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51

SPIE Proceedings [SPIE SPIE Defense, Security, and Sensing - Orlando, Florida, United States (Monday 25 April 2011)] Quantum Information and Computation IX - Implementing an optical CNOT using spatial parity qubits

Kagalwala, K., Donkor, Eric, Pirich, Andrew R., Di Giuseppe, G., Abouraddy, A. F., Brandt, Howard E., Saleh, B. E. A.

Year:

2011

Language:

english

File:

PDF, 1.75 MB

english, 2011

52

Electron-Poor Thiophene 1,1-Dioxides: Synthesis, Characterization, and Application as Electron Relays in Photocatalytic Hydrogen Generation

Tsai , Chia-Hua, Chirdon , Danielle N., Kagalwala, Husain N., Maurer, Andrew B., Kaur, Aman, Pintauer, Tomislav, Bernhard, Stefan, Noonan, Kevin J. T.

Journal:

Chemistry - A European Journal

Year:

2015

Language:

english

File:

PDF, 1.64 MB

english, 2015

53

Preoperative Computed Tomography-Guided Hookwire Needle Localization of a Peritoneal Multilocular Inclusion Cyst

Kagalwala, Din Z, Shankar, Sridhar, Zota, Victor, Sandor, Andras, Litwin, Demetrius E. M

Journal:

Journal of Computer Assisted Tomography

Year:

2005

Language:

english

File:

PDF, 166 KB

english, 2005

54

A Combined Gas Cluster Ion Beam (GCIB) and Chemical-Mechanical Polish (CMP) Planarization Scheme for Tungsten Replacement Metal Gate (W-RMG)

Tseng, Wei-Tsu, Long, Justin, Mohan, Kaushik, Kagalwala, Taher, Wu, Changhong, Truong, Connie

Journal:

ECS Journal of Solid State Science and Technology

Year:

2016

Language:

english

File:

PDF, 1.31 MB

english, 2016

55

Evidence for Oxidative Decay of a Ru-Bound Ligand during Catalyzed Water Oxidation

Kagalwala, Husain N., Tong, Lianpeng, Zong, Ruifa, Kohler, Lars, Ahlquist, Mårten S. G., Fan, Ting, Gagnon, Kevin J., Thummel, Randolph P.

Journal:

Year:

2017

Language:

english

File:

PDF, 1.62 MB

english, 2017

56

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, United States (Sunday 26 February 2017)] Metrology, Inspection, and Process Control for Microlithography XXXI - High throughput and dense sampling metrology for process control

Sanchez, Martha I., Ukraintsev, Vladimir A., Sun, Lei, Kohyama, Tsunehito, Takeda, Kuniaki, Nozawa, Hiroto, Asakawa, Yuji, Kagalwala, Taher, Lobb, Granger, Mont, Frank, Dai, Xintuo, Pal, Shyam, Wang,

Year:

2017

Language:

english

File:

PDF, 916 KB

english, 2017

57

Light-Driven Hydrogen Generation from Microemulsions Using Metallosurfactant Catalysts and Oxalic Acid

Kagalwala, Husain N., Chirdon, Danielle N., Mills, Isaac N., Budwal, Nikita, Bernhard, Stefan

Journal:

Inorganic Chemistry

Year:

2017

Language:

english

File:

PDF, 2.98 MB

english, 2017

58

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, United States (Sunday 26 February 2017)] Metrology, Inspection, and Process Control for Microlithography XXXI - Complex metrology on 3D structures using multi-channel OCD

Sanchez, Martha I., Ukraintsev, Vladimir A., Kagalwala, Taher, Mahendrakar, Sridhar, Vaid, Alok, Isbester, Paul K., Cepler, Aron, Kang, Charles, Yellai, Naren, Sendelbach, Matthew, Ko, Mihael, Ilgayev

Year:

2017

Language:

english

File:

PDF, 912 KB

english, 2017

59

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, United States (Sunday 26 February 2017)] Metrology, Inspection, and Process Control for Microlithography XXXI - SAQP pitch walk metrology using single target metrology

Sanchez, Martha I., Ukraintsev, Vladimir A., Fang, Fang, Herrera, Pedro, Kagalwala, Taher, Camp, Janay, Vaid, Alok, Pandev, Stilian, Zach, Franz

Year:

2017

Language:

english

File:

PDF, 1.16 MB

english, 2017

60

Optical coherency matrix tomography

Kagalwala, Kumel H., Kondakci, H. Esat, Abouraddy, Ayman F., Saleh, Bahaa E. A.

