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1

Imaging and Nanofabrication With the Helium Ion Microscope of the Van Leeuwenhoek Laboratory in Delft

Paul F. A. Alkemade, Emma M. Koster, Emile van Veldhoven, Diederik J. Maas

Journal:

Year:

2012

Language:

english

File:

PDF, 18.76 MB

english, 2012

2

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California (Sunday 21 February 2010)] Metrology, Inspection, and Process Control for Microlithography XXIV - Nanofabrication with a helium ion microscope

Maas, Diederik, van Veldhoven, Emile, Chen, Ping, Sidorkin, Vadim, Salemink, Huub, van der Drift, Emile .., Alkemade, Paul, Raymond, Christopher J.

Year:

2010

Language:

english

File:

PDF, 3.25 MB

english, 2010

3

Application of the Helium Ion Microscope as a Sculpting Tool for Nanosamples

Rudneva, Maria, van Veldhoven, Emile, Malladi, Sairam, Maas, Diederik, Zandbergen, Henny W.

Journal:

MRS Proceedings

Year:

2012

Language:

english

File:

PDF, 6.66 MB

english, 2012

4

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, United States (Sunday 23 February 2014)] Extreme Ultraviolet (EUV) Lithography V - Evaluation of EUV resist performance below 20nm CD using helium ion lithography

Wood, Obert R., Panning, Eric M., Maas, Diederik, van Veldhoven, Emile, van Langen–Suurling, Anja, Alkemade, Paul F.A., Wuister, Sander, Hoefnagels, Rik, Verspaget, Coen, Meessen, Jeroen, Fliervoet, T

Year:

2014

Language:

english

File:

PDF, 5.22 MB

english, 2014

5

Management of mild traumatic brain injury at the emergency department and hospital admission in Europe: A survey of 71 neurotrauma centers participating in the CENTER-TBI study

Foks, Kelly A., Cnossen, Maryse C., Dippel, Diederik W.J., Maas, Andrew, Menon, David, van der Naalt, Joukje, Steyerberg, Ewout W, Lingsma, Hester, Polinder, Suzanne

Journal:

Journal of Neurotrauma

Year:

2017

Language:

english

File:

PDF, 1.88 MB

english, 2017

6

High-Speed Spatial Atomic-Layer Deposition of Aluminum Oxide Layers for Solar Cell Passivation

Paul Poodt, Adriaan Lankhorst, Fred Roozeboom, Karel Spee, Diederik Maas, Ad Vermeer

Journal:

Advanced Materials

Year:

2010

Language:

english

File:

PDF, 433 KB

english, 2010

7

Changes in brain metabolism during hyperammonemia and acute liver failure: Results of a comparative 1H-NMR spectroscopy and biochemical investigation

Diederik K. Bosman, Nicolaas E. P. Deutz, Albert A. De Graaf, Rene W. N. Vd Hulst, Hans M. H. Van Eijk, Wim M. M. J. Bovée, Martinus A. W. Maas, George G. A. Jörning, Robert A. F. M. Chamuleau

Journal:

Year:

1990

Language:

english

File:

PDF, 970 KB

english, 1990

8

Neocortical Dialysate Monoamines of Rats After Acute, Subacute, and Chronic Liver Shunt

Peter B. F. Bergqvist, Birgit A. P. M. Vogels, Diederik K. Bosman, Martinus A. W. Maas, Stephan Hjorth, Robert A. F. M. Chamuleau, Finn Bengtsson

Journal:

Journal of Neurochemistry

Year:

1995

Language:

english

File:

PDF, 762 KB

english, 1995

9

Effectiveness and cost-effectiveness of a multidisciplinary intervention programme to prevent new falls and functional decline among elderly persons at risk: design of a replicated randomised controlled trial [ISRCTN64716113]

Marike RC Hendriks, Jolanda CM van Haastregt, Joseph PM Diederiks, Silvia MAA Evers, Harry FJM Crebolder, ThM Jacques van Eijk

Journal:

BMC Public Health

Year:

2005

Language:

english

File:

PDF, 272 KB

english, 2005

10

Three Different Hepatocyte Transplantation Techniques for Enzyme Deficiency Disease and Acute Hepatic Failure

Anje A. te Velde, Diederik K. Bosman, Jeroen Oldenburg, Mieke Sala, Martinus A.W. Maas, Robert A.F.M. Chamuleau

Journal:

Artificial Organs

Year:

1992

Language:

english

File:

PDF, 471 KB

english, 1992

11

Metabolic activity of microcarrier attached liver cells after intraperitoneal transplantation during severe liver insufficiency in the rat

Bosman, Diederik K., de Haan, Jan G., Smit, Jack, Jorning, George G.A., Maas, Martinus A.W., Chamuleau, Robert A.F.M.

