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51

[IEEE IEEE 1991 Ultrasonics Symposium - Orlando, FL, USA (8-11 Dec. 1991)] IEEE 1991 Ultrasonics Symposium - Measured properties of doubly-rotated lithium tetraborate resonators and transducers

Ballato, A., Kosinski, J., Lukaszek, T., Mallikarjun, S.

Year:

1991

Language:

english

File:

PDF, 348 KB

english, 1991

52

[IEEE 1992 IEEE Frequency Control Symposium - Hershey, PA, USA (27-29 May 1992)] Proceedings of the 1992 IEEE Frequency Control Symposium - Market survey of acceleration-insensitive SAW oscillators

Himmel, J., McGowan, R., Kosinski, J., Lukaszek, T.

Year:

1992

Language:

english

File:

PDF, 739 KB

english, 1992

53

[IEEE IEEE 48th Annual Symposium on Frequency Control - Boston, MA, USA (1-3 June 1994)] Proceedings of IEEE 48th Annual Symposium on Frequency Control - Chemical/biological contaminant detector for aqueous environments: preliminary report

McGowan, R., Foerster, J., Huynh, D., Lindenmuth, R., Lukaszek, T., Lu, Y.

Year:

1994

Language:

english

File:

PDF, 330 KB

english, 1994

54

[IEEE 20th Annual Symposium on Frequency Control - Fort Monmouth, New Jersey, USA (1966.04.19-1966.04.21)] 20th Annual Symposium on Frequency Control - Design and Fabrication of Modern Filter Crystals

Ballato, A., Lukaszek, T., Wasshausen, H., Chabak, E.

Year:

1966

Language:

english

File:

PDF, 1.85 MB

english, 1966

55

Ballato, A., Hatch, E.R., Mizan, M., Lukaszek, T.J.

Journal:

IEEE Transactions on Ultrasonics Ferroelectrics and Frequency Control

Year:

1986

Language:

english

File:

PDF, 853 KB

english, 1986

56

[IEEE 39th Annual Symposium on Frequency Control - (1985.05.29-1985.05.31)] 39th Annual Symposium on Frequency Control - Simple Thickness Plate Modes Driven by Lateral Fields

Ballato, A., Hatch, E.R., Mizan, M., Lukaszek, T., Tilton, E.R.

Year:

1985

Language:

english

File:

PDF, 651 KB

english, 1985

57

[IEEE IEEE 1988 Ultrasonics Symposium Proceedings. - Chicago, IL, USA (2-5 Oct. 1988)] IEEE 1988 Ultrasonics Symposium Proceedings. - Temperature and angular variations of piezoelectric coupling in quartz

Kosinski, J., Ballato, A., Lukaszek, T.

Year:

1988

Language:

english

File:

PDF, 293 KB

english, 1988

58

Lukaszek, T., Ballato, A., Wasshausen, H.

Journal:

Proceedings of the IEEE

Year:

1966

Language:

english

File:

PDF, 639 KB

english, 1966

59

[IEEE 1981 Ultrasonics Symposium - (1981.10.14-1981.10.16)] 1981 Ultrasonics Symposium - Power Flow Angle and Pressure Dependence of SAW Propagation Characteristics in Ouartz

Ballato, A., Lukaszek, T., Williams, D.F., Cho, F.Y.

Year:

1981

Language:

english

File:

PDF, 276 KB

english, 1981

60

[IEEE 21st Annual Symposium on Frequency Control - Fort Monmouth, New Jersey, USA (1967.04.24-1967.04.26)] 21st Annual Symposium on Frequency Control - Practical Consequences of Modal Parameter Control in Crystal Resonators

Guttwein, G.K., Lukaszek, T.J., Ballato, A.D.

Year:

1967

Language:

english

File:

PDF, 1016 KB

english, 1967

61

[IEEE 42nd Annual Frequency Control Symposium, 1988. - Baltimore, MD, USA (1-3 June 1988)] Proceedings of the 42nd Annual Frequency Control Symposium, 1988. - Temperature derivatives of the dynamic permittivity and permeability of the simple thickness modes of quartz plates

Kosinski, J., Ballato, A., Lukaszek, T., Mizan, M., McGowan, R., Klohn, K.

