57

Breakdown and defect generation in ultrathin gate oxide

Year:
1996
Language:
english
File:
PDF, 333 KB
english, 1996
77

Wear-out of ultra-thin gate oxides during high-field electron tunnelling

Year:
1995
Language:
english
File:
PDF, 413 KB
english, 1995
81

Der abendländische Wert der Mäßigung

Year:
2015
Language:
german
File:
PDF, 607 KB
german, 2015
85

Effect of Cl in Gate Oxidation

Year:
1997
Language:
english
File:
PDF, 874 KB
english, 1997