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1

Physical Principles of Electron Microscopy Volume 96 || The Scanning Electron Microscope

Egerton, Ray F.

Year:

2005

Language:

english

File:

PDF, 1.02 MB

english, 2005

2

Physical Principles of Electron Microscopy Volume 96 || Analytical Electron Microscopy

Egerton, Ray F.

Year:

2005

Language:

english

File:

PDF, 380 KB

english, 2005

3

Valence state map of iron oxide thin film obtained from electron spectroscopy imaging series

Ko-Feng Chen, Shen-Chuan Lo, Li Chang, Ray Egerton, Ji-Jung Kai, Juhn-Jong Lin, Fu-Rong Chen

Journal:

Year:

2007

Language:

english

File:

PDF, 704 KB

english, 2007

4

Physical Principles of Electron Microscopy Volume 96 || Electron Optics

Egerton, Ray F.

Year:

2005

Language:

english

File:

PDF, 341 KB

english, 2005

5

Physical Principles of Electron Microscopy Volume 96 || An Introduction to Microscopy

Egerton, Ray F.

Year:

2005

Language:

english

File:

PDF, 1.64 MB

english, 2005

6

Physical Principles of Electron Microscopy Volume 96 || The Transmission Electron Microscope

Egerton, Ray F.

Year:

2005

Language:

english

File:

PDF, 323 KB

english, 2005

7

Local thickness measurement through scattering contrast and electron energy-loss spectroscopy

Huai-Ruo Zhang, Ray F. Egerton, Marek Malac

Journal:

Year:

2012

Language:

english

File:

PDF, 1.77 MB

english, 2012

8

Electron Energy‐Loss Spectroscopy in the Electron Microscope

Egerton, Ray F., Newbury, Dale E.

Journal:

Year:

1987

Language:

english

File:

PDF, 782 KB

english, 1987

9

Thermal Expansion Coefficient Measurement from Electron Diffraction of Amorphous Films in a TEM

Hayashida, Misa, Cui, Kai, Malac, Marek, Egerton, Ray

Journal:

Ultramicroscopy

Year:

2018

Language:

english

File:

PDF, 849 KB

english, 2018

10

Electron energy loss spectrometers, by Harald Ibach. Springer Series in Optical Sciences Volume 63. Springer-Verlag, 1991, 178 pp, $59

Journal:

Microscopy Research and Technique

Year:

1992

Language:

english

File:

PDF, 88 KB

english, 1992

11

,Advances in acoustic microscopy Volume 1 (1995) Plenum,New York 0-306-44798-3 350.

Journal:

Year:

1996

Language:

english

File:

PDF, 74 KB

english, 1996

12

High-energy electron diffraction and microscopy: L.-M. Peng, S.L. Dudarev, M.J. Whelan; Oxford University Press, 2004, 535 pages, ISBN 0-19-850074-2, £ 69.95

Journal:

Year:

2004

Language:

english

File:

PDF, 45 KB

english, 2004

13

Preface

Renhui Wang, Jianbo Wang, Lian-Mao Peng, Ray Egerton

Journal:

Year:

2004

Language:

english

File:

PDF, 192 KB

english, 2004

14

Alternative methods of identifying the oxidation of metallic nanoparticles embedded in a matrix

Feng Wang, Marek Malac, Ray F. Egerton

Journal:

Year:

2007

Language:

english

File:

PDF, 780 KB

english, 2007

15

Interpretation of the postpeak in iron fluorides and oxides

Feng Wang, Ray F. Egerton, Marek Malac

Journal:

Ultramicroscopy

Year:

2006

Language:

english

File:

PDF, 352 KB

english, 2006

16

Imaging of radiation-sensitive samples in transmission electron microscopes equipped with Zernike phase plates

Marek Malac, Marco Beleggia, Ray Egerton, Yimei Zhu

Journal:

Ultramicroscopy

Year:

2008

Language:

english

File:

PDF, 1.44 MB

english, 2008

17

Low-dose performance of parallel-beam nanodiffraction

Marek Malac, Marco Beleggia, Yoshifumi Taniguchi, Ray F. Egerton, Yimei Zhu

Journal:

Ultramicroscopy

Year:

2008

Language:

english

File:

PDF, 1.08 MB

english, 2008

18

Fourier-ratio deconvolution techniques for electron energy-loss spectroscopy (EELS)

Feng Wang, Ray Egerton, Marek Malac

Journal:

Ultramicroscopy

Year:

2009

Language:

english

File:

PDF, 457 KB

english, 2009

19

Foreword: An Appreciation of Mike Whelan

Journal:

Year:

1997

Language:

english

File:

PDF, 105 KB

english, 1997

20

Bright-field TEM imaging of single molecules: Dream or near future?