Journal:

Journal of Hepatology

Year:

1989

Language:

english

File:

PDF, 614 KB

english, 1989

12

Sub-10-nm nanolithography with a scanning helium beam

Sidorkin, Vadim, van Veldhoven, Emile, van der Drift, Emile, Alkemade, Paul, Salemink, Huub, Maas, Diederik

Journal:

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures

Year:

2009

Language:

english

File:

PDF, 487 KB

english, 2009

13

Model for nanopillar growth by focused helium ion-beam-induced deposition

Alkemade, Paul F. A., Chen, Ping, van Veldhoven, Emile, Maas, Diederik

Journal:

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures

Year:

2010

Language:

english

File:

PDF, 509 KB

english, 2010

14

High-resolution direct-write patterning using focused ion beams

Ocola, Leonidas E., Rue, Chad, Maas, Diederik

Journal:

Year:

2014

Language:

english

File:

PDF, 864 KB

english, 2014

15

Nano-engineering with a focused helium ion beam

Maas, Diederik J., van der Drift, Emile W., Veldhoven, Emile van, Meessen, Jeroen, Rudneva, Maria, Alkemade, Paul F. A.

Journal:

MRS Proceedings

Year:

2011

Language:

english

File:

PDF, 720 KB

english, 2011

16

ECS Transactions [ECS 218th ECS Meeting - Las Vegas, NV (October 10 - October 15, 2010)] - (Invited) Ultrafast Atomic Layer Deposition of Alumina Layers for Solar Cell Passivation

Poodt, Paul, Lankhorst, Adriaan, Roozeboom, Fred, Tiba, Veronica, Spee, Karel, Maas, Diederik, Vermeer, Ad

Year:

2010

Language:

english

File:

PDF, 279 KB

english, 2010

17

Novel nanosample preparation with a helium ion microscope

Rudneva, Maria, van Veldhoven, Emile, Malladi, Sairam K., Maas, Diederik, Zandbergen, Henny W.

Journal:

Journal of Materials Research

Year:

2013

Language:

english

File:

PDF, 599 KB

english, 2013

18

Beam induced deposition of platinum using a helium ion microscope

Sanford, Colin A., Stern, Lewis, Barriss, Louise, Farkas, Lou, DiManna, Mark, Mello, Russ, Maas, Diederik J., Alkemade, Paul F. A.

Journal:

Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures

Year:

2009

Language:

english

File:

PDF, 1.27 MB

english, 2009

19

Nanopillar growth by focused helium ion-beam-induced deposition

Chen, Ping, Veldhoven, Emile van, Sanford, Colin A, Salemink, Huub W M, Maas, Diederik J, Smith, Daryl A, Rack, Philip D, Alkemade, Paul F A

Journal:

Year:

2010

Language:

english

File:

PDF, 1.24 MB

english, 2010

20

SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - San Diego, CA (Sunday 29 July 2001)] Charged Particle Detection, Diagnostics, and Imaging - Electrostatic aberration correction in low-voltage SEM

Maas, Diederik J., Henstra, Sander, Krijn, Marcel, Mentink, Sjoerd, Delage, Olivier, Munro, Eric, Rouse, John A.

Year:

2001

Language:

english

File:

PDF, 750 KB

english, 2001

21

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, United States (Sunday 22 February 2015)] Advances in Patterning Materials and Processes XXXII - Impact of pixel-dose optimization on pattern fidelity for helium ion beam lithography on EUV resist

Wallow, Thomas I., Hohle, Christoph K., Kalhor, Nima, Mulckhuyse, Wouter, Alkemade, Paul, Maas, Diederik

Year:

2015

Language:

english

File:

PDF, 8.12 MB

english, 2015

22

SPIE Proceedings [SPIE SPIE Photomask Technology - Monterey, California, USA (Tuesday 11 September 2012)] Photomask Technology 2012 - Nanoparticle detection limits of TNO's Rapid Nano: modeling and experimental results

van der Walle, Peter, Abboud, Frank E., Faure, Thomas B., Kumar, Pragati, Ityaksov, Dmitry, Versulis, Richard, Maas, Diederik J., Kievit, Olaf, Janssen, Jochem, van der Donck, Jacques C. J.

Year:

2012

Language:

english

File:

PDF, 625 KB

english, 2012

23

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, United States (Sunday 21 February 2016)] Extreme Ultraviolet (EUV) Lithography VII - Toward a Carbon-contamination-tolerant EUV power sensor

Panning, Eric M., Goldberg, Kenneth A., van Veldhoven, Jacqueline, Huijser, Timo, Nieuwkoop, Evert, van Putten, Michel, Koster, Norbert, Maas, Diederik

Year:

2016

Language:

english

File:

PDF, 4.08 MB

english, 2016

24

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, USA (Sunday 24 February 2013)] Metrology, Inspection, and Process Control for Microlithography XXVII - Increased particle inspection sensitivity by reduction of background scatter variance

van der Walle, Peter, Kumar, Pragati, Ityaksov, Dmitry, Versluis, Richard, Maas, Diederik J., Kievit, Olaf, Janssen, Jochem, van der Donck, Jacques C. J., Starikov, Alexander, Cain, Jason P.

