58

Robust Materials and Processes: Key to Reliability

Year:
1990
Language:
english
File:
PDF, 6.29 MB
english, 1990
60

Hole-Trap Depletion-Layer Formation in CdS

Year:
1969
Language:
english
File:
PDF, 1.08 MB
english, 1969
61

C-29

Year:
2014
Language:
english
File:
PDF, 35 KB
english, 2014
62

C-14

Year:
2014
Language:
english
File:
PDF, 38 KB
english, 2014
63

Quantum Efficiency and Photoconductivity in Dye-Sensitized ZnO-Resin Binder Layers

Year:
1970
Language:
english
File:
PDF, 857 KB
english, 1970
64

Electrical conduction mechanism in semi-insulating polycrystalline silicon films

Year:
1987
Language:
english
File:
PDF, 1.24 MB
english, 1987
66

Analytic Solution of Range-Controlled Bulk-Polarization Equation

Year:
1968
Language:
english
File:
PDF, 402 KB
english, 1968
67

Correction to "Electrophotography - A review"

Year:
1972
Language:
english
File:
PDF, 98 KB
english, 1972
68

Uses of Corona Discharges in the Semiconductor Industry

Year:
1987
Language:
english
File:
PDF, 675 KB
english, 1987
70

Fitting of data to a Frenkel-effect model of conduction in insulators

Year:
1985
Language:
english
File:
PDF, 365 KB
english, 1985
82

The Kuwait Environment and Its Effects on Electronic Materials and Components

Year:
1992
Language:
english
File:
PDF, 1.66 MB
english, 1992
84

Evaluation of High Voltage IC's by Corona Charging

Year:
1988
Language:
english
File:
PDF, 898 KB
english, 1988
92

Nondestructive, Reverse Decoration of Defects in IC Passivation Overcoats

Year:
1977
Language:
english
File:
PDF, 2.49 MB
english, 1977
95

Bulk and Surface Conduction in CVD SiO[sub 2] and PSG Passivation Layers

Year:
1976
Language:
english
File:
PDF, 648 KB
english, 1976
100

Corrosion of Electronic Materials and Devices

Year:
1986
Language:
english
File:
PDF, 1.51 MB
english, 1986