Marek Malac, Marco Beleggia, Ray Egerton, Yimei Zhu

Journal:

Ultramicroscopy

Year:

2007

Language:

english

File:

PDF, 1.42 MB

english, 2007

21

Transmission Electron Microscopy and Diffractometry of Materials: B. Fultz, J.M. Howe; Springer, 2001, 748 pages, hardback, ISBN 3-540-67841-7 ($CAN 139.50)

Journal:

Year:

2002

Language:

english

File:

PDF, 29 KB

english, 2002

22

Preface to the special issue on energy-filtered TEM imaging

Ferdinand Hofer, Ray Egerton

Journal:

Year:

1997

Language:

english

File:

PDF, 100 KB

english, 1997

23

Physical Principles of Electron Microscopy Volume 2764 || Recent Developments

Egerton, Ray F.

Year:

2005

Language:

english

File:

PDF, 983 KB

english, 2005

24

Serial measures of plasma homocyst(e)ine after acute myocardial infarction

William Egerton, Jonathan Silberberg, Renee Crooks, Cheryl Ray, Lijuan Xie, Nicholas Dudman

Journal:

The American Journal of Cardiology

Year:

1996

Language:

english

File:

PDF, 329 KB

english, 1996

25

Water-Soluble J-Type Rosette Nanotubes with Giant Molar Ellipticity

Borzsonyi, Gabor, Beingessner, Rachel L., Yamazaki, Takeshi, Cho, Jae-Young, Myles, Andrew J., Malac, Marek, Egerton, Ray, Kawasaki, Masahiro, Ishizuka, Kazuo, Kovalenko, Andriy

Journal:

Journal of the American Chemical Society

Year:

2010

Language:

english

File:

PDF, 263 KB

english, 2010

26

Physical Principles of Electron Microscopy Volume 7417 ||

Egerton, Ray F.

Year:

2005

Language:

english

File:

PDF, 104 KB

english, 2005

27

Convenient contrast enhancement by a hole-free phase plate

Marek Malac, Marco Beleggia, Masahiro Kawasaki, Peng Li, Ray F. Egerton

Journal:

Ultramicroscopy

Year:

2012

Language:

english

File:

PDF, 1.41 MB

english, 2012

28

Heteroepitaxial Growth of Gold Nanostructures on Silicon by Galvanic Displacement

Sayed, Sayed Y., Wang, Feng, Malac, Marek, Meldrum, Al, Egerton, Ray F., Buriak, Jillian M.

Journal:

Year:

2009

Language:

english

File:

PDF, 6.32 MB

english, 2009

29

Energy-loss near-edge fine structures of iron nanoparticles

Feng Wang, Marek Malac, Ray F. Egerton

Journal:

Year:

2006

Language:

english

File:

PDF, 648 KB

english, 2006

30

Observations of the microscopic growth mechanism of pillars and helices formed by glancing-angle thin-film deposition

Malac, Marek, Egerton, Ray F.

Journal:

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films

Year:

2001

Language:

english

File:

PDF, 1.14 MB

english, 2001

31

Electron irradiation damage and color centers of MgO nanocube

Zhang, Huai-Ruo, Egerton, Ray, Malac, Marek

Journal:

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Year:

2013

Language:

english

File:

PDF, 1.90 MB

english, 2013

32

Ethics issues

Cox, Guy, Braet, Filip, Egerton, Ray

Journal:

Year:

2014

Language:

english

File:

PDF, 129 KB

english, 2014

33

Vibrational spectroscopy in the electron microscope

Krivanek, Ondrej L., Lovejoy, Tracy C., Dellby, Niklas, Aoki, Toshihiro, Carpenter, R. W., Rez, Peter, Soignard, Emmanuel, Zhu, Jiangtao, Batson, Philip E., Lagos, Maureen J., Egerton, Ray F., Crozier

Journal:

Year:

2014

Language:

english

File:

PDF, 896 KB

english, 2014

34

Optical and transient photoconductive properties of pentacene and functionalized pentacene thin films: Dependence on film morphology

Ostroverkhova, Oksana, Shcherbyna, Svitlana, Cooke, David G., Egerton, Ray F., Hegmann, Frank A., Tykwinski, Rik R., Parkin, Sean R., Anthony, John E.

Journal:

Journal of Applied Physics

Year:

2005

Language:

english

File:

PDF, 979 KB

english, 2005

35

Multilayer route to iron nanoparticle formation in an insulating matrix

Wang, Feng, Malac, Marek, Egerton, Ray F., Meldrum, Alkiviathes, Zhu, Xiaobin, Liu, Zhigang, Macdonald, Nicole, Li, Peng, Freeman, Mark R.