Year:

1988

Language:

english

File:

PDF, 847 KB

english, 1988

62

[IEEE 45th Annual Symposium on Frequency Control 1991 - Los Angeles, CA, USA (29-31 May 1991)] Proceedings of the 45th Annual Symposium on Frequency Control 1991 - A comparison of predicted and measured properties of doubly-rotated lithium tetraborate resonators

Ballato, A., Kosinski, J., Mallikarjun, S., Lukaszek, T.

Year:

1991

Language:

english

File:

PDF, 355 KB

english, 1991

63

[IEEE 29th Annual Symposium on Frequency Control - Atlantic City, NJ, USA (1975.05.28-1975.05.30)] 29th Annual Symposium on Frequency Control - Higher-Order Temperature Coefficients of Frequency of Mass-Loaded Piezoelectric Crystal Plates

Ballato, A., Lukaszek, T.

Year:

1975

Language:

english

File:

PDF, 1.11 MB

english, 1975

64

[IEEE 38th Annual Symposium on Frequency Control - (1984.05.29-1984.06.1)] 38th Annual Symposium on Frequency Control - Stress-Compensated Quartz Resonators Having Ultra-Linear Frequency-Temperature Responses

Nakazawa, M., Yamaguchi, H., Ballato, A., Lukaszek, T.

Year:

1984

Language:

english

File:

PDF, 363 KB

english, 1984

65

[IEEE 1992 IEEE Frequency Control Symposium - Hershey, PA, USA (27-29 May 1992)] Proceedings of the 1992 IEEE Frequency Control Symposium - A theoretical study of quartz crystal resonators for chemical sensors, vibrating in C mode

Nakazawa, M., Takeuchi, M., Moriizumi, T., Niiyama, H., Ballato, A., Lukaszek, T.

Year:

1992

Language:

english

File:

PDF, 240 KB

english, 1992

66

[IEEE 41st Annual Symposium on Frequency Control - (1987.05.27-1987.05.29)] 41st Annual Symposium on Frequency Control - Lateral- and Thickness-Field Coupling in Zincblende Structures

Ballato, A., Lukaszek, T., Mizan, M., Kosinski, J.

Year:

1987

Language:

english

File:

PDF, 465 KB

english, 1987

67

[American Vacuum Soc 2000 5th International Symposium on Plasma Process-Induced Damage - Santa Clara, CA, USA (22-24 May 2000)] 2000 5th International Symposium on Plasma Process-Induced Damage (IEEE Cat. No.00TH8479) - Influence of scribe lane structures on wafer potentials and charging damage

Year:

2000

Language:

english

File:

PDF, 334 KB

english, 2000

68

[IEEE 27th Annual Symposium on Frequency Control - Cherry Hill , New Jersey, USA (1973.06.12-1973.06.14)] 27th Annual Symposium on Frequency Control - Mass Effects on Crystal Resonators with Arbitrary Piezo-Coupling

Ballato, A., Lukaszek, T.

Year:

1973

Language:

english

File:

PDF, 603 KB

english, 1973

69

[IEEE 36th Annual Symposium on Frequency Control - (1982.06.2-1982.06.4)] 36th Annual Symposium on Frequency Control - New Quartz Resonators with Precision Frequency Linearity Over a Wide Temperature Range

Nakazawa, M., Ito, H., Usui, A., Ballato, A., Lukaszek, T.

Year:

1982

Language:

english

File:

PDF, 443 KB

english, 1982

70

[American Vacuum Soc 2000 5th International Symposium on Plasma Process-Induced Damage - Santa Clara, CA, USA (22-24 May 2000)] 2000 5th International Symposium on Plasma Process-Induced Damage (IEEE Cat. No.00TH8479) - Electron-shading characterization in a HDP contact etching process using a patterned CHARM wafer

Carrere, J.-P., Poiroux, T., Lukaszek, W., Verove, C., Haond, M., Reimbold, G., Turban, G.

