Ipposhi, H: search on Z-Library

The world's largest scientific articles store. 70,000,000+ articles for free.

Don't use scam websites

51

[IEEE 1994 VLSI Technology Symposium - Honolulu, HI, USA (7-9 June 1994)] Proceedings of 1994 VLSI Technology Symposium - Cornerless active area cell and Bi-T-MOS process for sub-half micron SRAMs

Ishida, M., Kuriyama, H., Tsutsumi, K., Ipposhi, T., Kohno, Y., Miyoshi, H.

Year:

1994

Language:

english

File:

PDF, 186 KB

english, 1994

52

[IEEE 2000 Symposium on VLSI Technology. Digest of Technical Papers - Honolulu, HI, USA (13-15 June 2000)] 2000 Symposium on VLSI Technology. Digest of Technical Papers (Cat. No.00CH37104) - Impact of 0.18 μm SOI CMOS technology using hybrid trench isolation with high resistivity substrate on embedded RF/analog applications

Maeda, S., Wada, Y., Yamamoto, K., Komurasaki, H., Matsumoto, T., Hirano, Y., Iwamatsu, T., Yamaguchi, Y., Ipposhi, T., Ueda, K., Mashiko, K., Maegawa, S., Inuishi, M.

Year:

2000

Language:

english

File:

PDF, 329 KB

english, 2000

53

[IEEE 2000 IEEE International SOI Conference. Proceedings - Wakefield, MA, USA (2-5 Oct. 2000)] 2000 IEEE International SOI Conference. Proceedings (Cat. No.00CH37125) - Suppression of stress induced drain leakage current of SOI MOSFETs by using partial trench isolation technology

Iwamatsu, T., Ipposhi, T., Uchida, T., Maegawa, S., Inuishi, M.

Year:

2000

Language:

english

File:

PDF, 178 KB

english, 2000

54

[IEEE 1997 IEEE International SOI Conference Proceedings - Fish Camp, CA, USA (6-9 Oct. 1997)] 1997 IEEE International SOI Conference Proceedings - High-sensitivity measurement of particles on SOI wafers

Naruoka, H., Yoshida, Y., Iwamatsu, T., Yamaguchi, Y., Ipposhi, T., Yamamoto, H.

Year:

1997

Language:

english

File:

PDF, 302 KB

english, 1997

55

[IEEE Technical Papers. International Symposium on VLSI Technology, Systems, and Applications - Taipei, Taiwan (June 3-5, 1997)] Proceedings of Technical Papers. International Symposium on VLSI Technology, Systems, and Applications - High Performance Gate-all-around TFT(GAT) For High-density, Low-voltage-operation, And Low-power Srams

Miyamoto, S., Maegawa, S., Maeda, S., Ipposhi, T., Kuriyama, H., Nishimura, T.

Year:

1997

Language:

english

File:

PDF, 384 KB

english, 1997

56

[IEEE 2006 IEEE international SOI - Niagara Falls, NY, USA (2006.10.2-2006.10.5)] 2006 IEEE international SOI Conferencee Proceedings - Defect-Free Epitaxial Lateral Overgrowth (ELO) Technique For Future Generation Low Power CMOSFETs

Tsuchiya, R., Kimura, Y., Morita, Y., Kimura, S., Hirasawa, T., Inui, K., Iwamatsu, T., Ipposhi, T., Kondo, Y., Sakata, T., Inoue, Y.

Year:

2006

Language:

english

File:

PDF, 2.19 MB

english, 2006

57

[IEEE 1994 VLSI Technology Symposium - Honolulu, HI, USA (7-9 June 1994)] Proceedings of 1994 VLSI Technology Symposium - A Vertical Φ-shape Transistor (VΦT) cell for 1 Gbit DRAM and beyond

Maeda, S., Maegawa, S., Ipposhi, T., Nishimura, H., Kuriyama, H., Tanina, O., Inoue, Y., Nishimura, H., Tsubouchi, N.

Year:

1994

Language:

english

File:

PDF, 267 KB

english, 1994

58

[IEEE International Meeting for Future of Electron Devices, 2004. - Kyoto, Japan (July 26-28, 2004)] International Meeting for Future of Electron Devices, 2004. - Body bias controlled SOI technology with HTI

Tsuiiuchi, M., Hirano, Y., Iwamatsu, T., Ipposhi, T., Maegawa, S., Inuishi, M., Ohji, Y.