Journal:

Journal of Applied Physics

Year:

2007

Language:

english

File:

PDF, 656 KB

english, 2007

36

Exposure characteristics of cobalt fluoride (CoF[sub 2]) self-developing electron-beam resist on sub-100 nm scale

Malac, Marek, Schoefield, Marvin, Zhu, Yimei, Egerton, Ray

Journal:

Journal of Applied Physics

Year:

2002

Language:

english

File:

PDF, 1.22 MB

english, 2002

37

Accurate measurement of relative tilt and azimuth angles in electron tomography: A comparison of fiducial marker method with electron diffraction

Hayashida, Misa, Malac, Marek, Bergen, Michael, Egerton, Ray F., Li, Peng

Journal:

Review of Scientific Instruments

Year:

2014

Language:

english

File:

PDF, 756 KB

english, 2014

38

Advances in the Transmission Electron Microscopy of Polymers

Libera, Matthew R., Egerton, Ray F.

Journal:

Polymer Reviews

Year:

2010

Language:

english

File:

PDF, 591 KB

english, 2010

39

Outrun radiation damage with electrons?

Journal:

Advanced Structural and Chemical Imaging

Year:

2015

Language:

english

File:

PDF, 1.51 MB

english, 2015

40

SPIE Proceedings [SPIE Optical Science and Technology, the SPIE 49th Annual Meeting - Denver, CO (Monday 2 August 2004)] Linear and Nonlinear Optics of Organic Materials IV - Fast photoresponse in organic semiconductors: understanding the mechanisms and structure-property relationships

Ostroverkhova, Oksana, Shcherbyna, Svitlana, Cooke, David G., Egerton, Ray, Tykwinski, Rik R., Anthony, John E., Hegmann, Frank A., Norwood, Robert A., Eich, Manfred, Kuzyk, Mark G.

Year:

2004

Language:

english

File:

PDF, 763 KB

english, 2004

41

Physical Principles of Electron Microscopy || TEM Specimens and Images

Egerton, Ray F.

Year:

2005

Language:

english

File:

PDF, 1.59 MB

english, 2005

42

Bring your paper into the ‘Fast Lane’ of the editorial process and increase your changes for final acceptance in Micron, The International Research and Review Journal for Microscopy

Braet, Filip, Egerton, Ray, Cox, Guy

Journal:

Year:

2015

Language:

english

File:

PDF, 255 KB

english, 2015

43

Gold nanoparticles formed directly on a membrane by ultraviolet light irradiation

Qian, Hui, Shen, Wei-Zheng, Chen, Jian, Kawasaki, Masahiro, Egerton, Ray F.

Journal:

Applied Physics Letters

Year:

2015

Language:

english

File:

PDF, 970 KB

english, 2015

44

Thin-film regular-array structures with 10-100 nm repeat distance

Malac, Marek, Egerton, Ray F

Journal:

Year:

2001

Language:

english

File:

PDF, 172 KB

english, 2001

45

[OSA CLEO: QELS_Fundamental Science - San Jose, California (2014..-..)] CLEO: 2014 - Momentum-resolved Electron Energy Loss Spectroscopy (q-EELS) for Quantum Plasmonics and Metamaterials

Shekhar, Prashant, Gaind, Vaibhav, Malac, Marek, Egerton, Ray, Jacob, Zubin

Year:

2014

Language:

english

File:

PDF, 153 KB

english, 2014

46

Radiation damage yields across the carbon 1s excitation edge

Leontowich, Adam F.G., Hitchcock, Adam P., Egerton, Ray F.

Journal:

Journal of Electron Spectroscopy and Related Phenomena

Year:

2015

Language:

english

File:

PDF, 666 KB

english, 2015

47

The Lateral Range and Energy Deposition of Fast Secondary Electrons

Egerton, Ray F, Malac, Marek

Journal:

Microscopy and Microanalysis

Year:

2004

Language:

english

File:

PDF, 142 KB

english, 2004

48

Angle-resolved Valence EELS of a Single Crystal Gold Sample

Malac, Marek, Kimoto, Koji, Egerton, Ray, Shekhar, Prashant, Jacob, Zubin, Taniguchi, Yoshifumi, Gaind, Vaibhav

Journal:

Microscopy and Microanalysis

Year:

2014

Language:

english

File:

PDF, 1.56 MB

english, 2014

49

Charging of Thin Film Phase Plates under Electron Beam Irradiation

Malac, Marek, Beleggia, Marco, Egerton, Ray, Kawasaki, Masahiro, Berge, Michael, Okura, Yoshio, Ishikawa, Isamu, Motoki, Kohei

Journal:

Microscopy and Microanalysis

Year:

2014

Language:

english

File:

PDF, 1.23 MB

english, 2014

50

Electron Diffraction Based Tilt Angle Measurements in Electron Tomography

Hayashida, Misa, Malac, Marek, Bergen, Mike, Li, Peng, Egerton, Ray

Journal:

Microscopy and Microanalysis

Year:

2014

Language:

english

File:

PDF, 1.50 MB

english, 2014