Year:

2000

Language:

english

File:

PDF, 378 KB

english, 2000

71

[IEEE 1998 IEEE International Integrated Reliability Workshop Final Report - Lake Tahoe, CA, USA (12-15 Oct. 1998)] 1998 IEEE International Integrated Reliability Workshop Final Report (Cat. No.98TH8363) - Monitoring charging in high current ion implanters yields optimum preventive maintenance schedules and procedures

Gonzalez, H., Reno, S., Messick, C., Lukaszek, W., Romanski, T.

Year:

1998

Language:

english

File:

PDF, 364 KB

english, 1998

72

MERLIN: a device diagnosis system based on analytic models

Freeman, G., Lukaszek, W., Pan, Y.Y.C.

Journal:

IEEE Transactions on Semiconductor Manufacturing

Year:

1993

Language:

english

File:

PDF, 1.39 MB

english, 1993

73

[IEEE 1997 IEEE International Conference on Microelectronic Test Structures Proceedings - Monterey, CA, USA (17-20 March 1997)] 1997 IEEE International Conference on Microelectronic Test Structures Proceedings - Design and characterization of SiGe TFT devices and process using Stanford's test chip design environment

Kumar, M.V., Subramanian, V., Saraswat, K.C., Plummer, J.D., Lukaszek, W.

Year:

1997

Language:

english

File:

PDF, 515 KB

english, 1997

74

[IEEE 2002 IEEE International Reliability Physics Symposium Proceedings. 40th Annual - Dallas, TX, USA (7-11 April 2002)] 2002 IEEE International Reliability Physics Symposium. Proceedings. 40th Annual (Cat. No.02CH37320) - Use of EEPROM-based sensors in investigating physical mechanisms responsible for charging damage

Year:

2002

Language:

english

File:

PDF, 631 KB

english, 2002

75

Biological effectiveness of 12 C and 20 Ne ions with very high LET

Czub, Joanna, Banaś, Dariusz, Błaszczyk, Anna, Braziewicz, Janusz, Buraczewska, Iwona, Choiński, Jaroslaw, Górak, Urszula, Jaskóła, Marian, Korman, Andrzej, Lankoff, Anna, Lisowska, Halina, Łukaszek,

Journal:

International Journal of Radiation Biology

Year:

2008

Language:

english

File:

PDF, 643 KB

english, 2008

76

[IEEE 22nd Annual Symposium on Frequency Control - Atlantic City, NJ, USA (1968.04.22-1968.04.24)] 22nd Annual Symposium on Frequency Control - Design Considerations for Oscillator Crystals

Guttwein, G.K., Ballato, A.D., Lukaszek, T.J.

Year:

1968

Language:

english

File:

PDF, 1.06 MB

english, 1968

77

[IEEE Proceedings of 1994 IEEE International Reliability Physics Symposium - San Jose, CA, USA (1994.04.11-1994.04.14)] Proceedings of 1994 IEEE International Reliability Physics Symposium RELPHY-94 - Characterization of wafer charging mechanisms and oxide survival prediction methodology

Lukaszek, W., Dixon, W., Vella, M., Messick, C., Reno, S., Shideler, J.

Year:

1994

Language:

english

File:

PDF, 515 KB

english, 1994

78

[IEEE 1981 Ultrasonics Symposium - (1981.10.14-1981.10.16)] 1981 Ultrasonics Symposium - Ultrasonic Imaging of Material Mechanical Properties Through Steel Pipe

Nakazawa, M., Lukaszek, T., Ballato, A.

Year:

1981

Language:

english

File:

PDF, 272 KB

english, 1981

79

[IEEE International Integrated Reliability Workshop Final Report - Lake Tahoe, CA (October 24-27, 1993)] International Integrated Reliability Workshop Final Report - Characterization of Wafer Charging Mechanisms and Oxide Survival Prediction Methodology

Lukaszek, W., Dixon, W.

