Volume 45; Issue 1

Integration, the VLSI Journal

Volume 45; Issue 1
2

A new scheme of test data compression based on equal-run-length coding (ERLC)

Year:
2012
Language:
english
File:
PDF, 341 KB
english, 2012
5

Towards accelerating irregular EDA applications with GPUs

Year:
2012
Language:
english
File:
PDF, 1.50 MB
english, 2012