Year:

2004

Language:

english

File:

PDF, 1.65 MB

english, 2004

59

[IEEE Symposium on VLSI Technology - Kyoto, Japan (1997.06.12-1997.06.12)] Symposium on VLSI Technology - Negative Bias Temperature Instability In Poly-Si TFTs

Maeda,, Maegawa,, Ipposhi,, Nishimura,, Ichiki,, Mitsubashi,, Ashida,, Muragishi,, Nishimura,

Year:

1993

Language:

english

File:

PDF, 210 KB

english, 1993

60

[IEEE International Electron Devices Meeting. Technical Digest - Washington, DC, USA (2-5 Dec. 2001)] International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224) - An artificial fingerprint device (AFD) module using poly-Si thin film transistors with logic LSI compatible process for built-in security

Maeda, S., Kuriyama, H., Ipposhi, T., Maegawa, S., Inuishi, M.

Year:

2001

Language:

english

File:

PDF, 336 KB

english, 2001

61

[IEEE 2006 Symposium on VLSI Circuits, 2006. Digest of Technical Papers. - Honolulu, HI, USA (June 15-17, 2006)] 2006 Symposium on VLSI Circuits, 2006. Digest of Technical Papers. - Low Power SOC Design Using Partial-Trench-Isolation ABC SOI (PTI-ABC SOI) for Sub-100-nm LSTP Technology

Ozawa, O., Fukuoka, K., Igarashi, Y., Kuraishi, T., Yasu, Y., Maki, Y., Ipposhi, T., Ochiai, T., Shirahata, M., Ishibashi, K.

Year:

2006

Language:

english

File:

PDF, 413 KB

english, 2006

62

[IEEE International Electron Devices Meeting. Technical Digest - San Francisco, CA, USA (8-11 Dec. 1996)] International Electron Devices Meeting. Technical Digest - Suppression of delay time instability on frequency using field shield isolation technology for deep sub-micron SOI circuits

Maeda, S., Yamaguchi, Y., Kim, I.-J., Iwamatsu, T., Ipposhi, T., Miyamoto, S., Maegawa, S., Ueda, K., Nii, K., Mashiko, K., Inoue, Y., Miyoshi, H.

Year:

1996

Language:

english

File:

PDF, 483 KB

english, 1996

63

[IEEE 20th International Conference on VLSI Design held jointly with 6th International Conference on Embedded Systems (VLSID'07) - Bangalore, India (2007.01.6-2007.01.10)] 20th International Conference on VLSI Design held jointly with 6th International Conference on Embedded Systems (VLSID'07) - Ultra Low Voltage Operation with Bootstrap Scheme for Single Power Supply SOI-SRAM

Iijima, Masaaki, Kitamura, Masayuki, Numa, Masahiro, Tada, Akira, Ipposhi, Takashi

Year:

2007

Language:

english

File:

PDF, 466 KB

english, 2007

64

[IEEE 2006 Symposium on VLSI Circuits, 2006. Digest of Technical Papers. - Honolulu, HI, USA (June 15-17, 2006)] 2006 Symposium on VLSI Circuits, 2006. Digest of Technical Papers. - A Configurable Enhanced T/sup 2/RAM Macro for System-Level Power Management Unified Memory

Arimoto, K., Morishita, F., Hayashi, I., Gyohten, T., Noda, H., Ipposhi, T., Dosaka, K.

Year:

2006

Language:

english

File:

PDF, 504 KB

english, 2006

65

[IEEE IEEE International Electron Devices Meeting - Washington, DC, USA (5-8 Dec. 1993)] Proceedings of IEEE International Electron Devices Meeting - Performance and reliability improvement in poly-Si TFTs by fluorine implantation

Maegawa, S., Ipposhi, T., Maeda, S., Nishimura, H., Ichiki, T., Ashida, M., Tanina, O., Inoue, Y., Nishimura, T., Tsubouchi, N.