Year:

1993

Language:

english

File:

PDF, 617 KB

english, 1993

80

[American Vacuum Soc 2000 5th International Symposium on Plasma Process-Induced Damage - Santa Clara, CA, USA (22-24 May 2000)] 2000 5th International Symposium on Plasma Process-Induced Damage (IEEE Cat. No.00TH8479) - Control of wafer charging during ion implantation: Issues, monitors and models

Current, M.I., Lukaszek, W., Vella, M.C.

Year:

2000

Language:

english

File:

PDF, 395 KB

english, 2000

81

[IEEE 1989 International Conference on Microelectronic Test Structures - Edinburgh, UK (13-14 March 1989)] Proceedings of the 1989 International Conference on Microelectronic Test Structures - A new wafer surface charge monitor (CHARM)

McCarthy, A.M., Lukaszek, W.

Year:

1989

Language:

english

File:

PDF, 251 KB

english, 1989

82

[IEEE 1981 Ultrasonics Symposium - (1981.10.14-1981.10.16)] 1981 Ultrasonics Symposium - Resonators With Reduced Frequency Sensitivity to Static and Dynamic Stresses

Nakazawa, M., Lukaszek, T., Ballato, A.

Year:

1981

Language:

english

File:

PDF, 367 KB

english, 1981

83

[IEEE 37th Annual Symposium on Frequency Control - (1982.06.1-1982.06.3)] 37th Annual Symposium on Frequency Control - Stress Induced Effects on the Propagation of Surface Waves

Sinha, B.K., Tanski, W.J., Lukaszek, T., Ballato, A.

Year:

1983

Language:

english

File:

PDF, 724 KB

english, 1983

84

[IEEE 11th International Conference on Ion Implantation Technology - Austin, TX, USA (16-21 June 1996)] Proceedings of 11th International Conference on Ion Implantation Technology - Influence of photoresist on wafer charging during high current arsenic implant

Lukaszek, W., Reno, S., Bammi, R.

Year:

1997

Language:

english

File:

PDF, 468 KB

english, 1997

85

[IEEE Thirty Fifth Annual Frequency Control Symposium - (1981.05.27-1981.05.29)] Thirty Fifth Annual Frequency Control Symposium - The Propagation Characteristics of Surface Acoustic Waves on Singly and Doubly Rotated Cuts of Quartz

Williams, D.F., Cho, F.Y., Ballato, A., Lukaszek, T.

Year:

1981

Language:

english

File:

PDF, 495 KB

english, 1981

86

[IEEE 38th Annual Symposium on Frequency Control - (1984.05.29-1984.06.1)] 38th Annual Symposium on Frequency Control - Lateral-Field Excitation of Berlinite

Ballato, A., Hatch, E.R., Mizan, M., Chai, B.H.T., Tilton, R.S., Lukaszek, T.J.

Year:

1984

Language:

english

File:

PDF, 1.07 MB

english, 1984

87

[IEEE 11th International Conference on Ion Implantation Technology - Austin, TX, USA (16-21 June 1996)] Proceedings of 11th International Conference on Ion Implantation Technology - Photoresist-enhanced wafer charging during high current ion implantation

Dixon, W., Lukaszek, W., Heden, C.

Year:

1997

Language:

english

File:

PDF, 461 KB

english, 1997

88

[IEEE International Conference on Microelectronic Test Structures - Trento, Italy (25-28 March 1996)] Proceedings of International Conference on Microelectronic Test Structures - A test structure advisor and a coupled, library-based test structure layout and testing environment

Kumar, M.V., Plummer, J.D., Lukaszek, W.

Year:

1996

Language:

english

File:

PDF, 719 KB

english, 1996

89

[IEEE 44th Annual Symposium on Frequency Control - Baltimore, MD, USA (23-25 May 1990)] 44th Annual Symposium on Frequency Control - Measurements of acceleration-induced phase noise in surface acoustic wave devices

Kosinski, J., Ballato, A., Lukaszek, T.

