Volume 26; Issue 1-2

Integration, the VLSI Journal

Volume 26; Issue 1-2
1

Testing with decision diagrams

Bernd Becker
Journal:
Integration, the VLSI Journal
Year:
1998
Language:
english
File:
PDF, 280 KB
english, 1998
2

Delay fault models for VLSI circuits

Irith Pomeranz, Sudhakar M Reddy
Journal:
Integration, the VLSI Journal
Year:
1998
Language:
english
File:
PDF, 218 KB
english, 1998
3

BIST for systems-on-a-chip

Hans-Joachim Wunderlich
Journal:
Integration, the VLSI Journal
Year:
1998
Language:
english
File:
PDF, 740 KB
english, 1998
4

High-level test synthesis: a survey

Indradeep Ghosh, Niraj K Jha
Journal:
Integration, the VLSI Journal
Year:
1998
Language:
english
File:
PDF, 310 KB
english, 1998
5

FTROM: A Silicon Compiler for Fault-tolerant ROMs

Anurag Gupta, Kanad Chakraborty, Pinaki Mazumder
Journal:
Integration, the VLSI Journal
Year:
1998
Language:
english
File:
PDF, 829 KB
english, 1998
6

Design of mixed-signal systems for testability

Vishwani D Agrawal
Journal:
Integration, the VLSI Journal
Year:
1998
Language:
english
File:
PDF, 131 KB
english, 1998
7

On-line testing for VLSI: state of the art and trends

Michael Nicolaidis
Journal:
Integration, the VLSI Journal
Year:
1998
Language:
english
File:
PDF, 127 KB
english, 1998
8

A new approach in feature interaction testing

Masahide Nakamura, Tohru Kikuno
Journal:
Integration, the VLSI Journal
Year:
1998
Language:
english
File:
PDF, 252 KB
english, 1998
9

Editorial

Journal:
Integration, the VLSI Journal
Year:
1998
Language:
english
File:
PDF, 50 KB
english, 1998
10

Sequential test generators: past, present and future

Yong Chang Kim, Kewal K. Saluja
Journal:
Integration, the VLSI Journal
Year:
1998
Language:
english
File:
PDF, 165 KB
english, 1998
11

An approach to test synthesis from higher level

Michiko Inoue, Hideo Fujiwara
Journal:
Integration, the VLSI Journal
Year:
1998
Language:
english
File:
PDF, 225 KB
english, 1998
12

Mixed-signal on-chip timing measurements

Mani Soma
Journal:
Integration, the VLSI Journal
Year:
1998
Language:
english
File:
PDF, 204 KB
english, 1998
13

IDDQ testing: state of the art and future trends

A Ferré, E Isern, J Rius, R Rodrı́guez-Montañés, J Figueras
Journal:
Integration, the VLSI Journal
Year:
1998
Language:
english
File:
PDF, 770 KB
english, 1998