Year:

1993

Language:

english

File:

PDF, 360 KB

english, 1993

66

Mechanism of negative-bias temperature instability in polycrystalline-silicon thin film transistors

S. Maeda, S. Maegawa, T. Ipposhi, H. Nishimura, T. Ichiki, J. Mitsuhashi, M. Ashida, T. Muragishi, Y. Inoue, T. Nishimura

Year:

1994

Language:

english

File:

PDF, 1.07 MB

english, 1994

67

[IEEE 2007 Joint 50th IEEE International Midwest Symposium on Circuits and Systems (MWSCAS) and the IEEE Northeast Workshop on Circuits and Systems (NEWCAS 2007) - Montreal, QC, Canada (2007.08.5-2007.08.8)] 2007 50th Midwest Symposium on Circuits and Systems - Improved write margin for 90nm SOI-7T-SRAM by look-ahead dynamic threshold voltage control

Masaaki Iijima,, Kayoko Seto,, Masahiro Numa,, Akira Tada,, Takashi Ipposhi,

Year:

2007

Language:

english

File:

PDF, 1.02 MB

english, 2007

68

[IEEE 2007 IEEE International Solid-State Circuits Conference. Digest of Technical Papers - San Francisco, CA, USA (2007.02.11-2007.02.15)] 2007 IEEE International Solid-State Circuits Conference. Digest of Technical Papers - A 0.05�0.05mm2 RFID Chip with Easily Scaled-Down ID-Memory

Usami, Mitsuo, Tanabe, Hisao, Sato, Akira, Sakama, Isao, Maki, Yukio, Iwamatsu, Toshiaki, Ipposhi, Takashi, Inoue, Yasuo

Year:

2007

Language:

english

File:

PDF, 2.46 MB

english, 2007

69

Characterization of thermally annealed thin silicon films on insulators by Raman image measurement

Mizoguchi, Kohji, Yamauchi, Yuji, Harima, Hiroshi, Nakashima, Shin-ichi, Ipposhi, Takashi, Inoue, Yasuo

Journal:

Journal of Applied Physics

Year:

1995

Language:

english

File:

PDF, 906 KB

english, 1995

70

[IEEE 1995 IEEE International SOI Conference - Tucson, AZ, USA (3-5 Oct. 1995)] 1995 IEEE International SOI Conference Proceedings - An advanced 0.5 μm CMOS/SOI technology for practical ultrahigh-speed and low-power circuits

Ipposhi, T., Iwamatsu, T., Yamaguchi, Y., Ueda, K., Morinaka, H., Mashiko, K., Inoue, Y., Hirao, T.

Year:

1995

Language:

english

File:

PDF, 237 KB

english, 1995

71

[IEEE IEEE International Electron Devices Meeting 2003 - Washington, DC, USA (8-10 Dec. 2003)] IEEE International Electron Devices Meeting 2003 - Impact of actively body-bias controlled (ABC) SOI SRAM by using direct body contact technology for low-voltage application

Hirano, Y., Ipposhi, T., Dang, H., Matsumoto, T., Iwamatsu, T., Nii, K., Tsukamoto, Y., Yoshizawa, T., Kato, H., Maegawa, S., Arimoto, K., Inoue, Y., Inuishi, M., Ohji, Y.

Year:

2003

Language:

english

File:

PDF, 330 KB

english, 2003

72

[IEEE IEEE Radio Frequency Integrated Circuits (RFIC) Symposium, 2006 - San Francisco, CA (JUNE 11-13, 2006)] IEEE Radio Frequency Integrated Circuits (RFIC) Symposium, 2006 - RF Components with High Reliability and Low Loss by Partial Trench Isolation of SOI-CMOS Technology

Furukawa, A., Hirano, Y., Ohnakado, T., Ikeda, T., Kagawa, Y., Shintani, K., Nishikawa, K., Yamakawa, S., Ipposhi, T., Maegawa, S., Takeda, M., Arima, H.

Year:

2006

Language:

english

File:

PDF, 467 KB

english, 2006

73

[IEEE Digest of Technical Papers. 2004 Symposium on VLSI Technology, 2004. - Honolulu, HI, USA (2004.06.17-2004.06.17)] Digest of Technical Papers. 2004 Symposium on VLSI Technology, 2004. - Soft error free, low power and low cost superSRAM with 0.98 /spl mu/m/sup 2/ cell by utilizing existing 0.15 /spl mu/m-DRAM process

Fujii, Y., Ishigaki, Y., Hosokawa, T., Dei, M., Maki, Y., Nishida, A., Izutsu, T., Nakashima, Y., Toyota, R., Koga, T., Ipposhi, T., Konishi, Y., Kihara, Y.