Year:

2013

Language:

english

File:

PDF, 644 KB

english, 2013

25

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California (Sunday 21 February 2010)] Extreme Ultraviolet (EUV) Lithography - Holographic method for detecting amplitude and phase-shift errors and features in EUV ML reticle blanks

La Fontaine, Bruno M., Nijkerk, David, Koster, Norbert, van Brug, Eddy, Maas, Diederik

Year:

2010

Language:

english

File:

PDF, 229 KB

english, 2010

26

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, USA (Sunday 23 February 2014)] Metrology, Inspection, and Process Control for Microlithography XXVIII - Real-time focus and overlay measurement by the use of fluorescent markers

Cain, Jason P., Sanchez, Martha I., Maas, Diederik, van Zwet, Erwin

Year:

2014

Language:

english

File:

PDF, 1.86 MB

english, 2014

27

The effects of benzodiazepine-receptor antagonists and partial inverse agonists on acute hepatic encephalopathy in the rat

Bosman, Diederik K., Van Den Buijs, Constantinus A.C.G., De Haan, Jan G., Maas, Martinus A.W., Chamuleau, Robert A.F.M.

Journal:

Gastroenterology

Year:

1991

Language:

english

File:

PDF, 1.06 MB

english, 1991

28

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, United States (Sunday 26 February 2017)] Metrology, Inspection, and Process Control for Microlithography XXXI - Lab- and field-test results of MFIG, the first real-time vacuum-contamination sensor

Sanchez, Martha I., Ukraintsev, Vladimir A., Maas, Diederik, Muilwijk, Pim, van Putten, Michel, de Graaf, Frank, Kievit, Olaf, Boerboom, Patrique, Koster, Norbert B.

Year:

2017

Language:

english

File:

PDF, 1.05 MB

english, 2017

29

Helium ion beam induced growth of hammerhead AFM probes

Nanda, Gaurav, van Veldhoven, Emile, Maas, Diederik, Sadeghian, Hamed, Alkemade, Paul F. A.

Journal:

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures

Year:

2015

Language:

english

File:

PDF, 2.44 MB

english, 2015

30

Fast resist-activation dosimetry for extreme ultra-violet lithography

Heo, Jinseok, Xu, Man, Maas, Diederik

Journal:

Year:

2017

Language:

english

File:

PDF, 3.34 MB

english, 2017

31

A Design-of-Experiments Approach to Characterizing Beam-Induced Deposition in the Helium Ion Microscope

Scipioni, Larry, Sanford, Colin, van Veldhoven, Emile, Maas, Diederik

Journal:

Microscopy Today

Year:

2011

Language:

english

File:

PDF, 1.89 MB

english, 2011

32

Prognosis in Moderate and Severe Traumatic Brain Injury: A Systematic Review of Contemporary Models and Validation Studies

Dijkland, Simone A., Foks, Kelly A., Polinder, Suzanne, Dippel, Diederik W.J., Maas, Andrew, Lingsma, Hester, Steyerberg, Ewout W

Journal:

Journal of Neurotrauma

Year:

2019

Language:

english

File:

PDF, 597 KB

english, 2019

33

Prognosis in Moderate and Severe Traumatic Brain Injury: A Systematic Review of Contemporary Models and Validation Studies

Dijkland, Simone A., Foks, Kelly A., Polinder, Suzanne, Dippel, Diederik W.J., Maas, Andrew, Lingsma, Hester, Steyerberg, Ewout W

Journal:

Journal of Neurotrauma

Year:

2019

File:

PDF, 597 KB

2019

34

Electrostatic Aberration Correction in Low-Voltage SEM

Maas, Diederik, Mentink, Sjoerd, Henstra, Sander

Journal:

Microscopy and Microanalysis

Year:

2003

Language:

english

File:

PDF, 113 KB

english, 2003

35

End-of-life practices in traumatic brain injury patients: Report of a questionnaire from the CENTER-TBI study

van Veen, Ernest, van der Jagt, Mathieu, Citerio, Giuseppe, Stocchetti, Nino, Epker, Jelle L., Gommers, Diederik, Burdorf, Lex, Menon, David K., Maas, Andrew I.R., Lingsma, Hester F., Kompanje, Erwin

Journal:

Journal of Critical Care

Year:

2020

File:

PDF, 1.23 MB

2020

36

Lean: increase efficiency in stroke patient care

Heijndermans, Maud, Maas, Alexander, Dippel, Diederik, Buijck, Bianca

Journal:

Journal of Integrated Care

Year:

2020

File:

PDF, 110 KB

2020

37

Outcome Prediction after Moderate and Severe Traumatic Brain Injury: External Validation of Two Established Prognostic Models in 1742 European Patients

Dijkland, Simone A., Retel Helmrich, Isabel Rosalie Arianne, Nieboer, Daan, van der Jagt, Mathieu, Dippel, Diederik W.J., Menon, David, Stocchetti, Nino, Maas, Andrew, Lingsma, Hester F., Steyerberg,

Journal:

Journal of Neurotrauma

Year:

2020

File:

PDF, 1.01 MB

2020