Year:

1990

Language:

english

File:

PDF, 282 KB

english, 1990

90

[IEEE 40th Annual Symposium on Frequency Control - (1967.04.24-1967.04.26)] 40th Annual Symposium on Frequency Control - Dynamic Permittivities and Resistivities of the Equivalent Network Representing Plate Resonators

Ballato, A., Hatch, E., Mizan, M., Lukaszek, T.J.

Year:

1986

Language:

english

File:

PDF, 317 KB

english, 1986

91

[IEEE 1998 International Conference on Ion Implantation Technology. Proceedings. Ion Implantation Technology - 98 - Kyoto, Japan (22-26 June 1998)] 1998 International Conference on Ion Implantation Technology. Proceedings (Cat. No.98EX144) - Photoresist mask design for evaluation of resist-mediated charging effects during high current ion implantation

Lukaszek, W., Current, M.

Year:

1998

Language:

english

File:

PDF, 444 KB

english, 1998

92

[MTT005 MTT-S International Microwave Symposium Digest - Orlando, FL, USA (April 1979)] MTT-S International Microwave Symposium Digest - Shallow Bulk Acoustic Wave Devices

Ballato, A., Lukaszek, T.

Year:

1979

Language:

english

File:

PDF, 204 KB

english, 1979

93

[IEEE 1980 Ultrasonics Symposium - (1980.11.5-1980.11.7)] 1980 Ultrasonics Symposium - What SAW Can Learn from BAW: Implications for Future Frequency Control, Selection, and Signal Processing

Lukaszek, T., Ballato, A.

Year:

1980

Language:

english

File:

PDF, 946 KB

english, 1980

94

[IEEE 24th Annual Symposium on Frequency Control - Atlantic City, NJ, USA (1970.04.27-1970.04.29)] 24th Annual Symposium on Frequency Control - Mode Control and Related Studies of VHF Quartz Filter Crystals

Year:

1970

Language:

english

File:

PDF, 1.00 MB

english, 1970

95

Test chip based approach to automated diagnosis of CMOS yield problems

Lukaszek, W., Grambow, K.G., Yarbrough, W.J.

Journal:

IEEE Transactions on Semiconductor Manufacturing

Year:

1990

Language:

english

File:

PDF, 1.14 MB

english, 1990

96

[ESD Assoc Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 - Anaheim, CA, USA (26-28 Sept. 2000)] Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476) - Wafer charging in process equipment and its relationship to GMR heads charging damage

Year:

2000

Language:

english

File:

PDF, 557 KB

english, 2000

97

[IEEE 1st International Symposium on Plasma Process-Induced Damage - Santa Clara, CA (13-14 May 1996)] Proceedings of 1st International Symposium on Plasma Process-Induced Damage - Quantifying Wafer Charging During Via Etch

Lukaszek, W., Birrell, A.H.

Year:

1996

Language:

english

File:

PDF, 418 KB

english, 1996

98

[IEEE Proceedings., IEEE Ultrasonics Symposium - Montreal, Que., Canada (3-6 Oct. 1989)] Proceedings., IEEE Ultrasonics Symposium - Lateral-field temperature behavior of lithium tetraborate

Ballato, A., Kosinski, J., Lukaszek, T.

Year:

1989

Language:

english

File:

PDF, 299 KB

english, 1989

99

[American Vacuum Soc 2002 7th International Symposium on Plasma- and Process-Induced Damage - Maui, HI, USA (5-7 June 2002)] 7th International Symposium on Plasma- and Process-Induced Damage - Electron shading effects during oxide etching in uniform and non-uniform plasmas

Lukaszek, W., Shields, J.

Year:

2002

Language:

english

File:

PDF, 255 KB

english, 2002

100

[IEEE 11th International Conference on Ion Implantation Technology - Austin, TX, USA (16-21 June 1996)] Proceedings of 11th International Conference on Ion Implantation Technology - A study of wafer charging with CHARM and SPIDER monitors

Current, M.I., Shi, J., Liu, J., Chan, Y.D., Larson, L., Tripsas, N., Lukaszek, W.

Year:

1997

Language:

english

File:

PDF, 292 KB

english, 1997