Year:

2004

Language:

english

File:

PDF, 217 KB

english, 2004

74

[IEEE Symposium on VLSI Technology - Kyoto, Japan (1997.06.12-1997.06.12)] Symposium on VLSI Technology - A Highly Reliable 0.35/spl mu/m Field-shield Body-tied SOI Gate Array For Substrate-bias-effect Free Operation

Maeda,, Yamaguchi,, Kim,, Iwamatsu,, Ipposhi,, Miyamoto,, Hirano,, Ueda,, Nii,, Mashiko,, Maegawa,, Inoue,, Nishimura,

Year:

1997

Language:

english

File:

PDF, 388 KB

english, 1997

75

[IEEE Symposium on VLSI Technology - Kyoto, Japan (1997.06.12-1997.06.12)] Symposium on VLSI Technology - Compact Memory Cell Using MGI-TFT's For 16-Mb SRAM And Beyond

Sakamoto,, Kuriyama,, Ashida,, Yuzuriha,, Tsutsumi,, Maeda,, Ipposhi,, Maegawa,, Nishimura,, Y Kohno,, Miyoshi,

Year:

1993

Language:

english

File:

PDF, 215 KB

english, 1993

76

[IEEE IEEE Custom Integrated Circuits Conference 2006 - San Jose, CA, USA (2006.09.10-2006.09.13)] IEEE Custom Integrated Circuits Conference 2006 - A Scalable ET2RAM (SETRAM) with Verify Control for SoC Platform Memory IP on SOI

Arimoto, Kazutami, Morishita, Fukashi, Hayashi, Isamu, Tanizaki, Tetsushi, Ipposhi, Takashi, Dosaka, Katsumi

Year:

2006

Language:

english

File:

PDF, 511 KB

english, 2006

77

Reliability study of thermal cycling stress on smart power devices

Zhang, Ming, Yoshihisa, Yasuki, Furuya, Keiichi, Imai, Yukari, Hatasako, Kenichi, Ipposhi, Takashi, Maegawa, Shigeto

Journal:

Japanese Journal of Applied Physics

Year:

2014

Language:

english

File:

PDF, 1.29 MB

english, 2014

78

Suppression of Parasitic MOSFETs at LOCOS Edge Region in Partially Depleted SOI MOSFETs

Yasuoka, Akihiko, Iwamatsu, Toshiaki, Ipposhi, Takashi, Miyamoto, Shoichi, Yamaguchi, Yasuo, Inoue, Yasuo, Miyoshi, Hirokazu

Journal:

Japanese Journal of Applied Physics

Year:

1997

File:

PDF, 818 KB

1997

79

The Influence of the Buried Oxide Defects on the Gate Oxide Reliability and Drain Leakage Currents of the Silicon-on-Insulator Metal-Oxide-Semiconductor Field-Effect Transistors

Iwamatsu, Toshiaki, Ipposhi, Takashi, Yamaguchi, Yasuo, Imai, Yukari, Maegawa, Shigeto, Tsubouchi, Natsuro, Nishimura, Tadashi

Journal:

Japanese Journal of Applied Physics

Year:

1997

File:

PDF, 1.04 MB

1997

80

A0.4 µmGate-All-Around TFT (GAT) Using a Dummy Nitride Pattern for High-Density Memories

S. Maegawa, T. Ipposhi, S. Maeda, H. Nishimura, O. Tanina, H. Kuriyama, Y. Inoue, T. Nishimura, N. Tsubouchi

Year:

1995

Language:

english

File:

PDF, 244 KB

english, 1995

81

Thermal Stability of Hg 1- x Cd x Te Crystals Covered with the Anodic Oxide Films

Takita, Kôki, Ippōshi, Takashi, Murakami, Kouichi, Masuda, Kohzoh, Kudo, Hiroshi, Seki, Seiji

Journal:

Japanese Journal of Applied Physics

Year:

1986

Language:

english

File:

PDF, 607 KB

english, 1986

82

Anger Electron Emission under Ion-Beam Shadowing Conditions

Kudo, Hiroshi, Murakami, Kouichi, Takita, Kôki, Masuda, Kohzoh, Seki, Seiji, Shima, Kunihiro, Itoh, Hisayoshi, Ippōshi, Takashi

Journal:

Japanese Journal of Applied Physics

Year:

1985

Language:

english

File:

PDF, 344 KB

english, 1985

83

Impact of µA-ON-Current Gate-All-Around TFT (GAT) for Static RAM of 16Mb and beyond

S. Maegawa, T. Ipposhi, S. Maeda, H. Kuriyama, Y. Kohno, Y. Inoue, H. Miyoshi, T. Hirao

Year:

1996

File:

PDF, 1.01 MB

1996

84

Wide-Range Threshold Voltage Controllable Silicon on Thin Buried Oxide Integrated with Bulk Complementary Metal Oxide Semiconductor Featuring Fully Silicided NiSi Gate Electrode