Journal:

Scientific Reports

Year:

2015

Language:

english

File:

PDF, 1.69 MB

english, 2015

61

Single-photon three-qubit quantum logic using spatial light modulators

Kagalwala, Kumel H., Di Giuseppe, Giovanni, Abouraddy, Ayman F., Saleh, Bahaa E. A.

Journal:

Nature Communications

Year:

2017

Language:

english

File:

PDF, 2.65 MB

english, 2017

62

G241 Vitamin D levels in children and adolescents with cancer

Ryan, J., Shankar, A., Brain, C., Kagalwala, F., Say, J.

Journal:

Archives of Disease in Childhood

Year:

2014

Language:

english

File:

PDF, 76 KB

english, 2014

63

G419(P) Blood levels of vitamin D in children and adolescents with cancer

Ryan, J., Kagalwala, F., Shankar, A., Brain, C.

Journal:

Archives of Disease in Childhood

Year:

2014

Language:

english

File:

PDF, 66 KB

english, 2014

64

Common Activated Carbons as Water Reducing Catalysts in Photo-Driven Hydrogen Evolution with Nitrogen Dependent Activity

Gottlieb, Eric, Kagalwala, Husain N., Mohin, Jacob, Budwal, Nikita, Amsterdam, Samuel, Lamson, Melissa, Matyjaszewski, Krzysztof, Bernhard, Stefan, Kowalewski, Tomasz

Journal:

Year:

2018

Language:

english

File:

PDF, 1.22 MB

english, 2018

65

Dynamic Status of REST in the Mouse ESC Pluripotency Network

Singh, Sanjay K., Veo, Bethany L., Kagalwala, Mohamedi N., Shi, Weiwei, Liang, Shoudan, Majumder, Sadhan, Cooney, Austin John

Journal:

Year:

2012

Language:

english

File:

PDF, 770 KB

english, 2012

66

Correspondence

Thakre, Rhishikesh, Patil, P. S., Kagalwala, Taher

Journal:

Indian Pediatrics

Year:

2018

Language:

english

File:

PDF, 246 KB

english, 2018

67

[IEEE 2019 30th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) - Saratoga Springs, NY, USA (2019.5.6-2019.5.9)] 2019 30th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) - Improving Metrology Fleet KPIs for Advanced Foundry Manufacturing

Kagalwala, Taher, Timoney, Padraig, Fiege, Ronald, Emans, Jason, Hughes, Timothy, Elia, Alexander, Vaid, Alok, Emans, Susan, Vilge, Benny, Cheng, Marjorie, Kang, Charles, Zingerman, Darren, Drayton, K

Year:

2019

Language:

english

File:

PDF, 1.25 MB

english, 2019

68

[IEEE 2019 30th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) - Saratoga Springs, NY, USA (2019.5.6-2019.5.9)] 2019 30th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) - Characterization of Overlay and Tilt in Advanced Technology Nodes using Scatterometry

Dixit, Dhairya, Dey, Sonal, Kagalwala, Taher, Timoney, Padraig, Ramnath, Yudesh, Elia, Alexander, Paranjape, Ninad, Keller, Nick, Vaid, Alok

Year:

2019

Language:

english

File:

PDF, 2.53 MB

english, 2019

69

[IEEE 2019 30th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) - Saratoga Springs, NY, USA (2019.5.6-2019.5.9)] 2019 30th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) - Characterization of Overlay and Tilt in Advanced Technology Nodes using Scatterometry

Dixit, Dhairya, Dey, Sonal, Kagalwala, Taher, Timoney, Padraig, Ramnath, Yudesh, Elia, Alexander, Paranjape, Ninad, Keller, Nick, Vaid, Alok

Year:

2019

File:

PDF, 2.53 MB

2019

70

Child with prolonged leg pain and bruising

Bailey, Emma, Ali, Alaa, Kagalwala, Fatima

Journal:

Archives of Disease in Childhood - Education and Practice

Year:

2020

File:

PDF, 347 KB

2020

71

Computational Model of DIC Microscopy for Reconstructing 3-D Specimens

Kagalwala, F., Lanni, F., Kanade, T.

Journal:

Methods of Information in Medicine

Year:

2000

File:

PDF, 218 KB

2000

72

Rapid systematic review of neonatal COVID-19 including a case of presumed vertical transmission

Gordon, Morris, Kagalwala, Taher, Rezk, Karim, Rawlingson, Chris, Ahmed, M Idris, Guleri, Achyut

Journal:

BMJ Paediatrics Open

Year:

2020

File:

PDF, 476 KB

2020