Berenguer, Christophe

Journal:

IEEE Transactions on Reliability

Year:

2015

Language:

english

File:

PDF, 5.42 MB

english, 2015

12

An Imperfect Fault Coverage Model With Coverage of Irrelevant Components

Xiang, Jianwen, Machida, Fumio, Tadano, Kumiko, Maeno, Yoshiharu

Journal:

IEEE Transactions on Reliability

Year:

2015

Language:

english

File:

PDF, 1.58 MB

english, 2015

13

Reliability Evaluation of Large-Scale Systems With Identical Units

Ko, Young Myoung, Byon, Eunshin

Journal:

IEEE Transactions on Reliability

Year:

2015

Language:

english

File:

PDF, 2.47 MB

english, 2015

14

Reliability Inference on Composite Dynamic Systems Based on Burr Type-XII Distribution

Balakrishnan, Narayanaswamy, Jiang, Nan, Tsai, Tzong-Ru, Lio, Y. L., Chen, Ding-Geng

Journal:

IEEE Transactions on Reliability

Year:

2015

Language:

english

File:

PDF, 2.21 MB

english, 2015

15

Bayesian Analysis of a Simple Step-Stress Model Under Weibull Lifetimes

Ganguly, A., Kundu, D., Mitra, S.

Journal:

IEEE Transactions on Reliability

Year:

2015

Language:

english

File:

PDF, 3.70 MB

english, 2015

16

Beta Hazard Rate Distribution and Applications

Lai, Chin-Diew, Jones, Geoff

Journal:

IEEE Transactions on Reliability

Year:

2015

Language:

english

File:

PDF, 1.05 MB

english, 2015

17

Reliability of Non-Coherent Warm Standby Systems With Reworking

Levitin, Gregory, Xing, Liudong, Dai, Yuanshun

Journal:

IEEE Transactions on Reliability

Year:

2015

Language:

english

File:

PDF, 1.41 MB

english, 2015

18

Stochastic Comparisons of Series and Parallel Systems With Generalized Exponential Components

Balakrishnan, Narayanaswamy, Haidari, Abedin, Masoumifard, Khaled

Journal:

IEEE Transactions on Reliability

Year:

2015

Language:

english

File:

PDF, 5.46 MB

english, 2015

19

Reliability and Mission Cost of 1-Out-of-$N$:G Systems With State-Dependent Standby Mode Transfers

Levitin, Gregory, Xing, Liudong, Dai, Yuanshun

Journal:

IEEE Transactions on Reliability

Year:

2015

Language:

english

File:

PDF, 1.94 MB

english, 2015

20

The Reliability of Coherent Systems Subjected to Marshall–Olkin Type Shocks

Bayramoglu, Ismihan, Ozkut, Murat

Journal:

IEEE Transactions on Reliability

Year:

2015

Language:

english

File:

PDF, 2.30 MB

english, 2015

21

A Learning-to-Rank Approach to Software Defect Prediction

Yang, Xiaoxing, Tang, Ke, Yao, Xin

Journal:

IEEE Transactions on Reliability

Year:

2015

Language:

english

File:

PDF, 1.11 MB

english, 2015

22

Identifying Recurring Faulty Functions in Field Traces of a Large Industrial Software System

Murtaza, Syed Shariyar, Madhavji, Nazim H., Gittens, Mechelle, Hamou-Lhadj, Abdelwahab

Journal:

IEEE Transactions on Reliability

Year:

2015

Language:

english

File:

PDF, 961 KB

english, 2015

23

Integrating Random Shocks Into Multi-State Physics Models of Degradation Processes for Component Reliability Assessment

Lin, Yan-Hui, Li, Yan-Fu, Zio, Enrico

Journal:

IEEE Transactions on Reliability

Year:

2015

Language:

english

File:

PDF, 2.07 MB

english, 2015

24

Improving ZigBee Device Network Authentication Using Ensemble Decision Tree Classifiers With Radio Frequency Distinct Native Attribute Fingerprinting

Patel, Hiren J., Temple, Michael A., Baldwin, Rusty O.

Journal:

IEEE Transactions on Reliability

Year:

2015

Language:

english

File:

PDF, 1.75 MB

english, 2015

25

Inference for a Step-Stress Model With Competing Risks for Failure From the Generalized Exponential Distribution Under Type-I Censoring

Han, David, Kundu, Debasis

Journal:

IEEE Transactions on Reliability

Year:

2015

Language:

english

File:

PDF, 2.37 MB

english, 2015

26

An Architecture-Based Multi-Objective Optimization Approach to Testing Resource Allocation

Yang, Bo, Hu, Yanmei, Huang, Chin-Yu

Journal:

IEEE Transactions on Reliability

Year:

2015

Language:

english

File:

PDF, 2.24 MB

english, 2015

27

A Study of Optimal Component Order in a General 1-Out-of-$n$ Warm Standby System

Zhai, Qingqing, Yang, Jun, Peng, Rui, Zhao, Yu

Journal:

IEEE Transactions on Reliability

Year:

2015

Language:

english

File:

PDF, 2.22 MB

english, 2015

28

Exploring Data-Level Error Tolerance in High-Performance Solid-State Drives

Xu, Xin, Huang, H. Howie

Journal:

IEEE Transactions on Reliability

Year:

2015

Language:

english

File:

PDF, 1.97 MB

english, 2015

29

A Non-Probabilistic Metric Derived From Condition Information for Operational Reliability Assessment of Aero-Engines

Chuang Sun,, Zhengjia He,, Hongrui Cao,, Zhousuo Zhang,, Xuefeng Chen,, Ming Jian Zuo,

Journal:

IEEE Transactions on Reliability

Year:

2015

Language:

english

File:

PDF, 1.80 MB

english, 2015

30

RUL Prediction for Individual Units Based on Condition Monitoring Signals With a Change Point

Son, Junbo, Zhang, Yilu, Sankavaram, Chaitanya, Zhou, Shiyu

Journal:

IEEE Transactions on Reliability

Year:

2015

Language:

english

File:

PDF, 2.16 MB

english, 2015

31

A Bayesian Model for Complex System Reliability Growth Under Arbitrary Corrective Actions

Wayne, Martin, Modarres, Mohammad

Journal:

IEEE Transactions on Reliability

Year:

2015

Language:

english

File:

PDF, 1.68 MB

english, 2015

32

Conditional Diagnosability of $(n,k)$-Star Networks Under the Comparison Diagnosis Model

Chang, Nai-Wen, Deng, Wei-Hao, Hsieh, Sun-Yuan

Journal:

IEEE Transactions on Reliability

Year:

2015

Language:

english

File:

PDF, 3.56 MB

english, 2015

33

Topology Design with Minimal Cost Subject to Network Reliability Constraint

Elshqeirat, Basima, Soh, Sieteng, Rai, Suresh, Lazarescu, Mihai

Journal:

IEEE Transactions on Reliability

Year:

2015

Language:

english

File:

PDF, 3.02 MB

english, 2015

34

Hilbert Functions in Design for Reliability

Saenz-de-Cabezon, Eduardo, Wynn, Henry P.

Journal:

IEEE Transactions on Reliability

Year:

2015

Language:

english

File:

PDF, 1.71 MB

english, 2015

35

Birnbaum Importance for Linear Consecutive-$k$ -out-of-$n$ Systems With Sparse $d$

Shen, Jingyuan, Cui, Lirong, Du, Shijia

Journal:

IEEE Transactions on Reliability

Year:

2015

Language:

english

File:

PDF, 4.46 MB

english, 2015

36

IEEE Transactions on Reliability publication information

Journal:

IEEE Transactions on Reliability

Year:

2015

Language:

english

File:

PDF, 133 KB

english, 2015

37

Inference for a Failure Counting Process Partially Observed

Guerineau, Lise, Gouno, Evans

Journal:

IEEE Transactions on Reliability

Year:

2015

Language:

english

File:

PDF, 1.66 MB

english, 2015

38

Risk and Reliability Are Part of Our Life

Journal:

IEEE Transactions on Reliability

Year:

2015

Language:

english

File:

PDF, 124 KB

english, 2015

39

$m$-Consecutive-$k$, $l$-Out-of-$n$ Systems

Cui, Lirong, Lin, Cong, Du, Shijia

Journal:

IEEE Transactions on Reliability

Year:

2015

Language:

english

File:

PDF, 1.62 MB

english, 2015

40

Statistical Inference of a Two-Component Series System With Correlated Log-Normal Lifetime Distribution Under Multiple Type-I Censoring

Fan, Tsai-Hung, Hsu, Tsung-Ming

Journal:

IEEE Transactions on Reliability

Year:

2015

Language:

english

File:

PDF, 1.77 MB

english, 2015

41

IEEE Transactions on Reliability information for authors

Journal:

IEEE Transactions on Reliability

Year:

2015

Language:

english

File:

PDF, 166 KB

english, 2015

42

Effect of Failure Propagation on Cold vs. Hot Standby Tradeoff in Heterogeneous 1-Out-of-$N$:G Systems

Levitin, Gregory, Xing, Liudong, Ben-Haim, Hanoch, Dai, Yuanshun

Journal:

IEEE Transactions on Reliability

Year:

2015

Language:

english

File:

PDF, 1.51 MB

english, 2015

43

A Novel Massively Parallel Testing Method Using Multi-Root for High Reliability

Kim, Haksong, Lee, Yong, Kang, Sungho

Journal:

IEEE Transactions on Reliability

Year:

2015

Language:

english

File:

PDF, 1.70 MB

english, 2015

44

Analysis of Destructive Degradation Tests for a Product With Random Degradation Initiation Time

Zhang, Ye, Liao, Haitao

Journal:

IEEE Transactions on Reliability

Year:

2015

Language:

english

File:

PDF, 1.98 MB

english, 2015

45

IEEE Transactions on Reliability institutional listings

Journal:

IEEE Transactions on Reliability

Year:

2015

File:

PDF, 1.25 MB

2015

46

IEEE Transactions on Reliability institutional listings

Journal:

IEEE Transactions on Reliability

Year:

2015

File:

PDF, 791 KB

2015

47

Assessing Risk of a Serious Failure Mode Based on Limited Field Data

Xu, Zhibing, Hong, Yili, Meeker, William Q.

Journal:

IEEE Transactions on Reliability

Year:

2015

Language:

english

File:

PDF, 1.52 MB

english, 2015

48

Table of contents

Journal:

IEEE Transactions on Reliability

Year:

2015

Language:

english

File:

PDF, 150 KB

english, 2015

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