T. Ishigaki, R. Tsuchiya, Y. Morita, N. Sugii, S. Kimura, T. Iwamatsu, T. Ipposhi, Y. Inoue, T. Hiramoto

Year:

2008

Language:

english

File:

PDF, 264 KB

english, 2008

85

High Soft-Error Tolerance Body-Tied Silicon-on-Insulator Technology with Partial Trench Isolation

Y. Hirano, T. Iwamatsu, K. Shiga, K. Nii, K. Sonoda, T. Ipposhi, S. Maegawa, Y. Inoue

Year:

2008

Language:

english

File:

PDF, 146 KB

english, 2008

86

Crystal-Axis-Rotation of Laser-Recrystallized Silicon on Insulator

Sugahara, K., Ippóshi, T., Inoue, Y., Nishimura, T., Akasaka, Y.

Journal:

MRS Proceedings

Year:

1989

Language:

english

File:

PDF, 1.00 MB

english, 1989

87

ChemInform Abstract: Aluminum Triflate as a Powerful Catalyst for Direct Amination of Alcohols, Including Electron-Withdrawing Group-Substituted Benzhydrols.

Ohshima, Takashi, Ipposhi, Junji, Nakahara, Yasuhito, Shibuya, Ryozo, Mashima, Kazushi

Journal:

Year:

2013

File:

PDF, 43 KB

2013

88

Delayed-ABC SOI for crosstalk noise repair

Tada, Akira, Notani, Hiromi, Tanaka, Genichi, Iwamatsu, Toshiaki, Ipposhi, Takashi, Terai, Masayuki, Iijima, Masaaki, Numa, Masahiro

Journal:

IEICE Electronics Express

Year:

2008

Language:

english

File:

PDF, 569 KB

english, 2008

89

Dynamic threshold voltage control for dual supply voltage scheme on PD-SOI

Iijima, Masaaki, Hamada, Kenji, Kitamura, Masayuki, Numa, Masahiro, Tada, Akira, Ipposhi, Takashi

Journal:

IEICE Electronics Express

Year:

2006

Language:

english

File:

PDF, 272 KB

english, 2006

90

Charge recycling in MTCMOS circuits with block dividing

Tada, Akira, Notani, Hiromi, Tanaka, Genichi, Ipposhi, Takashi, Iijima, Masaaki, Numa, Masahiro

Journal:

IEICE Electronics Express

Year:

2007

Language:

english

File:

PDF, 363 KB

english, 2007

91

A Look-ahead Active Body-biasing scheme for SOI-SRAM with dynamic VDDM control

Seto, Kayoko, Iijima, Masaaki, Hirose, Tetsuya, Numa, Masahiro, Tada, Akira, Ipposhi, Takashi

Journal:

IEICE Electronics Express

Year:

2009

Language:

english

File:

PDF, 537 KB

english, 2009

92

Butyrolactone autoregulator receptor protein (BarA) as a transcriptional regulator in Streptomyces virginiae.

Kinoshita, H, Ipposhi, H, Okamoto, S, Nakano, H, Nihira, T, Yamada, Y

Journal:

Journal of Bacteriology

Year:

1997

Language:

english

File:

PDF, 2.29 MB

english, 1997

93

[ASME ASME 2017 International Mechanical Engineering Congress and Exposition - Tampa, Florida, USA (Friday 3 November 2017)] Volume 8: Heat Transfer and Thermal Engineering - Enhanced Heat Capacity of Salt Hydrate by In-Situ Formed Nanostructure

Mostafavi, Amirhossein, Suzuki, S., Changla, S., Pinto, A., Ipposhi, S., Shin, Donghyun

Year:

2017

Language:

english

File:

PDF, 1.33 MB

english, 2017

94

Enhanced specific heat of sodium acetate trihydrate by in-situ nanostructure synthesis

Mostafavi, Amirhossein, Suzuki, Shunkei, Changla, Sumeet, Pinto, Aditya, Ipposhi, Shigetoshi, Shin, Donghyun

Journal:

Journal of Heat Transfer

Year:

2018

Language:

english

File:

PDF, 1.92 MB

english, 2018

95

SAE Technical Paper Series [SAE International International Congress & Exposition - (FEB. 28, 1994)] SAE Technical Paper Series - SOI Type Pressure Sensor for High Temperature Pressure Measurement

Hase, Yuji, Bessho, Mikio, Ipposhi, Takashi

Year:

1994

Language:

english

File:

PDF, 253 KB

english, 1994