52

MEMS spring probe for non-destructive wafer level chip test

Year:
2005
Language:
english
File:
PDF, 213 KB
english, 2005
74

Effective Light Beam Modulation by Chirp IDT on a Suspended LiNbO3 Membrane for 3D Holographic Displays

Year:
2020
Language:
english
File:
PDF, 4.58 MB
english, 2020